Search

Organic electroluminescent devices with an ITO/TPD/[Alq.sub.3]/Al structure are fabricated and tested for their photovoltaic properties. To produce an open-circuit photovoltage, a conditioning is required. Here, the conditioning is exposing the device to air for a short duration. Without this conditioning, the device produces a short-circuit photocurrent with practically no open-circuit photovoltage. Calculations and fits to the photovoltaic data show that this observation could be attributed to the formation of a metal-insulator-semiconductor junction between the [Alq.sub.3] and the Al, where an insulating layer is created by this conditioning. PACS Nos.: 78.60.Fi, 73.50.Pz, 73.40.Qv, 85.60.Jb, 88.40.jr. Des dispositifs electroluminescents organiques sont fabriques ici avec une structure ITO/TPD/[Alq.sub.3]/Al et nous testons leurs proprietes photovoltaiques. On doit conditionner le dispositif pour produire un photo-voltage en circuit ouvert. Ici, le conditionnement consiste a exposer le dispositif a l'air pendant un court moment. Sans ce conditionnement, le dispositif produit un photo-courant en court-circuit avec pratiquement aucun photo-voltage en circuit ouvert. Les calculs et les ajustements aux donnees photovoltaiques montrent que cet effet pourrait etre attribue a la formation d'une jonction metal-isolant-semiconducteur entre le [Alq.sub.3] et le Al, ou une couche isolante est cree par le conditionnement. [Traduit par la Redaction], 1. Introduction It is well known that electroluminescent devices, based on the principle of the PN junction, have interesting photovoltaic properties. Organic electroluminescent devices (OLED) have also shown these characteristics [...]

In recent years stylolites, which are rough dissolution surfaces commonly found in carbonates, have been used for paleopiezometry estimates. The Stylolite Roughness Inversion Technique (SRIT) applied on sedimentary bedding-parallel stylolites (BPS) grants access to the maximum principal vertical stress experienced by the host carbonates and thus to their maximum burial paleo-depth. This study reports the results of SRIT applied to a BPS population hosted in carbonate platform reservoirs of the Paris basin subsurface (France). Middle Jurassic carbonates from two well cores from the depocenter and margin of the basin, for which the burial and thermal history are known, based on a thermally calibrated 3-D basin model, were analyzed. By defining a consistency criterion and using two signal treatment methods, we propose a new approach to select which BPS can be reliably used to reconstruct the maximum vertical stress undergone by the host carbonates, which then can be converted into maximum burial depth. The study of a BPS population shows that there is a control operated by the host rock texture and the stylolite morphology on the burial depth recorded. Especially suture and sharp peak BPS are better suited to estimate the real maximum depth, whereas seismogram pinning BPS record preferentially intermediate depths. Median values of maximum depth derived from our data set (1300 and 1650 m for the margin and depocenter cores, respectively) are in line with maximum burial estimates provided by conventional basin modeling (1450 and 1800 m, respectively), thus showing that SRIT is a standalone robust depth gauge in sedimentary basins, provided sample selection and data treatment are carried out in a rigorous and thoughtful manner. [ABSTRACT FROM AUTHOR]

Copyright of Canadian Journal of Physics is the property of Canadian Science Publishing and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)