Search

Your search keyword '"Bravaix, A."' showing total 436 results

Search Constraints

Start Over You searched for: Author "Bravaix, A." Remove constraint Author: "Bravaix, A."
436 results on '"Bravaix, A."'

Search Results

3. Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell through Quasi-Static Modeling

23. Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond

24. Reliability and Physics-of-Healthy in Mechatronics Volume 15 – Reliability of Multiphysical SystemsChapter II: Applied Engineering on Physics-of-Healthy and SHM of microelectronic equipment for aeronautic, space, automotive and transport operations. pp.06-53

25. Device Reliability to Circuit Qualification: Insights and Challenges

26. Device Reliability to Circuit Qualification: Insights and Challenges

31. Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation

33. Basic Reliability Tools for SHM protocols

36. Analysis of the interactions of HCD under 'On' and 'Off' state modes for 28nm FDSOI AC RF modelling

40. Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS

43. Modeling hot carrier damage interaction between on and off modes for 28 nm AC RF applications

46. Enabling robust automotive electronic components in advanced CMOS nodes

Catalog

Books, media, physical & digital resources