1. Crystallographic dependence of Field Evaporation Energy Barrier in metals using Field Evaporation Energy Loss Spectroscopy mapping
- Author
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Vurpillot, François, Hatzoglou, Constantinos, Klaes, Benjamin, Rousseau, Loic, Maillet, Jean-Baptiste, Blum, Ivan, Gault, Baptiste, and Cerezo, Alfred
- Subjects
Condensed Matter - Materials Science - Abstract
Atom probe tomography data is composed of a list of coordinates of the reconstructed atoms in the probed volume. The elemental identity of each atom is derived from time-of-flight mass spectrometry, with no local energetic or chemical information readily available within the mass spectrum. Here, we used a new data processing technique referred to as field evaporation energy loss spectroscopy (FEELS), which analyses the tails of mass peaks. FEELS was used to extract critical energetic parameters that characterize the field evaporation process, which are related to the binding energy of atoms to the surface under intense electrostatic field and dependent of the path followed by the departing atoms during the field evaporation process. We focused our study on different pure face centered cubic metals (Al, Ni, Rh). We demonstrate that the energetic parameters extracted from mass spectra can be mapped in 2D with nanometric resolution. A dependence on the considered crystallographic planes is observed, with sets of planes of low Miller indices showing a lower sensitivity to the intensity of the electric field, which indicates a lower effective attachment energy. The temperature is also an important parameter in particular for Al, which we attribute to an energetic transition between two paths of field evaporation between 25K and 60K close to (002) pole at the specimen's surface. This paper shows that the complex information that can be retrieved from the measured energy loss of surface atoms is important both instrumentally and fundamentally.
- Published
- 2024