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1. Design and Development of a Diagnostic System for a Non-Intercepting Direct Measure of the SPIDER Ion Source Beamlet Current

2. Investigations on Caesium Dispersion and Molybdenum Coating on SPIDER Components

3. Design and Development of a Diagnostic System for a Non-Intercepting Direct Measure of the SPIDER Ion Source Beamlet Current

4. Investigations on Cs dispersion and Mo coating on SPIDER components

5. First B-dot measurements in the RAID device, an alternative negative ion source for DEMO neutral beams

6. Beam homogeneity of caesium seeded SPIDER using a direct beamlet current measurement

7. First characterization of the SPIDER beam AC component with the Beamlet Current Monitor

8. Investigations on Caesium Dispersion and Molybdenum Coating on SPIDER Components

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