34 results on '"Bergmaier, Andreas"'
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2. Study of (Ti,Zr)C:H/a-C:H nanocomposite thin film formation by low temperature reactive high power impulse magnetron sputtering
3. Erratum to: Sputtering of LiF and other halide crystals in the electronic energy loss regime: Eur. Phys. J. D 74: 144 (2020), DOI: 10.1140/epjd/e2020-10040-9
4. Sputtering of LiF and other halide crystals in the electronic energy loss regime
5. Position and time resolution measurements with a microchannel plate image intensifier: A comparison of monolithic and pixelated CeBr3 scintillators
6. New experimental molecular stopping cross section data of Al2O3, for heavy ions
7. Shape coexistence in 94Zr studied via Coulomb excitation
8. Indications for a bound tetraneutron
9. Concept and performance evaluation of two 3 GHz buncher units optimizing the dose rate of a novel preclinical proton minibeam irradiation facility
10. Analysis of Ultra-Thin HfO2/SiOn/Si(001): Comparison of Three Different Techniques
11. Doping Density Depth Profiling Analysis with High Resolution Elastic Recoil Detection
12. Physical characterization of thin ALD–Al 2O 3 films
13. Shape coexistence in 94Zr studied via Coulomb excitation.
14. Elemental Depth Profiling of Chlorinated Polyamide-Based Thin-Film Composite Membranes with Elastic Recoil Detection
15. Full elemental depth-profiling with nanoscale resolution: The potential of Elastic Recoil Detection (ERD) in membrane science
16. Three Dimensional Hydrogen Microscopy in Diamond
17. Electrical Activity of B and As Segregated at the Si-SiO2 Interface
18. Accurate determination of optical bandgap and lattice parameters of Zn1-xMgxO epitaxial films (0≤x≤0.3) grown by plasma-assisted molecular beam epitaxy on a-plane sapphire.
19. Building a multi-cathode gas-filled detector
20. Material selection for hybrid floating gate NAND memory applications
21. Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPS
22. Analysis of Ultra-Thin HfO2/SiON/Si(001): Comparison of Three Different Techniques
23. Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPS
24. Growth study of nonpolar Zn1−xMgxO epitaxial films on a-plane bulk ZnO by plasma-assisted molecular beam epitaxy
25. Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPS
26. Three Dimensional Hydrogen Microscopy in Diamond
27. Doping and its efficiency ina−SiOx:H
28. Physical characterization of thin ALD–Al2O3 films
29. Three Dimensional Hydrogen Microscopy in Diamond.
30. Electrical Activity of B and As Segregated at the Si-SiO2 Interface.
31. Doping Density Depth Profiling Analysis with High Resolution Elastic Recoil Detection
32. Growth study of nonpolar Zn1-xMgxO epitaxial films on a-plane bulk ZnO by plasma-assisted molecular beam epitaxy.
33. New experimental molecular stopping cross section data of Al2O3, for heavy ions.
34. Physical characterization of thin ALD–Al<F>2</F>O<F>3</F> films
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