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10 results on '"Bercu, Nicolas"'

3. Coupled Non-Destructive Methods, Kelvin Force Probe Microscopy and µ-Raman to Characterize Doping in 4H-SiC Power Devices

Author

Vuillermet, Enora, Wu, Kuan Ting, Sedilot, Anael, Deturche, Regis, Bercu, Nicolas, Usureau, Elise, Beal, Jérémie, and Lazar, Mihai

Abstract

Investigation of the doped areas in 4H-SiC power devices has been done by non-destructive characterization methods. It consists of local surface potential measurements by Kelvin Probe Force Microscopy (KPFM) coupled with scanning electron microscopy (SEM) and µ-Raman spectroscopy. Near-field mappings of the devices’ surface have been realized, allowing us to discern the differently doped areas.

Published
2024
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6. KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices

Author

Bercu, Nicolas, Lazar, Mihai, Simonetti, Olivier, Adam, Pierre-Michel, Brouillard, Mélanie, Giraudet, Louis, Laboratoire de Recherche en Nanosciences - EA 4682 (LRN), Université de Reims Champagne-Ardenne (URCA)-SFR CAP Santé (Champagne-Ardenne Picardie Santé), Université de Reims Champagne-Ardenne (URCA)-Université de Reims Champagne-Ardenne (URCA)-SFR Condorcet, Université de Reims Champagne-Ardenne (URCA)-Centre National de la Recherche Scientifique (CNRS)-Université de Reims Champagne-Ardenne (URCA)-Centre National de la Recherche Scientifique (CNRS), Lumière, nanomatériaux et nanotechnologies (L2n), and Université de Technologie de Troyes (UTT)-Centre National de la Recherche Scientifique (CNRS)

Subjects
KPFM, [SPI]Engineering Sciences [physics], Condensed Matter::Materials Science, SiC device characterization, Mechanics of Materials, Mechanical Engineering, Raman spectroscopy, General Materials Science, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], AFM, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Condensed Matter Physics, ComputingMilieux_MISCELLANEOUS
Abstract

International audience; A non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented. It consists in local measurements of the surface potential by Kelvin Probe Force Microscopy (KPFM) coupled to micro-Raman spectroscopy. The combined experiments allow to visualize the space charge extent of the doped region using the near-field mapping and to estimate its dopant concentration using the Raman spectroscopy. The technique has been successfully applied for the characterization of a WBG SiC (silicon carbide) device.

Published
2022
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9. Flexible plasmonic and strain sensors: fabrication, design and perspectives

Author

Gontier, Arthur, primary, Marae-Djouda, Joseph, additional, Hmima, Abdelhamid, additional, Proust, Julien, additional, Bercu, Nicolas Bogdan, additional, Joncour, Léa Le, additional, Stagon, Stephen, additional, Konoplev, G., additional, Tarasov, S. A., additional, Adam, Pierre-Michel, additional, Gardan, Julien, additional, Panicaud, Benoît, additional, Molinari, Michael, additional, and Maurer, Thomas, additional

Published
2020
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10. Interfacial forces between lignocellulosic polymers by Single Molecule Force Spectroscopy: Impact of the coverage AFM- tip

Author

Marcuello, Carlos, Foulon, Laurence, Bercu, Nicolas Bogdan, Molinari, Michael, Chabbert, Brigitte, Aguié-Béghin, Véronique, Fractionnement des AgroRessources et Environnement (FARE), Université de Reims Champagne-Ardenne (URCA)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), Laboratoire de Recherche en Nanosciences - EA 4682 (LRN), Université de Reims Champagne-Ardenne (URCA)-SFR CAP Santé (Champagne-Ardenne Picardie Santé), Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-SFR Condorcet, and Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)-Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[SPI]Engineering Sciences [physics], [CHIM]Chemical Sciences, ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2018

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