128 results on '"Borgani, Riccardo"'
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2. Measurement and control of a superconducting quantum processor with a fully-integrated radio-frequency system on a chip
3. Multipartite entanglement in a microwave frequency comb
4. Robust preparation of Wigner-negative states with optimized SNAP-displacement sequences
5. Squeezing and multimode entanglement of surface acoustic wave phonons
6. Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
7. Fast multifrequency measurement of nonlinear conductance
8. Calibrating torsional eigenmodes of micro cantilevers for dynamic measurement of frictional forces
9. On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy
10. Background force compensation in dynamic atomic force microscopy
11. A virtual instrument to standardise the calibration of atomic force microscope cantilevers
12. Imaging high-speed friction at the nanometer scale
13. Intermodulation electrostatic force microscopy for imaging surface photo-voltage
14. A combined averaging and frequency mixing approach for force identification in weakly nonlinear high-Q oscillators: Atomic force microscope
15. Nano-mechanical properties of interphases in dynamically vulcanized thermoplastic alloy
16. Multipartite Entanglement in a Microwave Frequency Comb
17. Multipartite Entanglement in a Microwave Frequency Comb
18. Measurement and control of a superconducting quantum processor with a fully integrated radio-frequency system on a chip
19. Robust Preparation of Wigner-Negative States with Optimized SNAP-Displacement Sequences
20. Robust Preparation of Wigner-Negative States with Optimized SNAP-Displacement Sequences
21. Squeezing and Multimode Entanglement of Surface Acoustic Wave Phonons
22. Squeezing and Multimode Entanglement of Surface Acoustic Wave Phonons
23. High-Velocity Shear and Soft Friction at the Nanometer Scale
24. Nanoscale characterization of an all-oxide core-shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods
25. High-Velocity Shear and Soft Friction at the Nanometer Scale
26. Calibration of mixer amplitude and phase imbalance in superconducting circuits
27. Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods
28. A general characterization method for nonlinearities in superconducting circuits
29. Fast Multifrequency Measurement of Nonlinear Conductance
30. Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
31. Probing nonlinear electrical properties at the nanoscale : Studies in multifrequency AFM
32. Multifrequency AFM Methods for Electrical Characterization at the Nanoscale
33. Fast Multifrequency Measurement of Nonlinear Conductance
34. Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
35. On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy
36. Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy
37. Modeling and Measuring Viscoelasticity with Dynamic Atomic Force Microscopy
38. A combined averaging and frequency mixing approach for force identification in weakly nonlinear high-Q oscillators : Atomic force microscope
39. Multiparameter investigation of bulk heterojunction organic photovoltaics
40. Modeling and Measuring Viscoelasticity with Dynamic Atomic Force Microscopy
41. Calibrating torsional eigenmodes of micro-cantilevers for dynamic measurement of frictional forces
42. Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy
43. Multiparameter investigation of bulk heterojunction organic photovoltaics
44. Background-Force Compensation in Dynamic Atomic Force Microscopy
45. Multiparameter investigation of bulk heterojunction organic photovoltaics
46. Imaging high-speed friction at the nanometer scale
47. Retention of Electronic Conductivity in LaAlO3/SrTiO3 Nanostructures Using a SrCuO2 Capping Layer
48. Local Charge Injection and Extraction on Surface-Modified Al2O3Nanoparticles in LDPE
49. A virtual instrument to standardise the calibration of atomic force microscope cantilevers
50. Sensing photo-induced surface charges on OrganicPhoto-Voltaic materials using Atomic Force Microscopy
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