345 results on '"Barradas, N. P."'
Search Results
2. Improved performance of neutron activation analysis laboratories by feedback workshops following interlaboratory comparison rounds
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Ridikas, D., Pessoa Barradas, N., Migliori, A., Katukhov, A., and Bode, P.
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- 2021
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3. Dependence of optical properties on composition of silicon carbonitride thin films deposited at low temperature by PECVD
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Lavareda, G., Vygranenko, Y., Amaral, A., Nunes de Carvalho, C., Barradas, N. P., Alves, E., and Brogueira, P.
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- 2021
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4. Surface analysis of tiles and samples exposed to the first JET campaigns with the ITER-Like Wall
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Coad, J P, Alves, E, Barradas, N P, Baron-Wiechec, A, Heinola, K., Likonen, J, Mayer, M, Matthews, G F, Petersson, P, Widdowson, A, and contributors, JET-EFDA
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Physics - Instrumentation and Detectors - Abstract
This paper reports on the first post-mortem analyses of tiles removed from JET after the first campaigns with the ITER-like Wall (ILW) during 2011-2 [1]. Tiles from the divertor have been analysed by the Ion Beam Analysis (IBA) techniques Rutherford Backscattering Spectroscopy (RBS) and Nuclear Reaction Analysis (NRA) and by Secondary Ion Mass Spectrometry (SIMS) to determine the amount of beryllium deposition and deuterium retention in the tiles exposed to the scrape-off layer. Films 10-20 microns thick were present at the top of Tile 1, but only very thin films (<1 micron) were found in the shadowed areas and on other divertor tiles. The total amount of Be found in the divertor following the ILW campaign was a factor of ~9 less that the material deposited in the 2007-9 carbon campaign, after allowing for the longer operations in 2007-9., Comment: 10 pages, 5 figures. This is an author-created, un-copyedited version of an article accepted for publication in Physica Scripta. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it
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- 2014
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5. An insider view of the Portuguese ion beam laboratory
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Alves, E., Lorenz, K., Catarino, N., Peres, M., Dias, M., Mateus, R., Alves, L. C., Corregidor, V., Barradas, N. P., Fonseca, M., Cruz, J., and Jesus, A.
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- 2021
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6. Towards truly simultaneous PIXE and RBS analysis of layered objects in cultural heritage
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Pascual-Izarra, C., Barradas, N. P., Reis, M. A., Jeynes, C., Menu, M., Lavedrine, B., Ezrati, J. J., and Röhrs, S.
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Condensed Matter - Materials Science - Abstract
For a long time, RBS and PIXE techniques have been used in the field of cultural heritage. Although the complementarity of both techniques has long been acknowledged, its full potential has not been yet developed due to the lack of general purpose software tools for analysing the data from both techniques in a coherent way. In this work we provide an example of how the recent addition of PIXE to the set of techniques supported by the DataFurnace code can significantly change this situation. We present a case in which a non homogeneous sample (an oxidized metal from a photographic plate -heliography- made by Niepce in 1827) is analysed using RBS and PIXE in a straightforward and powerful way that can only be performed with a code that treats both techniques simultaneously as a part of one single and coherent analysis. The optimization capabilities of DataFurnace, allowed us to obtain the composition profiles for these samples in a very simple way., Comment: 9 pages, 3 figures
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- 2007
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7. LibCPIXE: a PIXE simulation open-source library for multilayered samples
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Pascual-Izarra, C., Barradas, N. P., and Reis, M. A.
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Condensed Matter - Materials Science - Abstract
Most particle induced X-ray emission (PIXE) data analysis codes are not focused on handling multilayered samples. We have developed an open-source library called "LibCPIXE", for PIXE data analysis. It is written in standard C and implements functions for simulating X-ray yields of PIXE spectra taken from arbitrary samples, including multilayered targets. The library is designed to be fast, portable, modular and scalable, as well as to facilitate its incorporation into any existing program. In order to demonstrate the capabilities of the library, a program called CPIXE was developed and used to analyze various real samples involving both bulk and layered samples. Just as the library, the CPIXE source code is freely available under the General Public License. We demonstrate that it runs both under GNU/Linux systems as well as under MS Windows. There is in principle no limitation to port it to other platforms.
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- 2007
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8. Simultaneous PIXE and RBS data analysis using Bayesian Inference with the DataFurnace code
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Pascual-Izarra, C., Reis, M. A., and Barradas, N. P.
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Condensed Matter - Materials Science - Abstract
The Rutherford Backscattering Spectroscopy (RBS) and Particle Induced X-ray Emission (PIXE) techniques can be used to obtain complementary information about the characteristics of a sample but, traditionally, a gap has separated the available computer codes for analyzing data from each technique, being hard to simultaneously analyze data from the same sample. The recent development of a free and open source library, LibCPIXE, for PIXE simulation and analysis of arbitrary multilayered samples, has permitted to integrate this technique into the DataFurnace code which already handles many other IBA techniques such as Rutherford and non-Rutherford backscattering, elastic recoil detection, and non-resonant nuclear reaction analysis. The fitting capabilities of DataFurnace can therefore now be applied to PIXE spectra as well, including the Bayesian Inference analysis and the simultaneous and coherent fitting of multiple spectra from different techniques. Various examples are presented in which the simultaneous RBS and PIXE analysis allows us to obtain consistent results that cannot be obtained by independent analysis of the data from each technique., Comment: 10 pages, 5 figures. Paper initially presented to IBA2005. Please cite the published version (DOI:10.1016/j.nimb.2006.03.190)
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- 2007
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9. Amorphous carbon thin films: Mechanisms of hydrogen incorporation during magnetron sputtering and consequences for the secondary electron emission
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Adame, C. F., primary, Alves, E., additional, Barradas, N. P., additional, Costa Pinto, P., additional, Delaup, Y., additional, Ferreira, I. M. M., additional, Neupert, H., additional, Himmerlich, M., additional, Pfeiffer, S., additional, Rimoldi, M., additional, Taborelli, M., additional, Teodoro, O. M. N. D., additional, and Bundaleski, N., additional
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- 2023
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10. IAEA Nuclear Science and Instrumentation Laboratory: Support to IAEA Member States and Recent Developments
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Foulon F., Ben Abdelouahed H., Bogovac M., Charisopoulos S., Matos M., Migliori A., Padilla-Alvarez R., Pessoa Barradas N., Ridikas D., Simon A., Skukan N., Sladek P., and Swainson I.
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nuclear ,instrumentation ,training ,spectrometry ,gamma radiation monitoring ,x-ray fluorescence ,ion beam analysis ,synchrotron - ,based- x-ray spectrometry ,neutron generator ,Physics ,QC1-999 - Abstract
As part of the International Atomic Energy Agency's (IAEA) Physics Section, the Nuclear Science and Instrumentation Laboratory (NSIL) helps Member States (MSs) to establish, operate and maintain various nuclear instrumentation and spectrometry techniques in support of a wide range of applications such as health care, food, agriculture, environment, forensics, cultural heritage, and materials science. NSIL is contributing to capacity building, transfer of knowledge and expertise sharing, including the development of instruments and validation of analytical methodologies. This paper describes NSIL's key activities and provides an overview of the recent developments and achievements, including the commissioning and utilization of an end-station at one of the beam lines in Elettra Sincrotrone Trieste (EST, Italy), the upgrade of an ultralight radiation monitoring system onboarded on a drone, as well as the development of a full field X-ray fluorescence analytical system for forensic applications and characterization of valuable art/archaeological objects.
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- 2020
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11. New Approaches to Thermoelectric Materials
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P. Gonçalves, A., Lopes, E. B., Alves, E., Barradas, N. P., Franco, N., Rouleau, O., Godart, C., Zlatić, Veljko, editor, and Hewson, Alex C., editor
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- 2009
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12. Determination of Stopping Power of Ions in Matter
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Barradas, N. P., Jeynes, C., Webb, R. P., Wendler, E., Kling, Andreas, editor, Baräo, Fernando J. C., editor, Nakagawa, Masayuki, editor, Távora, Luis, editor, and Vaz, Pedro, editor
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- 2001
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13. Ag y :TiN x thin films for dry biopotential electrodes: the effect of composition and structural changes on the electrical and mechanical behaviours
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Pedrosa, P., Machado, D., Borges, J., Rodrigues, M. S., Alves, E., Barradas, N. P., Martin, N., Evaristo, M., Cavaleiro, A., Fonseca, C., and Vaz, F.
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- 2015
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14. Ion beam analysis of fusion plasma-facing materials and components : facilities and research challenges
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Mayer, M., Moller, S., Rubel, M., Widdowson, A., Charisopoulos, S., Ahlgren, T., Alves, E., Apostolopoulos, G., Barradas, N. P., Donnelly, S., Fazinic, S., Heinola, K., Kakuee, O., Khodja, H., Kimura, A., Lagoyannis, A., Li, M., Markelj, S., Mudrinic, M., Petersson, P., Portnykh, I., Primetzhofer, Daniel, Reichart, P., Ridikas, D., Silva, T., de Vicente, S. M. Gonzalez, Wang, Y. Q., Mayer, M., Moller, S., Rubel, M., Widdowson, A., Charisopoulos, S., Ahlgren, T., Alves, E., Apostolopoulos, G., Barradas, N. P., Donnelly, S., Fazinic, S., Heinola, K., Kakuee, O., Khodja, H., Kimura, A., Lagoyannis, A., Li, M., Markelj, S., Mudrinic, M., Petersson, P., Portnykh, I., Primetzhofer, Daniel, Reichart, P., Ridikas, D., Silva, T., de Vicente, S. M. Gonzalez, and Wang, Y. Q.
- Abstract
Following the IAEA Technical Meeting on `Advanced Methodologies for the Analysis of Materials in Energy Applications Using Ion Beam Accelerators', this paper reviews the current status of ion beam analysis (IBA) techniques and some aspects of ion-induced radiation damage in materials for the field of materials relevant to fusion. Available facilities, apparatus development, future research options and challenges are presented and discussed. The analysis of beryllium and radioactivity-containing samples from future experiments in JET or ITER represents not only an analytical but also a technical challenge. A comprehensive list of the facilities, their current status, and analytical capabilities comes alongside detailed descriptions of the labs. A discussion of future issues of sample handling and the current status of facilities at JET complete the technical section. To prepare the international IBA community for these challenges, the IAEA technical meeting concludes the necessity for determining new nuclear reaction cross-sections and improving the inter-laboratory comparability by defining international standards and testing these via a round-robin test.
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- 2020
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15. Deposition in the tungsten divertor during the 2011-2016 campaigns in JET with ITER-like wall
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Catarino, N., Widdowson, A., Baron-Wiechec, A., Coad, J. P., Heinola, K., Rubel, Marek, Barradas, N. P., Alves, E., Catarino, N., Widdowson, A., Baron-Wiechec, A., Coad, J. P., Heinola, K., Rubel, Marek, Barradas, N. P., and Alves, E.
- Abstract
A build-up of co-deposits in remote areas of the divertor can contribute significantly to the overall fuel retention. The control of plasma-material interactions via the study and understanding of erosion-deposition of PFCs provides vital information for the efficient future operation of ITER. The major aim of this work is to reveal details of beryllium deposition and fuel (deuterium) retention on divertor plasma-facing components removed from the JET ITER-Like Wall divertor after cumulative exposure during the first two (ILW-1+2) and all three (ILW-1+2+3) campaigns. Ion beam analysis techniques such as Rutherford backscattering spectrometry, nuclear reaction analysis and proton induced x-ray emission have been extensively used for post-mortem analyses of selected tiles from JET following each campaign and can provide relevant information on plasma-surface interactions like tungsten erosion, beryllium deposition and plasma fuel retention with divertor tiles via implantation or co-deposition. The studied divertor tiles represent a unique set of samples, which have been exposed to plasmas since the beginning of the JET-ILW operation for three successive plasma campaigns. This is a comprehensive comparison of divertor components after these operation periods. The results presented summarise deposition and fuel retention on Tiles 4 (inner base) and 6 (outer base). Although the deposition pattern is similar to that determined after individual campaigns, D retention is not a cumulative process and is determined mainly by the last campaign, and the total Be deposit after the 3 campaigns (i.e. data 1+2+3=tile exposed 2011-2016) is less than the sum of the deposits after each individual campaign (sum 1+2+3) for Tile 4 but greater for Tile 6., QC 20200415
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- 2020
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16. Hyperfine Fields of 181Ta in UFe4Al8
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Marques, J. G., Barradas, N. P., Alves, E., Ramos, A. R., Gonçalves, A. P., da Silva, M. F., and Soares, J. C.
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- 2001
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17. Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride)
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Ross, G. J., Barradas, N. P., Hill, M. P., Jeynes, C., Morrissey, P., and Watts, J. F.
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- 2001
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18. Defect Tails in GE Implanted Si Probed by Slow Positrons and Ion Channeling
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Knights, A. P., Nejim, A., Barradas, N. P., Gwilliam, R., Coleman, P. G., Malik, F., Kherandish, H., and Romani, S.
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- 1998
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19. Overview of the JET ITER-like wall divertor
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Widdowson, A., Alves, E., Baron-Wiechec, A., Barradas, N. P., Catarino, N., Coad, J. P., Corregidor, V., Garcia-Carrasco, A., Heinola, K., Koivuranta, S., Krat, S., Lahtinen, A., Likonen, J., Mayer, M., Petersson, P., Rubel, M., Van Boxel, S., Abhangi, M., Abreu, P., Aftanas, M., Afzal, M., Aggarwal, K. M., Aho-Mantila, L., Ahonen, E., Aints, M., Airila, M., Albanese, R., Alegre, D., Alessi, E., Aleynikov, P., Alfier, A., Alkseev, A., Allan, P., Almaviva, S., Alonso, A., Alper, B., Alsworth, I., Alves, D., Ambrosino, G., Ambrosino, R., Amosov, V., Andersson, F., Andersson Sunden, E., Angelone, M., Anghel, A., Anghel, M., Angioni, C., Appel, L., Apruzzese, G., Arena, P., Ariola, M., Arnich, Arnoux, G., Arshad, S., Ash, A., Asp, E., Asunta, O., Atanasiu, C. V., Austin, Y., Avotina, L., Axton, M. D., Ayres, C., Bachmann, C., Baciero, A., Baiao, D., Bailescu, V., Baiocchi, B., Baker, A., Baker, R. A., Balboa, I., Balden, M., Balshaw, N., Bament, R., Banks, J. W., Baranov, Y. F., Barlow, I. L., Barnard, M. A., Barnes, D., Barnsley, R., Baron Wiechec, A., Baruzzo, M., Basiuk, V., Bassan, M., Bastow, R., Batista, A., Batistoni, P., Bauer, R., Bauvir, B., Bazylev, B., Beal, J., Beaumont, P. S., Becoulet, A., Bednarczyk, P., Bekris, N., Beldishevski, M., Bell, K., Belli, F., Bellinger, M., Belo, J. K., Belo, P., Belonohy, E., Benterman, N. A., Bergsaker, H., Bernardo, J., Bernert, M., Berry, M., Bertalot, L., Beurskens, M. N. A., Bieg, B., Bielecki, J., Biewer, T., Bigi, M., Bilkova, P., Binda, F., Bizarro, J. P. S., Bjorkas, C., Blackman, K., Blackman, T. R., Blanchard, P., Blanco, E., Blatchford, P., Bobkov, V., Boboc, A., Bodnar, G., Bogar, O., Bolzonella, T., Boncagni, L., Bonham, R., Bonheure, G., Boom, J., Booth, J., Borba, D., Borodin, D., Botrugno, A., Boulbe, C., Boulting, P., Bovert, K. V., Bowden, M., Bower, C., Boyce, T., Boyer, H. J., Bradshaw, J. M. A., Braic, V., Breizman, B., Bremond, S., Brennan, P. D., Brett, A., Brezinsek, S., Bright, M. D. J., Brix, M., Broeckx, W., Brombin, M., Brown, B. C., Brown, D. P. D., Brown, M., Bruno, E., Bucalossi, J., Buch, J., Buckley, M. A., Bucko, K., Budny, R., Buffer, Bulman, M., Bulmer, N., Bunting, P., Buratti, P., Burcea, G., Burckhart, A., Buscarino, A., Butcher, P. R., Butler, N. K., Bykov, I., Byrne, J., Byszuk, A., Cackett, A., Cahyna, P., Cain, G., Calabro, G., Callaghan, C. P., Campling, D. C., Cane, J., Cannas, B., Capel, A. J., Caputano, M., Card, P. J., Cardinali, A., Carman, P., Carralero, D., Carraro, L., Carvalho, B. B., Carvalho, I., Carvalho, P., Casson, F. J., Castaldo, C., Cavazzana, R., Cavinato, M., Cazzaniga, A., Cecconello, M., Cecil, E., Cenedese, A., Centioli, C., Cesario, R., Challis, C. D., ler, M., ra, D., Chang, C. S., Chankin, A., Chapman, I. T., Chapman, S. C., Chernyshova, M., Chiru, P., Chitarin, G., Chouli, B., Chung, N., Ciraolo, G., Ciric, D., Citrin, J., Clairet, F., Clark, E., Clatworthy, D., Clay, R., Clever, M., Coates, P. A., Coccorese, V., Cocilovo, V., Coda, S., Coelho, R., Coenen, J. W., Coffey, I., Colas, L., Collins, S., Conboy, J. E., Conroy, S., Cook, N., Coombs, D., Cooper, D., Cooper, S. R., Corre, Y., Corrigan, G., Cortes, S., Coster, D., Couchman, A. S., Cox, M., Cox, M. P., Cox, P., Craciunescu, T., Cramp, S., Crisanti, F., Cristescu, I., Croci, G., Croft, O., Crombe, K., Crowe, R., Cruz, N., Cseh, G., Cull, K., Cupido, L., Curran, D., Curuia, M., Czarnecka, A., Czarski, T., Dalley, S., Dalziel, A., Darrow, D., Davies, R., Davis, W., Day, C., Day, I. E., de la Cal, E., de la Luna, E., De Magistris, M., de Pablos, J. L., De Tommasi, G., de Vries, P. C., Deakin, K., Deane, J., Decker, J., Degli Agostini, F., Dejarnac, R., Delabie, E., den Harder, N., Dendy, R. O., Denner, P., Devaux, S., Devynck, P., Di Maio, F., Di Pace, L., Dittmar, T., Dodt, D., Donne, T., Dooley, P., Dorling, S. E., Dormido-Canto, S., Doswon, S., Douai, D., Doyle, P. T., Dreischuh, T., Drewelow, P., Drozdov, V., Drozdowicz, K., Dumont, R., Dumortier, P., Dunai, D., Dunne, M., Duran, I., Durodie, F., Dutta, P., Duval, B., Dux, R., Dylst, K., Dzysiuk, N., Edappala, P. V., Edwards, A. M., Eich, Th., Ekedahl, A., Elevant, T., El-Jorf, R., Elsmore, C. G., Ericsson, G., Eriksson, A., Eriksson, J., Eriksson, L. G., Esposito, B., Esser, H. G., Esteve, D., Evans, G. E., Evans, J., Ewart, G. D., Ewers, D. T., Fagan, D., Falie, D., Farthing, J. W., Fasoli, A., Fattorini, L., Faugeras, B., Faustin, J., Fawlk, N., Federici, G., Fedorczak, N., Felton, R. C., Fenzi, C., Fernades, A., Fern, es, H., Ferreira, J., Fessey, J. A., Figini, L., Figueiredo, A., Figueiredo, J., Fil, A., Finburg, P., Firdaouss, M., Fischer, U., Fittill, L., Fitzgerald, M., Flammini, D., Flanagan, J., Fleming, C., Flinders, K., Formisano, A., Forsythe, L., Fortuna, L., Fortune, M., Frasca, M., Frassinetti, L., Freisinger, M., Fresa, R., Frigione, D., Fuchs, V., Fyvie, J., Gadomska, M., Gal, K., Galperti, C., Galvao, R., Gao, X., Garavaglia, S., Garcia, J., Garcia-Munoz, M., Gardner, M., Garzotti, L., Gaudio, P., Gauthier, E., Gaze, J. W., Gear, D. F., Gee, S. J., Gelfusa, M., Genangeli, E., Gerasimov, S., Gervasini, G., Ghate, M., Gherendi, M., Giacalone, J. C., Giacomelli, L., Gibson, C. S., Giegerich, T., Gin, D., Giovannozzi, E., Girardo, J. B., Giroud, C., Giruzzi, G., Gleason-Gonzalez, C., Godwin, J., Gohil, P., Gojska, A., Goloborod'ko, V., Gomes, R., Goncalves, B., Goniche, M., Gonzalez, S., Goodsell, B., Goodyear, A., Gorini, G., Goussarov, A., Graham, B., Graham, M. E., Graves, J., Grazier, N., Green, N. R., Greuner, H., Grigore, E., Griph, F. S., Grisolia, C., Grist, D., Groth, M., Grundy, C. N., Gryaznevich, M., Guard, D., Gubb, D., Guillemaut, C., Guo, Y., Utoh, H. H., Hackett, L. J., Hacquin, S., Hagar, A., Hakola, A., Halitovs, M., Hall, S. J., Hallworth Cook, S. P., Hammond, K., Hart, J., Harting, D., Hartmann, N., Haupt, T. D. V., Hawkes, N. C., Hawkins, J., Haydon, P. W., Hazel, S., Heesterman, P. J. L., Hellesen, C., Hellsten, T., Helou, W., Hemming, O. N., Hender, T. C., Henderson, M., Henriques, R., Hepple, D., Hermon, G., Hidalgo, C., Highcock, E. G., Hill, J. W., Hill, M., Hillairet, J., Hillesheim, J., Hillis, D., Hjalmarsson, A., Hobirk, J., Hogben, C. H. A., Hogeweij, G. M. D., Homfray, D. A., Horacek, J., Horton, A. R., Horton, L. D., Hotchin, S. P., Hough, M. R., Howarth, P. J., Huber, A., Huddleston, T. M., Hughes, M., Hunter, C. L., Hurzlmeier, H., Huygen, S., Huynh, P., Igitkhanov, J., Iglesias, D., Imrisek, M., Ivanova, D., Ivanova-Stanik, I., Ivings, E., Jachmich, S., Jacobsen, A. S., Jacquet, P., Jakubowska, K., James, J., Janky, F., Jarvinen, A., Jaulmes, F., Jednorog, S., Jenkins, C., Jenkins, I., Jesko, K., Joffrin, E., Johnson, R., Johnson, T., Joita, L., Jones, G., Jones, T. T. C., Joyce, L., Jupen, C., Hoshino, K. K., Kallenbach, A., Kalupin, D., Kamiya, K., Kaniewski, J., Kantor, A., Karhunen, J., Kasprowicz, G., Kaveney, G., Kazakov, Y., Keeling, D. L., Keep, J., Kempenaars, M., Kennedy, C., Kenny, D., Khilkevich, E., Kiisk, M., Kim, H. -T., Kim, H. S., King, C., King, D., King, R. F., Kinna, D. J., Kiptily, V., Kirov, K., Kirschner, A., Kizane, G., Klepper, C., Knaup, M., Knipe, S. J., Kobuchi, T., Kochl, F., Kocsis, G., Kogut, D., Koppen, M., Koskela, T., Koslowski, H. R., Kotov, V., Kowalska-Strzeciwilk, E., Krasilnikov, A., Krasilnikov, V., Kreter, A., Krieger, K., Krivchenkov, Y., Krivska, A., Kruezi, U., Ksiazek, I., Kukushkin, A., Kundu, A., Kurki-Suonio, T., Kwon, O. T., Kyrytsya, V., Laan, M., Labate, C., Laguardia, L., Lam, N., Lane, C., Lang, P. T., Lapins, J., Lasa, A., Last, J. R., Lawson, A., Lawson, K. D., Lazaros, A., Lazzaro, E., Lee, S., Leggate, H. J., Lehnen, M., Leichtle, D., Leichuer, P., Leipold, F., Lengar, I., Lennholm, M., Lerche, E., Leyl, Leysen, W., Liang, Y., Lindholm, V., Linke, J., Linsmeier, Ch., Lipschultz, B., Litaudon, X., Liu, G., Liu, Y., Lo Schiavo, V. P., Loarer, T., Loarte, A., Lobel, R. C., Lohr, N., Lomas, P. J., Lonnroth, J., Lopez, J., Lopez, J. M., Louche, F., Loving, A. B., Lowbridge, S., Lowry, C., Luce, T., Lucock, R. M. A., Lukin, A., Lungu, A. M., Lungu, C. P., Lupelli, I., Lyssoivan, A., Macheta, P., Mackenzie, A. S., Maddaluno, G., Maddison, G. P., Magesh, B., Maget, P., Maggi, C. F., Maier, H., Mailloux, J., Maj, A., Makkonen, T., Makwana, R., Malaquias, A., Mansffield, F., Mansfield, M., Manso, M. E., Mantica, P., Mantsinen, M., Manzanares, A., Mar, et, Y., Marcenko, N., Marchetto, C., Marchuk, O., Marinelli, M., Marinucci, M., Markovic, T., Marocco, D., Marot, L., Marren, C. A., Marsen, S., Marshal, R., Martin, A., Martin, D. L., Martin, Y., Martin de Aguilera, A., Martin-Solis, J. R., Masiello, A., Maslov, M., Maslova, V., Matejcik, S., Mattei, M., Matthews, G. F., Matveev, D., Matveev, M., Maviglia, F., Mayoral, M. -L., Mazon, D., Mazzotta, C., McAdams, R., McCarthy, P. J., McClements, K. G., McCormick, K., McCullen, P. A., McDonald, D., Mcgregor, R., McKean, R., McKehon, J., McKinley, R., Meadows, I., Meadows, R. C., Medina, F., Medl, Medley, S., Meigh, S., Meigs, A. G., Meneses, L., Menmuir, S., Merrigan, I. 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F., Maier, H., Mailloux, J., Maj, A., Makkonen, T., Makwana, R., Malaquias, A., Mansffield, F., Mansfield, M., Manso, M. E., Mantica, P., Mantsinen, M., Manzanares, A., Mar, Et, Y., Marcenko, N., Marchetto, C., Marchuk, O., Marinelli, M., Marinucci, M., Markovic, T., Marocco, D., Marot, L., Marren, C. A., Marsen, S., Marshal, R., Martin, A., Martin, D. L., Martin, Y., Martin de Aguilera, A., Martin-Solis, J. R., Masiello, A., Maslov, M., Maslova, V., Matejcik, S., Mattei, M., Matthews, G. F., Matveev, D., Matveev, M., Maviglia, F., Mayoral, M. -L., Mazon, D., Mazzotta, C., Mcadams, R., Mccarthy, P. J., Mcclements, K. G., Mccormick, K., Mccullen, P. A., Mcdonald, D., Mcgregor, R., Mckean, R., Mckehon, J., Mckinley, R., Meadows, I., Meadows, R. C., Medina, F., Medl, Medley, S., Meigh, S., Meigs, A. G., Meneses, L., Menmuir, S., Merrigan, I. R., Mertens, Ph., Meshchaninov, S., Messiaen, A., Meszaros, B., Meyer, H., Miano, G., Michling, R., Middleton-Gear, D., Miettunen, J., Migliucci, P., Militello-Asp, E., Minucci, S., Mirizzi, F., Miyoshi, Y., Mlynar, J., Monakhov, I., Monier-Garbet, P., Mooney, R., Moradi, S., Mordijck, S., Moreira, L., Moreno, R., Morgan, P. D., Morgan, R., Morley, L., Morlock, C., Morris, A. W., Morris, J., Moser, L., Moulton, D., Murari, A., Muraro, A., Mustata, I., Asakura, N. N., Nabais, F., Nakano, T., Nardon, E., Naulin, V., Nave, M. F. F., Nedzelski, I., Neethiraj, N., Nemtsev, G., Nespoli, F., Neto, A., Neu, R., Neubauer, O., Newman, M., Nicholls, K. J., Nicolai, D., Nicolas, T., Nieckchen, P., Nielsen, P., Nightingale, M. P. S., Nilsson, E., Nishijima, D., Noble, C., Nocente, M., Nodwell, D., Nordman, H., Nunes, I., O'Meara, B., Oberkofler, M., Obryk, B., Odupitan, T., Ogawa, M. T., O'Gorman, T., Okabayashi, M., Olariu, S., O'Mullane, M., Ongena, J., Orsitto, F., Oswuigwe, B. I., Pace, N., Pacella, D., Page, A., Paget, A., Pagett, D., Pajuste, E., Palazzo, S., Pamela, J., Pamela, S., Panin, A., Panja, S., Papp, P., Parail, V., Paris, P., Parish, S. C. W., Park, M., Parsloe, A., Pasqualotto, R., Pearson, I. J., Pedrosa, M. A., Pereira, R., Perelli Cippo, E., Perez von Thun, Ch., Perez-Von-Thun, C., Pericoli-Ridolfini, V., Perona, A., Peruzzo, S., Peschanyi, S., Peterka, M., Petravich, G., Petrzilka, V., Pfefferle, D., Philipps, V., Pietropaolo, A., Pillon, M., Pintsuk, G., Piovesan, P., Pires dos Reis, A., Pironti, A., Pisano, F., Pitts, R., Plusczyk, C., Plyusnin, V., Pomaro, N., Pompilian, O., Pool, P. J., Popovichev, S., Porcelli, F., Porosnicu, C., Porton, M., Pospieszczyk, A., Possnert, G., Potzel, S., Powell, T., Pozniak, K., Pozzi, J., Prajapati, V., Prakash, R., Prestopino, G., Price, D., Price, R., Prior, P., Prokopowicz, R., Proudfoot, R., Puglia, P., Puiatti, M. E., Pulley, D., Purahoo, K., Putterich, T., Quercia, A., Rachlew, E., Rack, M., Raeder, J., Rainford, M. S. J., Ramogida, G., Ranjan, S., Rasmussen, J., Rasmussen, J. J., Rathod, K., Ratta, G., Rayner, C., Rebai, M., Reece, D., Reed, A., Refy, D., Regan, B., Regana, J., Reich, M., Reid, P., Reinelt, M., Reinke, M. L., Reinke, M., Reiser, D., Reiter, D., Rendell, D., Reux, C., Riccardo, V., Rimini, F. G., Riva, M., Roberts, J. E. C., Robins, R. J., Robinson, S. A., Robinson, T., Robson, D. W., Roddick, P., Rodionov, R., Rohde, V., Romanelli, F., Romanelli, M., Romanelli, S., Romano, A., Rowe, D., Rowe, S., Rowley, A., Rubinacci, G., Ruchko, L., Ruiz, M., Ruset, C., Ryc, L., Rzadkiewicz, J., Saarelma, S., Sabot, R., Sadakov, S., Safi, E., Sagar, P., Saibene, G., Saint-Laurent, F., Salewski, M., Salmi, A., Salzedas, F., Samm, U., S, Iford, D., Quist, P., Santa, P., Santala, M. I. K., Sartori, F., Sartori, R., Saunders, R., Sauter, O., Scannell, R., Scarabosio, A., Schlummer, T., Schmidt, V., Schmitz, O., Schmuck, S., Schneider, M., Scholz, M., Schopf, K., Schweer, B., Sergienko, G., Serikov, A., Sertoli, M., Shabbir, A., Shannon, M., Shannon, M. M. J., Sharapov, S. E., Shaw, I., Shaw, S. R., Shepherd, A., Shevelev, A., Shumack, A., Sibbald, M., Sieglin, B., Silva, C., Simmons, P. A., Sinha, A., Sipila, S. K., Sips, A. C. C., Siren, P., Sirinelli, A., Sjostr, Skiba, M., Skilton, R., Slade, B., Smith, N., Smith, P. G., Smith, T. J., Snoj, L., Soare, S., Solano, E. R., Soldatov, S., Sonato, P., Sopplesa, A., Sousa, J., Sowden, C. B. C., Sozzi, C., Sparkes, A., Spelzini, T., Spineanu, F., Stables, G., Stamatelatos, I., Stamp, M. F., Stancalie, V., Stankiewicz, R., Stankunas, G., Stano, M., Stan-Sion, C., Starkey, D. E., Stead, M. J., Stejner, M., Stephen, A. V., Stephen, M., Stevens, B. D., Stoyanov, D., Strachan, J., Str, Stransky, M., Strom, P., Stubbs, G., Studholme, W., Subba, F., Summers, H. P., Sun, Y., Svensson, J., Sykes, N., Syme, B. D., Szabolics, T., Szepesi, G., Szydlowski, A., Suzuki, T. T., Tabares, F., Takalo, V., Tal, B., Tala, T., Talbot, A. R., Taliercio, C., Tamain, P., Tame, C., Tardocchi, M., Taroni, L., Taylor, K. A., Telesca, G., Teplova, N., Terra, A., Testa, D., Teuchner, B., Tholerus, S., Thomas, F., Thomas, J. D., Thomas, P., Thompson, A., Thompson, C. -A., Thompson, V. K., Thomson, L., Thorne, L., Tigwell, P. A., Tipton, N., Tiseanu, I., Tojo, H., Tokar, M. Z., Tomes, M., Tonner, P., Tosti, S., Towndrow, M., Trimble, P., Tripsky, M., Tsalas, M., Tsitrone, E., Tskhakaya jun, D., Tudisco, O., Turner, I., Turner, M. M., Turnyanskiy, M., Tvalashvili, G., Tyrrell, S. G. J., Ul-Abidin, Z., Ulyatt, D., Unterberg, B., Urano, H., Uytdenhouwen, I., Vadgama, A. P., Valcarcel, D., Valisa, M., Valovic, M., Van Eester, D., Van Renterghem, W., van Rooij, G. J., Var, As, C. A. F., Varoutis, S., Vartanian, S., Vasava, K., Vdovin, V., Vega, J., Verdoolaege, G., Verhoeven, R., Verona, C., Vervier, M., Veshchev, E., Vezinet, D., Vicente, J., Villari, S., Villone, F., Vinyar, I., Viola, B., Vitelli, R., Vitins, A., Vlad, M., Voitsekhovitch, I., Vondracek, P., Vrancken, M., Pires de Sa, W. W., Waldon, C. W. F., Walker, M., Walsh, M., Warren, R. J., Waterhouse, J., Watkins, N. W., Watts, C., Wauters, T., Way, M. W., Webster, A., Weckmann, A., Weil, Weisen, H., Weiszflog, M., Welte, S., Wendel, J., Wenninger, R., West, A. T., Wheatley, M. R., Whetham, S., Whitehead, A. M., Whitehead, B. D., Whittington, P., Widdowson, A. M., Wiesen, S., Wilkes, D., Wilkinson, J., Williams, M., Wilson, A. R., Wilson, D. J., Wilson, H. R., Wischmeier, M., Withenshaw, G., Witts, D. M., Wojciech, D., Wojenski, A., Wood, D., Wood, S., Woodley, C., Woznicka, U., Wright, J., Wu, J., Yao, L., Yapp, D., Yavorskij, V., Yoo, M. G., Yorkshades, J., Young, C., Young, D., Young, I. D., Zabolotny, W., Zacks, J., Zagorski, R., Zaitsev, F. S., Zanino, R., Zaroschi, V., Zastrow, K. D., Zeidner, W., Ziolkowski, A., Zoita, V., Zoletnik, S., Zychor, I., and Jet, Contributors
- Subjects
Nuclear and High Energy Physics ,Materials science ,Fuel retention ,Tungsten coating ,Materials Science (miscellaneous) ,Nuclear engineering ,complex mixtures ,114 Physical sciences ,01 natural sciences ,010305 fluids & plasmas ,Fusion, plasma och rymdfysik ,0103 physical sciences ,Forensic engineering ,ta216 ,010306 general physics ,Deposition ,Jet (fluid) ,ta114 ,Divertor ,Dust ,Erosion ,Jet ,equipment and supplies ,lcsh:TK9001-9401 ,Fusion, Plasma and Space Physics ,Nuclear Energy and Engineering ,JET ,lcsh:Nuclear engineering. Atomic power ,human activities - Abstract
The work presented draws on new analysis of components removed following the second JET ITER-like wall campaign 2013–14 concentrating on the upper inner divertor, inner and outer divertor corners, lifetime issues relating to tungsten coatings on JET carbon fibre composite divertor tiles and dust/particulate generation. The results show that the upper inner divertor remains the region of highest deposition in the JET-ILW. Variations in plasma configurations between the first and second campaign have altered material migration to the corners of the inner and outer divertor. Net deposition is shown to be beneficial in the sense that it reduces W coating erosion, covers small areas of exposed carbon surfaces and even encapsulates particles. The work presented draws on new analysis of components removed following the second JET ITER-like wall campaign 2013–14 concentrating on the upper inner divertor, inner and outer divertor corners, lifetime issues relating to tungsten coatings on JET carbon fibre composite divertor tiles and dust/particulate generation. The results show that the upper inner divertor remains the region of highest deposition in the JET-ILW. Variations in plasma configurations between the first and second campaign have altered material migration to the corners of the inner and outer divertor. Net deposition is shown to be beneficial in the sense that it reduces W coating erosion, covers small areas of exposed carbon surfaces and even encapsulates particles.
- Published
- 2017
20. Assessment of erosion, deposition and fuel retention in the JET-ILW divertor from ion beam analysis data
- Author
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Catarino, N., Barradas, N. P., Corregidor, V., Widdowson, A., Baron-Wiechec, A., Coad, J. P., Heinola, K., Rubel, M., Alves, E., Abhangi, M., Abreu, P., Aftanas, M., Afzal, M., Aggarwal, K. M., Aho-Mantila, L., Ahonen, E., Aints, M., Airila, M., Albanese, R., Alegre, D., Alessi, E., Aleynikov, P., Alfier, A., Alkseev, A., Allan, P., Almaviva, S., Alonso, A., Alper, B., Alsworth, I., Alves, D., Ambrosino, G., Ambrosino, R., Amosov, V., Andersson, F., Andersson Sunden, E., Angelone, M., Anghel, A., Anghel, M., Angioni, C., Appel, L., Apruzzese, G., Arena, P., Ariola, M., Arnich, Arnoux, G., Arshad, S., Ash, A., Asp, E., Asunta, O., Atanasiu, C. V., Austin, Y., Avotina, L., Axton, M. D., Ayres, C., Bachmann, C., Baciero, A., Baiao, D., Bailescu, V., Baiocchi, B., Baker, A., Baker, R. A., Balboa, I., Balden, M., Balshaw, N., Bament, R., Banks, J. W., Baranov, Y. F., Barlow, I. L., Barnard, M. A., Barnes, D., Barnsley, R., Baron Wiechec, A., Baruzzo, M., Basiuk, V., Bassan, M., Bastow, R., Batista, A., Batistoni, P., Bauer, R., Bauvir, B., Bazylev, B., Beal, J., Beaumont, P. S., Becoulet, A., Bednarczyk, P., Bekris, N., Beldishevski, M., Bell, K., Belli, F., Bellinger, M., Belo, J. K., Belo, P., Belonohy, E., Benterman, N. A., Bergsaker, H., Bernardo, J., Bernert, M., Berry, M., Bertalot, L., Beurskens, M. N. A., Bieg, B., Bielecki, J., Biewer, T., Bigi, M., Bilkova, P., Binda, F., Bizarro, J. P. S., Bjorkas, C., Blackman, K., Blackman, T. R., Blanchard, P., Blanco, E., Blatchford, P., Bobkov, V., Boboc, A., Bodnar, G., Bogar, O., Bolzonella, T., Boncagni, L., Bonham, R., Bonheure, G., Boom, J., Booth, J., Borba, D., Borodin, D., Botrugno, A., Boulbe, C., Boulting, P., Bovert, K. V., Bowden, M., Bower, C., Boyce, T., Boyer, H. J., Bradshaw, J. M. A., Braic, V., Breizman, B., Bremond, S., Brennan, P. D., Brett, A., Brezinsek, S., Bright, M. D. 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F., Maier, H., Mailloux, J., Maj, A., Makkonen, T., Makwana, R., Malaquias, A., Mansffield, F., Mansfield, M., Manso, M. E., Mantica, P., Mantsinen, M., Manzanares, A., Mar, et, Y., Marcenko, N., Marchetto, C., Marchuk, O., Marinelli, M., Marinucci, M., Markovic, T., Marocco, D., Marot, L., Marren, C. A., Marsen, S., Marshal, R., Martin, A., Martin, D. L., Martin, Y., Martin de Aguilera, A., Martin-Solis, J. R., Masiello, A., Maslov, M., Maslova, V., Matejcik, S., Mattei, M., Matthews, G. F., Matveev, D., Matveev, M., Maviglia, F., Mayer, M., Mayoral, M. -L., Mazon, D., Mazzotta, C., McAdams, R., McCarthy, P. J., McClements, K. G., McCormick, K., McCullen, P. A., McDonald, D., Mcgregor, R., McKean, R., McKehon, J., McKinley, R., Meadows, I., Meadows, R. C., Medina, F., Medl, Medley, S., Meigh, S., Meigs, A. G., Meneses, L., Menmuir, S., Merrigan, I. R., Mertens, Ph., Meshchaninov, S., Messiaen, A., Meszaros, B., Meyer, H., Miano, G., Michling, R., Middleton-Gear, D., Miettunen, J., Migliucci, P., Militello-Asp, E., Minucci, S., Mirizzi, F., Miyoshi, Y., Mlynar, J., Monakhov, I., Monier-Garbet, P., Mooney, R., Moradi, S., Mordijck, S., Moreira, L., Moreno, R., Morgan, P. D., Morgan, R., Morley, L., Morlock, C., Morris, A. W., Morris, J., Moser, L., Moulton, D., Murari, A., Muraro, A., Mustata, I., Asakura, N. N., Nabais, F., Nakano, T., Nardon, E., Naulin, V., Nave, M. F. F., Nedzelski, I., Neethiraj, N., Nemtsev, G., Nespoli, F., Neto, A., Neu, R., Neubauer, O., Newman, M., Nicholls, K. J., Nicolai, D., Nicolas, T., Nieckchen, P., Nielsen, P., Nightingale, M. P. S., Nilsson, E., Nishijima, D., Noble, C., Nocente, M., Nodwell, D., Nordman, H., Nunes, I., O'Meara, B., Oberkofler, M., Obryk, B., Odupitan, T., Ogawa, M. T., O'Gorman, T., Okabayashi, M., Olariu, S., O'Mullane, M., Ongena, J., Orsitto, F., Oswuigwe, B. I., Pace, N., Pacella, D., Page, A., Paget, A., Pagett, D., Pajuste, E., Palazzo, S., Pamela, J., Pamela, S., Panin, A., Panja, S., Papp, P., Parail, V., Paris, P., Parish, S. C. W., Park, M., Parsloe, A., Pasqualotto, R., Pearson, I. J., Pedrosa, M. A., Pereira, R., Perelli Cippo, E., Perez von Thun, Ch., Perez-Von-Thun, C., Pericoli-Ridolfini, V., Perona, A., Peruzzo, S., Peschanyi, S., Peterka, M., Petersson, P., Petravich, G., Petrzilka, V., Pfefferle, D., Philipps, V., Pietropaolo, A., Pillon, M., Pintsuk, G., Piovesan, P., Pires dos Reis, A., Pironti, A., Pisano, F., Pitts, R., Plusczyk, C., Plyusnin, V., Pomaro, N., Pompilian, O., Pool, P. J., Popovichev, S., Porcelli, F., Porosnicu, C., Porton, M., Pospieszczyk, A., Possnert, G., Potzel, S., Powell, T., Pozniak, K., Pozzi, J., Prajapati, V., Prakash, R., Prestopino, G., Price, D., Price, R., Prior, P., Prokopowicz, R., Proudfoot, R., Puglia, P., Puiatti, M. E., Pulley, D., Purahoo, K., Putterich, T., Quercia, A., Rachlew, E., Rack, M., Raeder, J., Rainford, M. S. J., Ramogida, G., Ranjan, S., Rasmussen, J., Rasmussen, J. J., Rathod, K., Ratta, G., Rayner, C., Rebai, M., Reece, D., Reed, A., Refy, D., Regan, B., Regana, J., Reich, M., Reid, P., Reinelt, M., Reinke, M. L., Reinke, M., Reiser, D., Reiter, D., Rendell, D., Reux, C., Riccardo, V., Rimini, F. G., Riva, M., Roberts, J. E. C., Robins, R. J., Robinson, S. A., Robinson, T., Robson, D. W., Roddick, P., Rodionov, R., Rohde, V., Romanelli, F., Romanelli, M., Romanelli, S., Romano, A., Rowe, D., Rowe, S., Rowley, A., Rubinacci, G., Ruchko, L., Ruiz, M., Ruset, C., Ryc, L., Rzadkiewicz, J., Saarelma, S., Sabot, R., Sadakov, S., Safi, E., Sagar, P., Saibene, G., Saint-Laurent, F., Salewski, M., Salmi, A., Salzedas, F., Samm, U., S, iford, D., quist, P., Santa, P., Santala, M. I. K., Sartori, F., Sartori, R., Saunders, R., Sauter, O., Scannell, R., Scarabosio, A., Schlummer, T., Schmidt, V., Schmitz, O., Schmuck, S., Schneider, M., Scholz, M., Schopf, K., Schweer, B., Sergienko, G., Serikov, A., Sertoli, M., Shabbir, A., Shannon, M., Shannon, M. M. J., Sharapov, S. E., Shaw, I., Shaw, S. R., Shepherd, A., Shevelev, A., Shumack, A., Sibbald, M., Sieglin, B., Silva, C., Simmons, P. A., Sinha, A., Sipila, S. K., Sips, A. C. C., Siren, P., Sirinelli, A., Sjostr, Skiba, M., Skilton, R., Slade, B., Smith, N., Smith, P. G., Smith, T. J., Snoj, L., Soare, S., Solano, E. R., Soldatov, S., Sonato, P., Sopplesa, A., Sousa, J., Sowden, C. B. C., Sozzi, C., Sparkes, A., Spelzini, T., Spineanu, F., Stables, G., Stamatelatos, I., Stamp, M. F., Stancalie, V., Stankiewicz, R., Stankunas, G., Stano, M., Stan-Sion, C., Starkey, D. E., Stead, M. J., Stejner, M., Stephen, A. V., Stephen, M., Stevens, B. D., Stoyanov, D., Strachan, J., Str, Stransky, M., Strom, P., Stubbs, G., Studholme, W., Subba, F., Summers, H. P., Sun, Y., Svensson, J., Sykes, N., Syme, B. D., Szabolics, T., Szepesi, G., Szydlowski, A., Suzuki, T. T., Tabares, F., Takalo, V., Tal, B., Tala, T., Talbot, A. R., Taliercio, C., Tamain, P., Tame, C., Tardocchi, M., Taroni, L., Taylor, K. A., Telesca, G., Teplova, N., Terra, A., Testa, D., Teuchner, B., Tholerus, S., Thomas, F., Thomas, J. D., Thomas, P., Thompson, A., Thompson, C. -A., Thompson, V. K., Thomson, L., Thorne, L., Tigwell, P. A., Tipton, N., Tiseanu, I., Tojo, H., Tokar, M. Z., Tomes, M., Tonner, P., Tosti, S., Towndrow, M., Trimble, P., Tripsky, M., Tsalas, M., Tsitrone, E., Tskhakaya jun, D., Tudisco, O., Turner, I., Turner, M. M., Turnyanskiy, M., Tvalashvili, G., Tyrrell, S. G. J., Ul-Abidin, Z., Ulyatt, D., Unterberg, B., Urano, H., Uytdenhouwen, I., Vadgama, A. P., Valcarcel, D., Valisa, M., Valovic, M., Van Eester, D., Van Renterghem, W., van Rooij, G. J., Var, as, C. A. F., Varoutis, S., Vartanian, S., Vasava, K., Vdovin, V., Vega, J., Verdoolaege, G., Verhoeven, R., Verona, C., Vervier, M., Veshchev, E., Vezinet, D., Vicente, J., Villari, S., Villone, F., Vinyar, I., Viola, B., Vitelli, R., Vitins, A., Vlad, M., Voitsekhovitch, I., Vondracek, P., Vrancken, M., Pires de Sa, W. W., Waldon, C. W. F., Walker, M., Walsh, M., Warren, R. J., Waterhouse, J., Watkins, N. W., Watts, C., Wauters, T., Way, M. W., Webster, A., Weckmann, A., Weil, Weisen, H., Weiszflog, M., Welte, S., Wendel, J., Wenninger, R., West, A. T., Wheatley, M. R., Whetham, S., Whitehead, A. M., Whitehead, B. D., Whittington, P., Widdowson, A. M., Wiesen, S., Wilkes, D., Wilkinson, J., Williams, M., Wilson, A. R., Wilson, D. J., Wilson, H. R., Wischmeier, M., Withenshaw, G., Witts, D. 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A., Bucko, K., Budny, R., Buffer, Bulman, M., Bulmer, N., Bunting, P., Buratti, P., Burcea, G., Burckhart, A., Buscarino, A., Butcher, P. R., Butler, N. K., Bykov, I., Byrne, J., Byszuk, A., Cackett, A., Cahyna, P., Cain, G., Calabro, G., Callaghan, C. P., Campling, D. C., Cane, J., Cannas, B., Capel, A. J., Caputano, M., Card, P. J., Cardinali, A., Carman, P., Carralero, D., Carraro, L., Carvalho, B. B., Carvalho, I., Carvalho, P., Casson, F. J., Castaldo, C., Cavazzana, R., Cavinato, M., Cazzaniga, A., Cecconello, M., Cecil, E., Cenedese, A., Centioli, C., Cesario, R., Challis, C. D., Ch, Ler, M., Ra, D., Chang, C. S., Chankin, A., Chapman, I. T., Chapman, S. C., Chernyshova, M., Chiru, P., Chitarin, G., Chouli, B., Chung, N., Ciraolo, G., Ciric, D., Citrin, J., Clairet, F., Clark, E., Clatworthy, D., Clay, R., Clever, M., Coates, P. A., Coccorese, V., Cocilovo, V., Coda, S., Coelho, R., Coenen, J. W., Coffey, I., Colas, L., Collins, S., Conboy, J. E., Conroy, S., Cook, N., Coombs, D., Cooper, D., Cooper, S. R., Corre, Y., Corrigan, G., Cortes, S., Coster, D., Couchman, A. S., Cox, M., Cox, M. P., Cox, P., Craciunescu, T., Cramp, S., Crisanti, F., Cristescu, I., Croci, G., Croft, O., Crombe, K., Crowe, R., Cruz, N., Cseh, G., Cull, K., Cupido, L., Curran, D., Curuia, M., Czarnecka, A., Czarski, T., Dalley, S., Dalziel, A., Darrow, D., Davies, R., Davis, W., Day, C., Day, I. E., de la Cal, E., de la Luna, E., De Magistris, M., de Pablos, J. L., De Tommasi, G., de Vries, P. C., Deakin, K., Deane, J., Decker, J., Degli Agostini, F., Dejarnac, R., Delabie, E., den Harder, N., Dendy, R. O., Denner, P., Devaux, S., Devynck, P., Di Maio, F., Di Pace, L., Dittmar, T., Dodt, D., Donne, T., Dooley, P., Dorling, S. E., Dormido-Canto, S., Doswon, S., Douai, D., Doyle, P. T., Dreischuh, T., Drewelow, P., Drozdov, V., Drozdowicz, K., Dumont, R., Dumortier, P., Dunai, D., Dunne, M., Duran, I., Durodie, F., Dutta, P., Duval, B., Dux, R., Dylst, K., Dzysiuk, N., Edappala, P. V., Edwards, A. M., Eich, Th., Ekedahl, A., Elevant, T., El-Jorf, R., Elsmore, C. G., Ericsson, G., Eriksson, A., Eriksson, J., Eriksson, L. G., Esposito, B., Esser, H. G., Esteve, D., Evans, G. E., Evans, J., Ewart, G. D., Ewers, D. T., Fagan, D., Falie, D., Farthing, J. W., Fasoli, A., Fattorini, L., Faugeras, B., Faustin, J., Fawlk, N., Federici, G., Fedorczak, N., Felton, R. C., Fenzi, C., Fernades, A., Fern, Es, H., Ferreira, J., Fessey, J. A., Figini, L., Figueiredo, A., Figueiredo, J., Fil, A., Finburg, P., Firdaouss, M., Fischer, U., Fittill, L., Fitzgerald, M., Flammini, D., Flanagan, J., Fleming, C., Flinders, K., Formisano, A., Forsythe, L., Fortuna, L., Fortune, M., Frasca, M., Frassinetti, L., Freisinger, M., Fresa, R., Frigione, D., Fuchs, V., Fyvie, J., Gadomska, M., Gal, K., Galperti, C., Galvao, R., Gao, X., Garavaglia, S., Garcia, J., Garcia-Carrasco, A., Garcia-Munoz, M., Gardner, M., Garzotti, L., Gaudio, P., Gauthier, E., Gaze, J. W., Gear, D. F., Gee, S. J., Gelfusa, M., Genangeli, E., Gerasimov, S., Gervasini, G., Ghate, M., Gherendi, M., Giacalone, J. C., Giacomelli, L., Gibson, C. S., Giegerich, T., Gin, D., Giovannozzi, E., Girardo, J. B., Giroud, C., Giruzzi, G., Gleason-Gonzalez, C., Godwin, J., Gohil, P., Gojska, A., Goloborod'Ko, V., Gomes, R., Goncalves, B., Goniche, M., Gonzalez, S., Goodsell, B., Goodyear, A., Gorini, G., Goussarov, A., Graham, B., Graham, M. E., Graves, J., Grazier, N., Green, N. R., Greuner, H., Grigore, E., Griph, F. S., Grisolia, C., Grist, D., Groth, M., Grundy, C. N., Gryaznevich, M., Guard, D., Gubb, D., Guillemaut, C., Guo, Y., Utoh, H. H., Hackett, L. J., Hacquin, S., Hagar, A., Hakola, A., Halitovs, M., Hall, S. J., Hallworth Cook, S. P., Hammond, K., Hart, J., Harting, D., Hartmann, N., Haupt, T. D. V., Hawkes, N. C., Hawkins, J., Haydon, P. W., Hazel, S., Heesterman, P. J. L., Hellesen, C., Hellsten, T., Helou, W., Hemming, O. N., Hender, T. C., Henderson, M., Henriques, R., Hepple, D., Hermon, G., Hidalgo, C., Highcock, E. G., Hill, J. W., Hill, M., Hillairet, J., Hillesheim, J., Hillis, D., Hjalmarsson, A., Hobirk, J., Hogben, C. H. A., Hogeweij, G. M. D., Homfray, D. A., Horacek, J., Horton, A. R., Horton, L. D., Hotchin, S. P., Hough, M. R., Howarth, P. J., Huber, A., Huddleston, T. M., Hughes, M., Hunter, C. 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R., Kotov, V., Kowalska-Strzeciwilk, E., Krasilnikov, A., Krasilnikov, V., Kreter, A., Krieger, K., Krivchenkov, Y., Krivska, A., Kruezi, U., Ksiazek, I., Kukushkin, A., Kundu, A., Kurki-Suonio, T., Kwon, O. T., Kyrytsya, V., Laan, M., Labate, C., Laguardia, L., Lam, N., Lane, C., Lang, P. T., Lapins, J., Lasa, A., Last, J. R., Lawson, A., Lawson, K. D., Lazaros, A., Lazzaro, E., Lee, S., Leggate, H. J., Lehnen, M., Leichtle, D., Leichuer, P., Leipold, F., Lengar, I., Lennholm, M., Lerche, E., Leyl, Leysen, W., Liang, Y., Likonen, J., Lindholm, V., Linke, J., Linsmeier, Ch., Lipschultz, B., Litaudon, X., Liu, G., Liu, Y., Lo Schiavo, V. P., Loarer, T., Loarte, A., Lobel, R. C., Lohr, N., Lomas, P. J., Lonnroth, J., Lopez, J., Lopez, J. M., Louche, F., Loving, A. B., Lowbridge, S., Lowry, C., Luce, T., Lucock, R. M. A., Lukin, A., Lungu, A. M., Lungu, C. P., Lupelli, I., Lyssoivan, A., Macheta, P., Mackenzie, A. S., Maddaluno, G., Maddison, G. P., Magesh, B., Maget, P., Maggi, C. F., Maier, H., Mailloux, J., Maj, A., Makkonen, T., Makwana, R., Malaquias, A., Mansffield, F., Mansfield, M., Manso, M. E., Mantica, P., Mantsinen, M., Manzanares, A., Mar, Et, Y., Marcenko, N., Marchetto, C., Marchuk, O., Marinelli, M., Marinucci, M., Markovic, T., Marocco, D., Marot, L., Marren, C. A., Marsen, S., Marshal, R., Martin, A., Martin, D. L., Martin, Y., Martin de Aguilera, A., Martin-Solis, J. R., Masiello, A., Maslov, M., Maslova, V., Matejcik, S., Mattei, M., Matthews, G. F., Matveev, D., Matveev, M., Maviglia, F., Mayer, M., Mayoral, M. -L., Mazon, D., Mazzotta, C., Mcadams, R., Mccarthy, P. J., Mcclements, K. G., Mccormick, K., Mccullen, P. A., Mcdonald, D., Mcgregor, R., Mckean, R., Mckehon, J., Mckinley, R., Meadows, I., Meadows, R. C., Medina, F., Medl, Medley, S., Meigh, S., Meigs, A. G., Meneses, L., Menmuir, S., Merrigan, I. R., Mertens, Ph., Meshchaninov, S., Messiaen, A., Meszaros, B., Meyer, H., Miano, G., Michling, R., Middleton-Gear, D., Miettunen, J., Migliucci, P., Militello-Asp, E., Minucci, S., Mirizzi, F., Miyoshi, Y., Mlynar, J., Monakhov, I., Monier-Garbet, P., Mooney, R., Moradi, S., Mordijck, S., Moreira, L., Moreno, R., Morgan, P. D., Morgan, R., Morley, L., Morlock, C., Morris, A. W., Morris, J., Moser, L., Moulton, D., Murari, A., Muraro, A., Mustata, I., Asakura, N. N., Nabais, F., Nakano, T., Nardon, E., Naulin, V., Nave, M. F. F., Nedzelski, I., Neethiraj, N., Nemtsev, G., Nespoli, F., Neto, A., Neu, R., Neubauer, O., Newman, M., Nicholls, K. J., Nicolai, D., Nicolas, T., Nieckchen, P., Nielsen, P., Nightingale, M. P. S., Nilsson, E., Nishijima, D., Noble, C., Nocente, M., Nodwell, D., Nordman, H., Nunes, I., O'Meara, B., Oberkofler, M., Obryk, B., Odupitan, T., Ogawa, M. T., O'Gorman, T., Okabayashi, M., Olariu, S., O'Mullane, M., Ongena, J., Orsitto, F., Oswuigwe, B. I., Pace, N., Pacella, D., Page, A., Paget, A., Pagett, D., Pajuste, E., Palazzo, S., Pamela, J., Pamela, S., Panin, A., Panja, S., Papp, P., Parail, V., Paris, P., Parish, S. C. W., Park, M., Parsloe, A., Pasqualotto, R., Pearson, I. J., Pedrosa, M. A., Pereira, R., Perelli Cippo, E., Perez von Thun, Ch., Perez-Von-Thun, C., Pericoli-Ridolfini, V., Perona, A., Peruzzo, S., Peschanyi, S., Peterka, M., Petersson, P., Petravich, G., Petrzilka, V., Pfefferle, D., Philipps, V., Pietropaolo, A., Pillon, M., Pintsuk, G., Piovesan, P., Pires dos Reis, A., Pironti, A., Pisano, F., Pitts, R., Plusczyk, C., Plyusnin, V., Pomaro, N., Pompilian, O., Pool, P. J., Popovichev, S., Porcelli, F., Porosnicu, C., Porton, M., Pospieszczyk, A., Possnert, G., Potzel, S., Powell, T., Pozniak, K., Pozzi, J., Prajapati, V., Prakash, R., Prestopino, G., Price, D., Price, R., Prior, P., Prokopowicz, R., Proudfoot, R., Puglia, P., Puiatti, M. E., Pulley, D., Purahoo, K., Putterich, T., Quercia, A., Rachlew, E., Rack, M., Raeder, J., Rainford, M. S. J., Ramogida, G., Ranjan, S., Rasmussen, J., Rasmussen, J. J., Rathod, K., Ratta, G., Rayner, C., Rebai, M., Reece, D., Reed, A., Refy, D., Regan, B., Regana, J., Reich, M., Reid, P., Reinelt, M., Reinke, M. L., Reinke, M., Reiser, D., Reiter, D., Rendell, D., Reux, C., Riccardo, V., Rimini, F. G., Riva, M., Roberts, J. E. C., Robins, R. J., Robinson, S. A., Robinson, T., Robson, D. W., Roddick, P., Rodionov, R., Rohde, V., Romanelli, F., Romanelli, M., Romanelli, S., Romano, A., Rowe, D., Rowe, S., Rowley, A., Rubinacci, G., Ruchko, L., Ruiz, M., Ruset, C., Ryc, L., Rzadkiewicz, J., Saarelma, S., Sabot, R., Sadakov, S., Safi, E., Sagar, P., Saibene, G., Saint-Laurent, F., Salewski, M., Salmi, A., Salzedas, F., Samm, U., S, Iford, D., Quist, P., Santa, P., Santala, M. I. K., Sartori, F., Sartori, R., Saunders, R., Sauter, O., Scannell, R., Scarabosio, A., Schlummer, T., Schmidt, V., Schmitz, O., Schmuck, S., Schneider, M., Scholz, M., Schopf, K., Schweer, B., Sergienko, G., Serikov, A., Sertoli, M., Shabbir, A., Shannon, M., Shannon, M. M. J., Sharapov, S. E., Shaw, I., Shaw, S. R., Shepherd, A., Shevelev, A., Shumack, A., Sibbald, M., Sieglin, B., Silva, C., Simmons, P. A., Sinha, A., Sipila, S. K., Sips, A. C. C., Siren, P., Sirinelli, A., Sjostr, Skiba, M., Skilton, R., Slade, B., Smith, N., Smith, P. G., Smith, T. J., Snoj, L., Soare, S., Solano, E. R., Soldatov, S., Sonato, P., Sopplesa, A., Sousa, J., Sowden, C. B. C., Sozzi, C., Sparkes, A., Spelzini, T., Spineanu, F., Stables, G., Stamatelatos, I., Stamp, M. F., Stancalie, V., Stankiewicz, R., Stankunas, G., Stano, M., Stan-Sion, C., Starkey, D. E., Stead, M. J., Stejner, M., Stephen, A. V., Stephen, M., Stevens, B. D., Stoyanov, D., Strachan, J., Str, Stransky, M., Strom, P., Stubbs, G., Studholme, W., Subba, F., Summers, H. P., Sun, Y., Svensson, J., Sykes, N., Syme, B. D., Szabolics, T., Szepesi, G., Szydlowski, A., Suzuki, T. T., Tabares, F., Takalo, V., Tal, B., Tala, T., Talbot, A. R., Taliercio, C., Tamain, P., Tame, C., Tardocchi, M., Taroni, L., Taylor, K. A., Telesca, G., Teplova, N., Terra, A., Testa, D., Teuchner, B., Tholerus, S., Thomas, F., Thomas, J. D., Thomas, P., Thompson, A., Thompson, C. -A., Thompson, V. K., Thomson, L., Thorne, L., Tigwell, P. A., Tipton, N., Tiseanu, I., Tojo, H., Tokar, M. Z., Tomes, M., Tonner, P., Tosti, S., Towndrow, M., Trimble, P., Tripsky, M., Tsalas, M., Tsitrone, E., Tskhakaya jun, D., Tudisco, O., Turner, I., Turner, M. M., Turnyanskiy, M., Tvalashvili, G., Tyrrell, S. G. J., Ul-Abidin, Z., Ulyatt, D., Unterberg, B., Urano, H., Uytdenhouwen, I., Vadgama, A. P., Valcarcel, D., Valisa, M., Valovic, M., Van Eester, D., Van Renterghem, W., van Rooij, G. J., Var, As, C. A. F., Varoutis, S., Vartanian, S., Vasava, K., Vdovin, V., Vega, J., Verdoolaege, G., Verhoeven, R., Verona, C., Vervier, M., Veshchev, E., Vezinet, D., Vicente, J., Villari, S., Villone, F., Vinyar, I., Viola, B., Vitelli, R., Vitins, A., Vlad, M., Voitsekhovitch, I., Vondracek, P., Vrancken, M., Pires de Sa, W. W., Waldon, C. W. F., Walker, M., Walsh, M., Warren, R. J., Waterhouse, J., Watkins, N. W., Watts, C., Wauters, T., Way, M. W., Webster, A., Weckmann, A., Weil, Weisen, H., Weiszflog, M., Welte, S., Wendel, J., Wenninger, R., West, A. T., Wheatley, M. R., Whetham, S., Whitehead, A. M., Whitehead, B. D., Whittington, P., Widdowson, A. M., Wiesen, S., Wilkes, D., Wilkinson, J., Williams, M., Wilson, A. R., Wilson, D. J., Wilson, H. R., Wischmeier, M., Withenshaw, G., Witts, D. M., Wojciech, D., Wojenski, A., Wood, D., Wood, S., Woodley, C., Woznicka, U., Wright, J., Wu, J., Yao, L., Yapp, D., Yavorskij, V., Yoo, M. G., Yorkshades, J., Young, C., Young, D., Young, I. D., Zabolotny, W., Zacks, J., Zagorski, R., Zaitsev, F. S., Zanino, R., Zaroschi, V., Zastrow, K. D., Zeidner, W., Ziolkowski, A., Zoita, V., Zoletnik, S., Zychor, I., Jet, Contributors, Universidad de Sevilla. Departamento de Física Atómica, Molecular y Nuclear, Universidad de Sevilla. RNM138: Física Nuclear Aplicada, and Department of Physics
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Nuclear and High Energy Physics ,Materials science ,Materials Science (miscellaneous) ,Nuclear engineering ,Ion beam analysis ,chemistry.chemical_element ,Tungsten ,01 natural sciences ,114 Physical sciences ,010305 fluids & plasmas ,Fusion, plasma och rymdfysik ,0103 physical sciences ,Forensic engineering ,010306 general physics ,Deposition ,Plasma facing components ,Jet (fluid) ,ITER-like wall ,Divertor ,JET, ITER-like wall, Plasma facing components, Erosion, Deposition, Ion beam analysis ,Plasma ,equipment and supplies ,lcsh:TK9001-9401 ,Fusion, Plasma and Space Physics ,respiratory tract diseases ,Nuclear Energy and Engineering ,chemistry ,JET ,Erosion ,lcsh:Nuclear engineering. Atomic power ,Beryllium ,Deposition (chemistry) - Abstract
Post-mortem analyses of individual components provide relevant information on plasma-surface interactions like tungsten erosion, beryllium deposition and plasma fuel retention with divertor tiles via implantation or co-deposition. Ion Beam techniques are ideal tools for such purposes and have been extensively used for post-mortem analyses of selected tiles from JET following each campaign. In this contribution results from tiles removed from the JET ITER-Like Wall (JET-ILW) divertor following the 2013-2014 campaign are presented. The results summarize erosion, deposition and fuel retention along the poloidal cross section of the divertor surface and provide data for comparison with the first JET-ILW campaign, showing a similar pattern of material migration with the exception of Tile 6 where the strike point time on the tile was similar to 4 times longer in 2013-2014 than in 2011-2012, which is likely to account for more material migration to this region. The W deposition on top of the Mo marker coating of Tile 4 shows that the enrichment takes place at the strike point location. (C) 2016 The Authors. Published by Elsevier Ltd. For complete list of authors see http://dx.doi.org/10.1016/j.nme.2016.10.027
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- 2017
21. Optimization of nanocomposite Au/TiO₂ thin films towards LSPR optical-sensing
- Author
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Rodrigues, Marco S., Costa, D., Domingues, R. P., Apreutesei, M., Pedrosa, Paulo Eduardo Teixeira Baptista, Martin, N., Correlo, V. M., Reis, R. L., Alves, E., Barradas, N. P., Sampaio, Paula, Borges, Joel Nuno Pinto, Vaz, F., and Universidade do Minho
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Surface plasma activation ,Science & Technology ,Au nanoparticle ,LSPR ,Plasmonics ,Titanium dioxide ,Magnetron sputtering - Abstract
"Available online 20 September 2017.", Nanomaterials based on Localized Surface Plasmon Resonance (LSPR) phenomena are revealing to be an important solution for several applications, namely those of optical biosensing. The main reasons are mostly related to their high sensitivity, with label-free detection, and to the simplified optical systems that can be implemented. For the present work, the optical sensing capabilities were tailored by optimizing LSPR absorption bands of nanocomposite Au/TiO 2 thin films. These were grown by reactive DC magnetron sputtering. The main deposition parameters changed were the number of Au pellets placed in the Ti target, the deposition time, and DC current applied to the Ti-Au target. Furthermore, the Au NPs clustering, a key feature to have biosensing responses, was induced by several post-deposition in-air annealing treatments at different temperatures, and investigated via SEM analysis. Results showed that the Au/TiO2 thin films with a relatively low thickness (∼100 nm), revealing concentrations of Au close to 13 at.%, and annealed at temperatures above 600 °C, had the most well-defined LSPR absorption band and thus, the most promising characteristics to be explored as optical sensors. The NPs formation studies revealed an incomplete aggregation at 300 and 500 ⁰C and well-defined spheroidal NPs for higher temperatures. Plasma treatment with Ar led to a gradual blue-shift of the LSPR absorption band, which demonstrates the sensitivity of the films to changes in the dielectric environment surrounding the NPs (essential for optical sensing applications) and the exposure of the Au nanoparticles (crucial for a higher sensitivity)., This research was sponsored by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Strategic Funding UID/FIS/04650/2013 and FCT Project 9471 - Reforçar a Investigação, o Desenvolvimento Tecnológico e a Inovação (Projeto 9471-RIDTI), comparticipado pelo Fundo Comunitário Europeu FEDER and with reference PTDC/FIS-NAN/1154/2014. Joel Borges also acknowledges FCT for his Post-Doc Grant SFRH/BPD/117010/2016 and Marco S. Rodrigues acknowledges his PhD-Grant from FCT with reference SFRH/BD/118684/2016. Paulo Pedrosa acknowledges the support by the region of Franche-Comté in cooperation with the Labex ACTION program (contract ANR-11-LABX-01-01) and also the MIMENTO Platform of the RENATECH network., info:eu-repo/semantics/publishedVersion
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- 2018
22. Overview of fuel inventory in JET with the ITER-like wall
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Widdowson, A., Coad, J. P., Alves, E., Baron-Wiechec, A., Barradas, N. P., Brezinsek, S., Catarino, N., Corregidor, V., Heinola, K., Koivuranta, S., Krat, S., Lahtinen, A., Likonen, J., Matthews, G. F., Mayer, M., Petersson, P., Litaudon, Rubel M., Abduallev, X., Abhangi, S., Abreu, M., Afzal, P., Aggarwal, M., Ahlgren, K. M., Ahn, T., J. H., Aho, Mantila, Aiba, L., Airila, N., Albanese, M., Aldred, R., Alegre, V., Alessi, D., Aleynikov, E., Alfier, P., Alberto, Alkseev, Allinson, A., Alper, M., Alves, B., Ambrosino, E., Ambrosino, G., Amicucci, R., Amosov, L., Andersson, Sundã©n, Angelone, E., Anghel, M., Angioni, M., Appel, C., Appelbee, L., Arena, C., Ariola, P., Arnichand, M., Arshad, H., Ash, S., Ashikawa, A., Aslanyan, N., Asunta, V., Auriemma, O., Fulvio, Austin, Avotina, Y., Axton, L., Ayres, M. D., Bacharis, C., Baciero, M., Baiã¡o, A., Bailey, D., Baker, S., Balboa, A., Balden, I., Balshaw, M., Bament, N., Banks, R., Baranov, J. W., Barnard, Y. F., Barnes, M. A., Barnes, D., Barnsley, M., Baron, Wiechec, Barrera, Orte, Baruzzo, L., Matteo, Basiuk, Bassan, V., Bastow, M., Batista, R., Batistoni, A., Baughan, P., Bauvir, R., Baylor, B., Bazylev, L., Beal, B., Beaumont, J., Beckers, P. S., Beckett, M., Becoulet, B., Bekris, A., Beldishevski, N., Bell, M., Belli, K., Bellinger, F., Belonohy, M., Ben, Ayed, Benterman, N., Bergsã¥ker, N. A., Bernardo, H., Bernert, J., Berry, M., Bertalot, M., Besliu, L., Beurskens, C., Bieg, M., Bielecki, B., Biewer, J., Bigi, T., Bã¬lkovã¡, M., Binda, P., Bisoffi, F., Bizarro, A., Bjã¶rkas, J. P. S., Blackburn, C., Blackman, J., Blackman, K., Blanchard, T. R., Blatchford, P., Bobkov, P., Boboc, V., Bodnã¡r, A., Bogar, G., Bolshakova, O., Bolzonella, I., Tommaso, Bonanomi, Bonelli, N., Boom, F., Booth, J., Borba, J., Borodin, D., Borodkina, D., Botrugno, I., Bottereau, A., Boulting, C., Bourdelle, P., Bowden, C., Bower, M., Bowman, C., Boyce, C., Boyd, T., Boyer, C., Bradshaw, H. J., Braic, J. M. A., Bravanec, V., Breizman, R., Bremond, B., Brennan, S., Breton, P. D., Brett, S., Brezinsek, A., Bright, S., Brix, M. D. J., Broeckx, M., Brombin, W., Matteo, Broså‚awski, Brown, A., Brown, D. P. D., Bruno, M., Bucalossi, E., Buch, J., Buchanan, J., Buckley, J., Budny, M. A., Bufferand, R., Bulman, H., Bulmer, M., Bunting, N., Buratti, P., Burckhart, P., Buscarino, A., Busse, A., Butler, A., Bykov, N. K., Byrne, I., Cahyna, J., Calabrã², P., Calvo, G., Camenen, I., Camp, Y., Campling, P., Cane, D. C., Cannas, J., Capel, B., Card, A. J., Cardinali, P. J., Carman, A., Carr, P., Carralero, M., Carraro, D., Carvalho, L., Carvalho, B. B., Carvalho, I., Casson, P., Castaldo, F. J., Catarino, C., Caumont, N., Causa, J., Cavazzana, F., Cave, Ayland, Cavinato, K., Cecconello, M., Ceccuzzi, M., Cecil, S., Cenedese, E., Angelo, Cesario, Challis, R., Chandler, C. D., Chandra, M., Chang, D., Chankin, C. S., Chapman, A., Chapman, I. T., Chernyshova, S. C., Chitarin, M., Giuseppe, Ciraolo, Ciric, G., Citrin, D., Clairet, J., Clark, F., Clark, E., Clarkson, M., Clatworthy, R., Clements, D., Cleverly, C., Coad, M., Coates, J. P., Cobalt, P. A., Coccorese, A., Cocilovo, V., Coda, V., Coelho, S., Coenen, R., Coffey, J. W., Colas, I., Collins, L., Conka, S., Conroy, D., Conway, S., Coombs, N., Cooper, D., Corradino, S. R., Corre, C., Corrigan, Y., Cortes, G., Coster, S., Couchman, D., Cox, A. S., Craciunescu, M. P., Cramp, T., Craven, S., Crisanti, R., Croci, F., Croft, G., Crombã©, D., Crowe, K., Cruz, R., Cseh, N., Cufar, G., Cullen, A., Curuia, A., Czarnecka, M., Dabirikhah, A., Dalgliesh, H., Dalley, P., Dankowski, S., Darrow, J., Davies, D., Davis, O., Day, W., Day, C., I. E., Bock, De, Castro, De, De La Cal, De La Luna, Masi, De, Pablos, De, J. L., Temmerman, De, Tommasi, De, Vries, De, Deakin, P., Deane, K., Degli, Agostini, Dejarnac, F., Delabie, R., Den, Harder, Dendy, N., Denis, R. O., Denner, J., Devaux, P., Devynck, S., Maio, Di, Siena, Di, Troia, Di, Dinca, C., D'Inca, P., Ding, R., Dittmar, B., Doerk, T., Doerner, H., Donnã©, R. P., Dorling, T., S. E., Dormido, Canto, Doswon, S., Douai, S., Doyle, D., Drenik, P. T., Drewelow, A., Drews, P., Duckworth, P., Dumont, P. h., Dumortier, R., Dunai, P., Dunne, D., Äžuran, M., Durodiã©, I., Dutta, F., Duval, P., Dux, B. P., Dylst, R., Dzysiuk, K., Edappala, N., Edmond, P. V., Edwards, J., Edwards, A. M., Eich, J., Ekedahl, T. h., Jorf, El, Elsmore, R., Enachescu, C. G., Ericsson, M., Eriksson, G., Eriksson, F., Eriksson, J., Esposito, L. G., Esquembri, B., Esser, S., Esteve, H. G., Evans, D., Evans, B., Evison, G. E., Ewart, G., Fagan, G. D., Faitsch, D., Falie, M., Fanni, D., Fasoli, A., Faustin, A., Fawlk, J. M., Fazendeiro, N., Fedorczak, L., Felton, N., Fenton, R. C., Fernades, K., Fernandes, A., Ferreira, H., Fessey, J., Fã©vrier, J. A., Ficker, O., Field, O., Fietz, A., Figueiredo, S., Figueiredo, A., Fil, J., Finburg, A., Firdaouss, P., Fischer, M., Fittill, U., Fitzgerald, L., Flammini, M., Flanagan, D., Fleming, J., Flinders, C., Fonnesu, K., Fontdecaba, N., Formisano, J. M., Forsythe, A., Fortuna, L., Fortuna, Zalesna, Fortune, E., Foster, M., Franke, S., Franklin, T., Frasca, T., Frassinetti, M., Freisinger, L., Fresa, M., Frigione, R., Fuchs, D., Fuller, V., Futatani, D., Fyvie, S., Gã¡l, J., Galassi, K., Gaå‚azka, D., Galdon, Quiroga, Gallagher, J., Gallart, J., Galvã¡o, D., Gao, R., Gao, X., Garcia, Y., Garcia, Carrasco, Garcã¬a, Muã±oz, Gardarein, M., Garzotti, J. L., Gaudio, L., Gauthier, P., Gear, E., Gee, D. F., Geiger, S. J., Gelfusa, B., Gerasimov, M., Gervasini, S., Gethins, G., Ghani, M., Ghate, Z., Gherendi, M., Giacalone, M., Giacomelli, J. C., Gibson, L., Giegerich, C. S., Gil, T., Gil, C., Gilligan, L., Gin, S., Giovannozzi, D., Girardo, E., Giroud, J. B., Giruzzi, C., Gerardo, Glã¶ggler, Godwin, S., Goff, J., Gohil, J., Goloborod'Ko, P., Gomes, V., Goncalves, R., Goniche, B., Goodliffe, M., Goodyear, M., Gorini, A., Gosk, G., Goulding, M., Goussarov, R., Gowland, A., Graham, R., Graham, B., Graves, M. E., Grazier, J. P., Grazier, N., Green, P., Greuner, N. R., Grierson, H., Griph, B., Grisolia, F. S., Grist, C., Groth, D., Grove, M., Grundy, R., Grzonka, C. N., Guard, J., Guã©rard, D., Guillemaut, C., Guirlet, C., Gurl, R., Utoh, C., Hackett, H. H., Hacquin, L. J., Hagar, S., Hager, A., Hakola, R., Halitovs, A., Hall, M., S. J., Hallworth, Cook, S. P., Hamlyn, Harris, Hammond, C., Harrington, K., Harrison, C., Harting, J., Hasenbeck, D., Hatano, F., Hatch, Y., Haupt, D. R., Hawes, T. D. V., Hawkes, J., Hawkins, N. C., Hawkins, J., Haydon, P., Hayter, P. W., Hazel, N., Heesterman, S., Heinola, P. J. L., Hellesen, K., Hellsten, C., Helou, T., Hemming, W., Hender, O. N., Henderson, T. C., Henderson, M., Henriques, S. S., Hepple, R., Hermon, D., Hertout, G., Hidalgo, P., Highcock, C., Hill, E. G., Hillairet, M., Hillesheim, J., Hillis, J., Hizanidis, D., Hjalmarsson, K., Hobirk, A., Hodille, J., Hogben, E., Hogeweij, C. H. A., Hollingsworth, G. M. D., Hollis, A., Homfray, S., Horã¡äek, D. A., Hornung, J., Horton, G., Horton, A. R., Horvath, L. D., Hotchin, L., Hough, S. P., Howarth, M. R., Hubbard, P. J., Huber, A., Huddleston, V., Hughes, T. M., Huijsmans, M., Hunter, G. T. A., Huynh, C. L., Hynes, P., Iglesias, A. M., Imazawa, D., Imbeaux, N., Imrã¬å¡ek, F., Incelli, M., Innocente, M., Irishkin, P., Ivanova, Stanik, Jachmich, I., Jacobsen, S., Jacquet, A. S., Jansons, P., Jardin, J., Jã¤rvinen, A., Jaulmes, A., Jednorã³g, F., Jenkins, S., Jeong, I., Jepu, C., Joffrin, I., Johnson, E., Johnson, R., Johnston, T., Jane, Joita, Jones, L., Jones, G., Hoshino, T. T. C., Kallenbach, K. K., Kamiya, A., Kaniewski, K., Kantor, J., Kappatou, A., Karhunen, A., Karkinsky, J., Karnowska, D., Kaufman, I., Kaveney, M., Kazakov, G., Kazantzidis, Y., Keeling, V., Keenan, D. L., Keep, T., Kempenaars, J., Kennedy, M., Kenny, C., Kent, D., Kent, J., Khilkevich, O. N., Kim, E., Kim, H. T., Kinch, H. S., King, A., King, C., King, D., Kinna, R. F., Kiptily, D. J., Kirk, V., Kirov, A., Kirschner, K., Kizane, A., Klepper, G., Klix, C., Knight, A., Knipe, P., Knott, S. J., Kobuchi, S., Kã¶chl, T., Kocsis, F., Kodeli, G., Kogan, I., Kogut, L., Koivuranta, D., Kominis, S., Kã¶ppen, Y., Kos, M., Koskela, B., Koslowski, T., Koubiti, H. R., Kovari, M., Kowalska, Strzè©ciwilk, Krasilnikov, E., Krasilnikov, A., Krawczyk, V., Kresina, N., Krieger, M., Krivska, K., Kruezi, A., Ksiaå¼ek, U., Kukushkin, I., Kundu, A., Kurki, Suonio, Kwak, T., Kwiatkowski, S., Kwon, R., Laguardia, O. J., Lahtinen, L., Laing, A., Lam, A., Lambertz, N., Lane, H. T., Lang, C., Lanthaler, P. T., Lapins, S., Lasa, J., Last, A., Åaszyå„ska, J. R., Lawless, E., Lawson, R., Lawson, A., Lazaros, K. D., Lazzaro, A., Leddy, E., Lee, J., Lefebvre, S., Leggate, X., Lehmann, H. J., Lehnen, J., Leichtle, M., Leichuer, D., Leipold, P., Lengar, F., Lennholm, I., Lerche, M., Lescinskis, E., Lesnoj, A., Letellier, S., Leyland, E., Leysen, M., Li, W., Liang, L., Likonen, Y., Linke, J., Linsmeier, J., Lipschultz, C. h., Liu, B., Liu, G., Schiavo, Lo, Loarer, V. P., Loarte, T., Lobel, A., Lomanowski, R. C., Lomas, B., Lã¶nnroth, P. J., Lã³pez, J., J. M., Lã³pez, Razola, Lorenzini, J., Losada, R., Lovell, U., Loving, J. J., Lowry, A. B., Luce, C., Lucock, T., Lukin, R. M. A., Luna, A., Lungaroni, C., Lungu, M., Lungu, C. P., Lunniss, M., Lupelli, A., Lyssoivan, I., Macdonald, A., Macheta, N., Maczewa, P., Magesh, K., Maget, B., Maggi, P., Maier, C., Mailloux, H., Makkonen, J., Makwana, T., Malaquias, R., Malizia, A., Manas, A., Manning, P., Manso, A., Mantica, M. E., Mantsinen, P., Manzanares, M., Maquet, A., Marandet, P. h., Marcenko, Y., Marchetto, N., Marchuk, C., Marinelli, O., Marinucci, M., Markoviä, M., Marocco, T., Marot, D., Marren, L., Marshal, C. A., Martin, R., Martin, A., Martìn De Aguilera, Martã¬nez, A., F. J., Martã¬n, Solã¬s, Martynova, J. R., Maruyama, Y., Masiello, S., Maslov, A., Matejcik, M., Mattei, S., Matthews, M., Maviglia, G. F., Mayer, F., Mayoral, M., M. L., May, Smith, Mazon, T., Mazzotta, D., Mcadams, C., Mccarthy, R., Mcclements, P. J., Mccormack, K. G., Mccullen, O., Mcdonald, P. A., Mcintosh, D., Mckean, S., Mckehon, R., Meadows, J., Meakins, R. C., Medina, A., Medland, F., Medley, M., Meigh, S., Meigs, S., Meisl, A. G., Meitner, G., Meneses, S., Menmuir, L., Mergia, S., Merrigan, K., Mertens, I. R., Meshchaninov, P. h., Messiaen, S., Meyer, A., Mianowski, H., Michling, S., Middleton, Gear, Miettunen, D., Militello, J., Militello, Asp, Miloshevsky, E., Mink, G., Minucci, F., Miyoshi, S., Mlynã¡å™, Y., Molina, J., Monakhov, D., Moneti, I., Mooney, M., Moradi, R., Mordijck, S., Moreira, S., Moreno, L., Moro, R., Morris, F., Morris, A. W., Moser, J., Mosher, L., Moulton, S., Murari, D., Muraro, A., Murphy, A., Asakura, S., N. N., Na, Nabais, Y. S., Naish, F., Nakano, R., Nardon, T., Naulin, E., Nave, V., Nedzelski, M. F. F., Nemtsev, I., Nespoli, G., Neto, F., Neu, A., Neverov, R., Newman, V. S., Nicholls, M., Nicolas, K. J., Nielsen, T., Nielsen, A. H., Nilsson, P., Nishijima, E., Noble, D., Nocente, C., Nodwell, M., Nordlund, D., Nordman, K., Nouailletas, H., Nunes, R., Oberkofler, I., Odupitan, M., Ogawa, T., O'Gorman, M. T., Okabayashi, T., Olney, M., Omolayo, R., O'Mullane, O., Ongena, M., Orsitto, J., Orszagh, F., Oswuigwe, J., Otin, B. I., Owen, R., Paccagnella, A., Pace, R., Pacella, N., Packer, D., Page, L. W., Pajuste, A., Palazzo, E., Pamela, S., Panja, S., Papp, S., Paprok, P., Parail, R., Park, V., Parra, Diaz, Parsons, F., Pasqualotto, M., Patel, R., Pathak, A., Paton, S., Patten, D., Pau, H., Pawelec, A., Paz, Soldan, Peackoc, C., Pearson, A., Pehkonen, I. J., Peluso, S. P., Penot, E., Pereira, C., Pereira, A., Pereira, Puglia, P. P., Perez Von Thun, Peruzzo, C., Peschanyi, S., Peterka, S., Petersson, M., Petravich, P., Petre, G., Petrella, A., Petrå¾ilka, N., Peysson, V., Pfefferlã©, Y., Philipps, D., Pillon, V., Pintsuk, M., Piovesan, G., Pires Dos Reis, Piron, Lidia, Pironti, A., Pisano, F., Pitts, R., Pizzo, F., Plyusnin, V., Pomaro, N., Pompilian, O. G., Pool, P. J., Popovichev, S., Porfiri, M. T., Porosnicu, C., Porton, M., Possnert, G., Potzel, S., Powell, T., Pozzi, J., Prajapati, V., Prakash, R., Prestopino, G., Price, D., Price, M., Price, R., Prior, P., Proudfoot, R., Pucella, G., Puglia, P., Puiatti, M. E., Pulley, D., Purahoo, K., Pã¼tterich, T. h., Rachlew, E., Rack, M., Ragona, R., Rainford, M. S. J., Rakha, A., Ramogida, G., Ranjan, S., Rapson, C. J., Rasmussen, J. J., Rathod, K., Rattã¡, G., Ratynskaia, S., Ravera, G., Rayner, C., Rebai, M., Reece, D., Reed, A., Rã©fy, D., Regan, B., Regaã±a, J., Reich, M., Reid, N., Reimold, F., Reinhart, M., Reinke, M., Reiser, D., Rendell, D., Reux, C., Reyes, Cortes, Reynolds, S. D. A., Riccardo, S., Richardson, V., Riddle, N., Rigamonti, K., Rimini, D., Risner, F. G., Riva, J., Roach, M., Robins, C., Robinson, R. J., Robinson, S. A., Robson, T., Roccella, D. W., Rodionov, R., Rodrigues, R., Rodriguez, P., Rohde, J., Romanelli, V., Romanelli, F., Romanelli, M., Romazanov, S., Rowe, J., Rubel, S., Rubinacci, M., Rubino, G., Ruchko, G., Ruiz, L., Ruset, M., Rzadkiewicz, C., Saarelma, J., Sabot, S., Safi, R., Sagar, E., Saibene, P., Saint, Laurent, Salewski, F., Salmi, M., Salmon, A., Salzedas, R., Samaddar, F., Samm, D., Sandiford, U., Santa, D., Santala, P., Santos, M. I. K., Santucci, B., Sartori, A., Sartori, F., Sauter, R., Scannell, O., Schlummer, R., Schmid, T., Schmidt, K., Schmuck, V., Schneider, S., Schã¶pf, M., Schwã¶rer, K., Scott, D., Sergienko, S. D., Sertoli, G., Shabbir, M., Sharapov, A., Shaw, S. E., Shaw, A., Sheikh, R., Shepherd, H., Shevelev, A., Shumack, A., Sias, A., Sibbald, G., Sieglin, M., Silburn, B., Silva, S., Silva, A., Simmons, C., Simpson, P. A., Simpson, Hutchinson, Sinha, J., Sipilã¤, A., Sips, S. K., Sirã©n, A. C. C., Sirinelli, P., Sjã¶strand, A., Skiba, H., Skilton, M., Slabkowska, R., Slade, K., Smith, B., Smith, N., Smith, P. G., Smith, R., Smithies, T. J., Snoj, M., Soare, L., Solano, S., Somers, E. R., Sommariva, A., Sonato, C., Piergiorgio, Sopplesa, Sousa, A., Sozzi, J., Spagnolo, C., Silvia, Spelzini, Spineanu, T., Stables, F., Stamatelatos, G., Stamp, I., Staniec, M. F., Stankå«nas, P., Stan, Sion, Stead, C., Stefanikova, M. J., Stepanov, E., Stephen, I., Stephen, A. V., Stevens, M., Stevens, A., Strachan, B. D., Strand, J., Strauss, P., Strã¶m, H. R., Stubbs, P., Studholme, G., Subba, W., Summers, F., Svensson, H. P., Åšwiderski, J., Szabolics, Å. ., Szawlowski, T., Szepesi, M., Suzuki, G., Tã¡l, T. T., Tala, B., Talbot, T., Talebzadeh, A. R., Taliercio, S., Cesare, Tamain, Tame, P., Tang, C., Tardocchi, W., Taroni, M., Taylor, L., Taylor, D., Tegnered, K. A., Telesca, D., Teplova, G., Terranova, N., David, Testa, Tholerus, D., Thomas, E., Thomas, J., Thomas, J. D., Thompson, P., Thompson, A., Thompson, C. A., Thorne, V. K., Thornton, L., Thrysã¸e, A., Tigwell, A. S., Tipton, P. A., Tiseanu, N., Tojo, I., Tokitani, H., Tolias, M., Tomeå¡, P., Tonner, M., Towndrow, P., Trimble, M., Tripsky, P., Tsalas, M., Tsavalas, M., Tskhakaya, Jun, Turner, D., Turner, I., Turnyanskiy, M. M., Tvalashvili, M., Tyrrell, G., Uccello, S. G. J., Abidin, Ul, Uljanovs, Z., Ulyatt, J., Urano, D., Uytdenhouwen, H., Vadgama, I., Valcarcel, A. P., Valentinuzzi, D., Valisa, M., Vallejos, Olivares, Valovic, P., Van De Mortel, Van, Eester, Van, Renterghem, Van, Rooij, Varje, G. J., Varoutis, J., Vartanian, S., Vasava, S., Vasilopoulou, K., Vega, T., Verdoolaege, J., Verhoeven, G., Verona, R., Verona, Rinati, Veshchev, G., Vianello, E., Vicente, N., Viezzer, J., Villari, E., Villone, S., Vincenzi, F., Pietro, Vinyar, Viola, I., Vitins, B., Vizvary, A., Vlad, Z., Voitsekhovitch, M., Vondrã¡äek, I., Vora, P., Vu, N., Pires De Sa, Wakeling, W. W., Waldon, B., Walkden, C. W. F., Walker, N., Walker, M., Walsh, R., Wang, M., Wang, E., Warder, N., Warren, S., Waterhouse, R. J., Watkins, J., Watts, N. W., Wauters, C., Weckmann, T., Weiland, A., Weisen, J., Weiszflog, H., Wellstood, M., West, C., Wheatley, A. T., Whetham, M. R., Whitehead, S., Whitehead, A. M., Widdowson, B. D., Wiesen, A. M., Wilkinson, S., Williams, J., Wilson, M., Wilson, A. R., Wilson, D. J., Wilson, H. R., Wischmeier, J., Withenshaw, M., Withycombe, G., Witts, A., Wood, D. M., Wood, D., Woodley, R., Wray, C., Wright, S., Wright, J., J. C., Wu, Wukitch, J., Wynn, S., Xu, A., Yadikin, T., Yanling, D., Yao, W., Yavorskij, L., Yoo, V., Young, M. G., Young, C., Young, D., Young, I. D., Zacks, R., Zagorski, J., Zaitsev, R., Zanino, F. S., Zarins, R., Zastrow, A., Zerbini, K. D., Zhang, M., Zhou, W., Zilli, Y., Zoita, E., Zoletnik, V., Zychor, S., I, and JET Contributors
- Subjects
Nuclear and High Energy Physics ,Jet (fluid) ,Hydrogen ,Plasma parameters ,JET ITER-like wall ,Divertor ,Nuclear engineering ,chemistry.chemical_element ,Condensed Matter Physics ,01 natural sciences ,fuel retention ,010305 fluids & plasmas ,material migration ,chemistry ,Sputtering ,visual_art ,0103 physical sciences ,visual_art.visual_art_medium ,Environmental science ,Tile ,010306 general physics - Abstract
Post mortem analyses of JET ITER-Like-Wall tiles and passive diagnostics have been completed after each of the first two campaigns (ILW-1 and ILW-2). They show that the global fuel inventory is still dominated by co-deposition; hence plasma parameters and sputtering processes affecting material migration influence the distribution of retained fuel. In particular, differences between results from the two campaigns may be attributed to a greater proportion of pulses run with strike points in the divertor corners, and having about 300 discharges in hydrogen at the end of ILW-2. Recessed and remote areas can contribute to fuel retention due to the larger areas involved, e.g. recessed main chamber walls, gaps in castellated Be main chamber tiles and material migration to remote divertor areas. The fuel retention and material migration due to the bulk W Tile 5 during ILW-1 are presented. Overall these tiles account for only a small percentage of the global accountancy for ILW-1.
- Published
- 2017
23. Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice.
- Author
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Vieira, E. M. F., Martín-Sánchez, J., Rolo, A. G., Parisini, A., Buljan, M., Capan, I., Alves, E., Barradas, N. P., Conde, O., Bernstorff, S., Chahboun, A., Levichev, S., and Gomes, M. J. M.
- Subjects
MAGNETRON sputtering ,PHYSICAL vapor deposition ,SPUTTERING (Physics) ,NANOCRYSTALS ,RAMAN spectroscopy - Abstract
In this work, SiGe/SiO2 multi-layer (ML) films with layer thickness in the range of a few nanometers were successfully fabricated by conventional RF-magnetron sputtering at 350 °C. The influence of the annealing treatment on SiGe nanocrystals (NCs) formation and crystalline properties were investigated by Raman spectroscopy and grazing incidence x-ray diffraction. At the annealing temperature of 800 °C, where well defined SiGe NCs were observed, a thorough structural investigation of the whole ML structure has been undertaken by Rutherford backscattering spectroscopy, grazing incidence small angle x-ray scattering, high resolution transmission electron microscopy, and annular dark field scanning transmission electron microscopy. Our results show that the onset of local modifications to the ML composition takes place at this temperature for annealing times of the order of a few tens of minutes with the formation of defective regions in the upper portion of the ML structure. Only the very first layers over the Si substrate appear immune to this problem. This finding has been exploited for the fabrication of a defect free metal-oxide-semiconductor structure with a well-defined single layer of SiGe NCs. A memory effect attributed to the presence of the SiGe NCs has been demonstrated by high frequency capacitance-voltage measurements. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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24. In situ study of the growth properties of Ni-rare earth silicides for interlayer and alloy systems on Si(100).
- Author
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Demeulemeester, J., Knaepen, W., Smeets, D., Schrauwen, A., Comrie, C. M., Barradas, N. P., Vieira, A., Detavernier, C., Temst, K., and Vantomme, A.
- Subjects
RARE earth metals ,SILICON compounds ,BACKSCATTERING ,ERBIUM ,ALLOYS - Abstract
We report on the solid-phase reaction of thin Ni-rare earth films on a Si(100) substrate, for a variety of rare earth (RE) elements (Y, Gd, Dy, and Er). Both interlayer (Ni/RE/
) and alloy (Ni-RE/ ) configurations were studied. The phase sequence during reaction was revealed using real-time x-ray diffraction whereas the elemental diffusion and growth kinetics were examined by real-time Rutherford backscattering spectrometry. All RE elements studied exert a similar influence on the solid phase reaction. Independent of the RE element or its initial distribution a ternary Ni2Si2RE phase forms, which ends up at the surface after NiSi growth. With respect to growth kinetics, the RE metal addition hampers the Ni diffusion process even for low concentrations of 2.5 at. %, resulting in the simultaneous growth of Ni-rich silicide and NiSi. Moreover, the formation of Ni2Si2RE during NiSi growth alters the Ni diffusion mechanism in the interlayer causing a sudden acceleration of the Ni silicide growth. Besides a significant effect on the silicide growth, we have found that adding 5 at. % Er (relative to Ni) lowers the NiSi Schottky barrier height on n-type Si(100) by approximately 0.1 eV for the interlayer and alloy configuration. [ABSTRACT FROM AUTHOR] - Published
- 2012
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- View/download PDF
25. Enhancement in the photocatalytic nature of nitrogen-doped PVD-grown titanium dioxide thin films.
- Author
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Tavares, C. J., Marques, S. M., Viseu, T., Teixeira, V., Carneiro, J. O., Alves, E., Barradas, N. P., Munnik, F., Girardeau, T., and Rivière, J.-P.
- Subjects
THIN films ,TITANIUM dioxide ,NITROGEN ,PHOTOCATALYSIS ,PHYSICAL vapor deposition - Abstract
Nitrogen-doped titanium dioxide semiconductor photocatalytic thin films have been deposited by unbalanced reactive magnetron physical vapor deposition on glass substrates for self-cleaning applications. In order to increase the photocatalytic efficiency of the titania coatings, it is important to enhance the catalysts absorption of light from the solar spectra. Bearing this fact in mind, a reduction in the titania semiconductor band-gap has been attempted by using nitrogen doping from a coreactive gas mixture of N
2 :O2 during the titanium sputtering process. Rutherford backscattering spectroscopy was used in order to assess the composition of the titania thin films, whereas heavy-ion elastic recoil detection analysis granted the evaluation of the doping level of nitrogen. X-ray photoelectron spectroscopy provided valuable information about the cation-anion binding within the semiconductor lattice. The as-deposited thin films were mostly amorphous, however, after a thermal annealing in vacuum at 500 °C the crystalline polymorph anatase and rutile phases have been developed, yielding an enhancement in the crystallinity. Spectroscopic ellipsometry experiments enabled the determination the refractive index of the thin films as a function of the wavelength, while from the optical transmittance it was possible to estimate the semiconductor indirect band-gap of these coatings, which has been proven to decrease as the N-doping increases. The photocatalytic performance of the titania films has been characterized by the degradation rate of an organic reactive dye under UV/visible irradiation. It has been found that for a certain critical limit of 1.19 at. % of nitrogen doping in the titania anatase crystalline lattice enhances the photocatalytic behavior of the thin films and it is in accordance with the observed semiconductor band-gap narrowing to 3.18 eV. By doping the titania lattice with nitrogen, the photocatalytic activity is enhanced under both UV and visible light. [ABSTRACT FROM AUTHOR]- Published
- 2009
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- View/download PDF
26. Flux effect on the ion-beam nitriding of austenitic stainless-steel AISI 304L.
- Author
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Abrasonis, G., Rivière, J. P., Templier, C., Pranevičius, L., and Barradas, N. P.
- Subjects
STAINLESS steel ,ION bombardment ,NUCLEAR reactions ,NITROGEN ,SPUTTERING (Physics) ,PHYSICAL & theoretical chemistry - Abstract
The effect of flux and Ar pretreatment during ion-beam nitriding of austenitic stainless steel is investigated. The ion energy and temperature were 1.2 keV and 400 °C, respectively, the ion current densities were 0.5, 0.67, and 0.83 mA cm
-2 . The nitrogen distribution profiles were measured using nuclear reaction analysis. The obtained nitrogen distribution profiles were analyzed by the means of the nitrided layer thickness evolution due to sputtering and diffusion and the model of trapping–detrapping. Both approaches could fit well the experimental results, however, different diffusion coefficients have to be assumed for each current density. In addition, the diffusion coefficients are higher for higher current densities. On the other hand, it is shown that the pretreatment with Ar-ion beam at nitriding temperatures produces only a thermal effect without any other influence on the following nitrogen diffusion. The results are discussed in relation with surface and temperature effects and atomic transport mechanisms. [ABSTRACT FROM AUTHOR]- Published
- 2005
- Full Text
- View/download PDF
27. Exchange bias of MnPt/CoFe films prepared by ion beam deposition.
- Author
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Rickart, M., Freitas, P. P., Trindale, I. G., Barradas, N. P., Alves, E., Salgueiro, M., Muga, N., Ventura, J., Sousa, J. B., Proudfoot, G., Pearson, D., and Davis, M.
- Subjects
CHARGE exchange ,METALLIC films ,ION bombardment ,ANTIFERROMAGNETISM ,METALS ,PHYSICS - Abstract
We report on exchange bias of Mn
100-x Ptx /Co90 Fe10 bottom-pinned bilayers prepared by ion beam deposition. The Pt content in the film was varied 6 at. % with x between 46 and 52 at. % by changing the angle of substrate relative to the target in a range of 40°. Exchange coupling for a Mn100-x Ptx (20 nm)/Co90 Fe10 (5 nm) bilayer was found to be maximum (Jex =0.34 erg/cm2 ) at a composition with x=50 at. %. Structure and magnetic properties of the bilayers deposited on Ta, Ta/Ru, and Ta/Ni81 Fe19 seed layers were studied by vibrating sample magnetometry, x-ray diffraction, Rutherford backscattering spectroscopy, and atomic force microscopy. Exchange bias and coercive field can be tuned as functions of the seed layer. The effect of different annealing conditions on exchange bias is discussed to improve thermal stability of the bilayers. Maximum exchange coupling is obtained at an annealing temperature TA >=280 °C, while the blocking temperature TB keeps increasing with annealing up to TA =420 °C. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR]- Published
- 2004
- Full Text
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28. Impurity re-distribution in the corner regions of the JET divertor
- Author
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Widdowson, A., Coad, J. P., Alves, E., Baron-Wiechec, A., Barradas, N. P., Catarino, N., Corregidor, V., Heinola, K., Krat, S., Likonen, J., Matthews, G. F., Mayer, M., Petersson, Per, Rubel, Marek, Widdowson, A., Coad, J. P., Alves, E., Baron-Wiechec, A., Barradas, N. P., Catarino, N., Corregidor, V., Heinola, K., Krat, S., Likonen, J., Matthews, G. F., Mayer, M., Petersson, Per, and Rubel, Marek
- Abstract
The International Thermonuclear Experimental Reactor (ITER) will use a mixture of deuterium (D) and tritium (T) as the fuel to generate power. Since T is both radioactive and expensive the Joint European Torus (JET) has been at the forefront of research to discover how much T is used and where it may be retained within the main reaction chamber. Until the year 2010 the JET plasma facing components were constructed of carbon fibre composites. During the JET carbon (C) phases impurities accumulated at the corners of the divertor located towards the bottom of the chamber in regions shadowed from the plasma where they are very difficult to reach and remove. This build-up of C and the associated H-isotope (including T) retention were of particular concern for future fusion reactors therefore, in 2010 JET changed the wall protection to (mainly) Be and the divertor to tungsten (W)-the JET ITER-like wall (ILW)-the choice of materials for ITER. This paper reveals that with the JET ILW impurities are still accumulating in the shadowed regions, with Be being the majority element, though the overall quantities are very much reduced from those in the C phases. Material will be transported into the shadowed regions principally when the plasma strike points are on the corner tiles, but particles typically have about a 75% probability of reflection from line-of sight surfaces, and multiple reflection/scattering results in deposition over all surfaces., QC 20180112
- Published
- 2017
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29. Corrosion Behavior of Titanium Oxynitrided by Diffusion and Magnetron Sputtering Methods in Physiological Solution
- Author
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Pohrelyuk, I. M., primary, Yaskiv, O. I., additional, Tkachuk, O. V., additional, Barradas, N. P., additional, Alves, E., additional, Vaz, F., additional, and Cunha, L., additional
- Published
- 2017
- Full Text
- View/download PDF
30. Electrical insulation properties of RF-sputtered LiPON layers towards electrochemical stability of lithium batteries
- Author
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Vieira, E M F, primary, Ribeiro, J F, additional, Silva, M M, additional, Barradas, N P, additional, Alves, E, additional, Alves, A, additional, Correia, M R, additional, and Goncalves, L M, additional
- Published
- 2016
- Full Text
- View/download PDF
31. Alpha-elastic recoil detection analysis of the energy distribution of oxygen ions implanted into silicon with plasma immersion ion implantation.
- Author
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Barradas, N. P., Maas, A. J. H., Ma¨ndl, S., and Gu¨nzel, R.
- Subjects
- *
ION implantation , *SILICON , *BACKSCATTERING - Abstract
Plasma immersion ion implantation was used to implant oxygen ions into silicon with applied voltage pulses of -40 kV and 2.5 μs length. Positive ions, O[sup +][sub 2] and O[sup +], with a continuous energy distribution between 0 and 40 keV were implanted. Between 3 x 10[sup 4] and 3 x 10[sup 5] pulses, corresponding to nominal doses from 2 x 10[sup 16] to 2 x 10[sup 17] /cm², were used. The resulting oxygen depth profiles were measured with elastic recoil detection analysis using 13.4 MeV α particles. Rutherford backscattering was used to determine possible co-implanted contaminants. The obtained depth profiles were simulated using a linear superposition of calculated single-energy profiles. The results obtained for the energy distribution of the incident ions are compared with calculations obtained from a theoretical model, and the agreement is very good. The incident flux is found to be composed of 34(5)% O[sup +][sub 2] and 66(5)% O[sup +] ions with an Fe contamination of ∼0.5%. © 1997 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Published
- 1997
- Full Text
- View/download PDF
32. Composition measurement of epitaxial ScxGa1−xN films
- Author
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Tsui, H C L, primary, Goff, L E, additional, Barradas, N P, additional, Alves, E, additional, Pereira, S, additional, Palgrave, R G, additional, Davies, R J, additional, Beere, H E, additional, Farrer, I, additional, Ritchie, D A, additional, and Moram, M A, additional
- Published
- 2016
- Full Text
- View/download PDF
33. Functional behaviour of TiO2films doped with noble metals
- Author
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Rodrigues, M. S., primary, Borges, J., additional, Gabor, C., additional, Munteanu, D., additional, Apreutesei, M., additional, Steyer, P., additional, Lopes, C., additional, Pedrosa, P., additional, Alves, E., additional, Barradas, N. P., additional, Cunha, L., additional, Martínez-Martínez, D., additional, and Vaz, F., additional
- Published
- 2016
- Full Text
- View/download PDF
34. Global erosion and deposition patterns in JET with the ITER-like wall
- Author
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Baron-Wiechec, A., Widdowson, A., Alves, E., Ayres, C. F., Barradas, N. P., Brezinsek, S., Coad, J. P., Catarino, N., Heinola, K., Likonen, J., Matthews, G. F., Mayer, M., Petersson, Per, Rubel, Marek, van Renterghem, W., Uytdenhouwen, I., Baron-Wiechec, A., Widdowson, A., Alves, E., Ayres, C. F., Barradas, N. P., Brezinsek, S., Coad, J. P., Catarino, N., Heinola, K., Likonen, J., Matthews, G. F., Mayer, M., Petersson, Per, Rubel, Marek, van Renterghem, W., and Uytdenhouwen, I.
- Abstract
A set of Be and W tiles removed after the first ITER-like wall campaigns (JET-ILW) from 2011 to 2012 has been analysed. The results indicate that the primary erosion site is in the main chamber (Be) as in previous carbon campaigns (JET-C). In particular the limiters tiles near the mid-plane are eroded probably during the limiter phases of discharges. W is found at low concentrations on all plasma-facing surfaces of the vessel indicating deposition via plasma transport initially from the W divertor and from main chamber W-coated tiles; there are also traces of Mo (used as an interlayer for these coatings). Deposited films in the inner divertor have a layered structure, and every layer is dominated by Be with some W and O content., QC 20150901
- Published
- 2015
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35. Effect of free layer thickness and shape anisotropy on the transfer curves of MgO magnetic tunnel junctions.
- Author
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Wisniowski, P., Almeida, J. M., Cardoso, S., Barradas, N. P., and Freitas, P. P.
- Abstract
A study of the combined effect of CoFeB free layer thickness, shape anisotropy, and annealing temperature on the transfer curves of MgO based magnetic tunnel junctions is presented. The response of the free layer changes gradually as its thickness decreases and shows hysteresis-free response for CoFeB<=15.5 Å. For junctions with CoFeB=15.5 Å, the onset of hysteresis-free response depends on junction area and annealing temperature. Linearized magnetic tunnel junctions with dimensions down to 1.5×3 μm
2 and sensitivity as high as 7.7%/Oe were achieved. [ABSTRACT FROM AUTHOR]- Published
- 2008
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- View/download PDF
36. Electrical and photocatalytic behaviour of TAOxNy magnetron sputtered thin solid films
- Author
-
Cristea, D., Crisan, A., Barradas, N. P., Alves, E., Costa, P., Lanceros-Méndez, S., Cunha, L., and Universidade do Minho
- Subjects
Science & Technology ,Tantalum oxynitride ,Thin films ,Sputtering - Abstract
Tantalum oxynitride thin films were deposited by reactive magnetron sputtering in a N2+O2 (85%+15%) atmosphere, with increasing total reactive gas flows. The chemical composition was determined by RBS and the structural development by XRD. The electrical resistivity was measured using the 2-point and 4-point probe techniques. The photocatalytic behavior was determined on glass samples in UV, using methylene-blue as a pollutant. It was observed that, depending on the deposition process parameters, the samples can be divided into 4 zones, each with a characteristic structure and subsequent behavior. The samples from zone I can be attributed to the β-Ta phase, metallic, conductive. The samples from zone II can be attributed to a fcc Ta(O, N) structure, with N/Ta higher than O/Ta, with increasing electrical resistivity. The samples from zone III are oxide-like, amorphous, electrically insulating., FEDER through the COMPETE Program and by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Strategic Project PEST-C/FIS/UI607/2011, Sectoral Operation Programme Human Resources Development (SOP HRD), ID76945 financed from the European Social Fund and by the Romanian Government.
- Published
- 2013
37. The role of composition, structure and morphology on the electrical, optical and electrochemical responses of AlNxOy films
- Author
-
Borges, Joel Nuno Pinto, Martin, N., Barradas, N. P., Alves, E., Eyidi, D., Girardeau, T., Fonseca, C., Vaz, F., Marques, L., Departamento de Física [Minho] (DFUM), Universidade do Minho, Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS), Instituto Superior Técnico, Universidade Técnica de Lisboa, Institut Pprime (PPRIME), ENSMA-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers, Departamento de Engenharia Electrotécnica e de Computadores [Porto] (DEEC), Universidade do Porto, and Pyon, Sandrine
- Subjects
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics - Abstract
Metallic (Me) oxynitrides (MeNxOy) are an attractive class of materials due to a unique set of versatile properties in different technological domains such as protective applications (wear, diffusion and corrosion-resistance), decorative coatings, gas barriers, microelectronics, optoelectronics, solar cells, etc. Among the group of oxynitrides, aluminium oxynitride (AlNxOy) presents some interesting characteristics to be used in different technological fields, since it may combine the behaviour of metallic aluminium, and those of the base binary systems: aluminium nitride, known for its semiconducting and piezoelectric properties and aluminium oxide, for its protective and insulating performances. In this work, thin films of AlNxOy were prepared by reactive DC magnetron sputtering, using a pure Al target and an Ar/(N2,O2) gas mixture. The overall set of results suggests the formation of a nanocomposite-like material for some stoichiometries, with Al nanoparticles embedded in an AlNxOy matrix, forming a percolating network. This particular microstructure induced a wide variation in electrical properties [1], such as a gradual transition from positive to negative temperature coefficients of resistance (TCR) as the (N+O)/Al atomic ratio increases; as well as distinct optical responses [2], such as an unusual low and constant optical reflectance nearly independent of the wavelength (250 – 2500 nm), which opens the possibility of using the AlNxOy films in different applications, either in electrical or optical-based devices. The films were also tested in terms of electrochemical and corrosion behaviour, focusing this study on the influence of the immersion in NaCl solutions, which simulate the effect of sweat, on the electrochemical and optical performance of the coatings. Results showed that the films electrochemical and optical responses are very stable, even when immersed for several weeks., Fundação para a Ciência e a Tecnologia (FCT)
- Published
- 2013
38. Characterization of CoFeB electrodes for tunnel junctions.
- Author
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Cardoso, S., Cavaco, C., Ferreira, R., Pereira, L., Rickart, M., Freitas, P. P., Franco, N., Gouveia, J., and Barradas, N. P.
- Abstract
This paper compares structural and magnetic properties of CoFeB thin films and tunnel junction electrodes, with a boron content of 10 at % (CFB
10 ) and 20 at % (CFB20 ). X-ray diffraction of 20-60 Å thick CoFeB films indicates amorphous structure in the as-deposited state, independent of the B content. The CFB10 films develop a strong (111) texture after annealing at 280 °C, while CFB20 films require annealing at 320 °C. However, films with either composition can remain amorphous upon anneal, if thinner than 40 Å. The crystallization temperature was corroborated by analysis of exchange bias and coercive fields. Tunnel junctions based on CFB10 and CFB20 were fabricated by ion beam and magnetron sputtering, respectively, and patterned down to 132 mm2 . From magnetic measurements, bottom-pinned MnIr/CFB10 or MnIr/CFB20 junctions have similar exchange fields upon anneal. For top-pinned structures, week exchange is obtained using CFB20 /MnIr. Synthetic antiferromagnets (CFB/Ru/CFB) were also studied. Antiferromagnetic coupling sAFd can be produced with 6-8 Å thick Ru spacers in glass/CFB10 /Ru/CFB10 multilayers, while CFB20 /Ru/CFB20 amorphous structures are only weekly AF coupled. CFB10 -based junctions can sustain annealing up to 360 °C without degradation of the magnetic properties of the CFB electrodes and ferromagnetic coupling fields (Hf), while maintaining TMR values of 30%. [ABSTRACT FROM AUTHOR]- Published
- 2005
- Full Text
- View/download PDF
39. Effect of natural oxidation conditions on low resistance spin tunnel junctions.
- Author
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Zhang, Z. G., Freitas, P. P., Ramos, A. R., Barradas, N. P., and Soares, J. C.
- Subjects
OXIDATION ,THICK films - Abstract
Spin dependent tunnel junctions with AlO[sub χ] barrier were fabricated by in situ natural oxidation of a 7 Å (or 8 Å) thick A1 film. Junctions were deposited on top of preannealed, ion-beam smoothed, 600 Å thick Al bottom electrodes. By changing the oxidation time from 10 min to 10 h with the oxygen pressure of 10 and 100 Torr, the top-pinned junctions have resistances varying from 31 to 406 Ω µm² and the tunneling magnetoresistance (TMR) varies from 8.5% to 19.6% for the as deposited state. For the bottom-pinned junctions, the oxygen pressure was varied from 0.5 to 100 Torr, and oxidation time ranged from 5 min to 2 h. Bottom-pinned junction resistances as low as 10-12 Ω µm² were obtained with TMR ranging from 14% to 17% for the junctions oxidized at the lower pressure (0.5 Torr). Rutherford backscattering analysis (RBS) indicates an O/A1 ratio of 1.29±0.34 denoting incomplete oxidation of the A1 for junctions oxidized at the lower pressures and short times. Junctions oxidized at higher pressures (≥ 10 Torr) can reach 25%-30% TMR, with resistances ranging from 30 to 70 Ω µm². RBS shows near stoichiometric A1[sub 2]O[sub 3] oxide composition (O/Al= 1.51 ± 0.43) in these barriers. [ABSTRACT FROM AUTHOR]
- Published
- 2002
- Full Text
- View/download PDF
40. Tunnel junctions with AlN barriers and FeTaN electrodes.
- Author
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Wang, Jianguo, Cardoso, S., Freitas, P. P., Wei, P., Barradas, N. P., and Soares, J. C.
- Subjects
QUANTUM tunneling ,IRON electrodes - Abstract
Tunnel junctions with AlN (AlNxOy) barriers and CoFe and FeTaN electrodes were studied. The AlN barrier was formed by nitridizing a 10 Å thick Al layer using radio frequency N[sub 2] plasma. The nitrogen and oxygen content in the barriers was determined by Rutherford backscattering spectroscopy (RBS) on specially prepared barriers deposited on DLC coated substrates. RBS results indicate less than 10% O[sub 2] incorporation in the barrier. Top-pinned junctions formed by nitridizing a 10 Å thick Al layer (CoFe electrodes) show resistancexarea products from 73 Ω μm[sup 2] to 8.5 kΩ μm[sup 2] for increasing nitridation times from 30 to 200 s, with corresponding tunneling magnetoresistance (TMR) values from 13% to 33%. Bottom-pinned junctions with FeTaN electrodes were also fabricated. Maximum TMR signal is 17% after anneal at 225 °C for 30 min. In both cases (CoFe or FeTaN electrodes), TMR degrades for anneals above 250 °C. © 2001 ! American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Published
- 2001
- Full Text
- View/download PDF
41. Electrical and optical properties of AlNxOy thin films prepared by reactive DC magnetron sputtering
- Author
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Borges, Joel Nuno Pinto, Martin, N., Alves, E., Barradas, N. P., Vaz, F., Marques, L., and Universidade do Minho
- Subjects
stomatognathic diseases - Abstract
Resumo e comunicação oral, The addition of oxygen and nitrogen to a growing Al film can give rise to an oxynitride (AlNxOy) film with a wide range of different properties, that can be tailored between those of the pure Al and those of AlNx and AlOy, In this work, a set of films of AlNxOy and two sets of the binary systems, AlNx and AlOy, were produced using reactive DC magnetron sputtering. The discharge characteristics, composition, structure, electrical and optical properties were studied, in order to test whether the oxynitride films have an unique behaviour or are simply a transition between AlNx and AlOy., This research is partially sponsored by FEDER funds through the program COMPETE-Programa Operacional Factores de Competitividade and by national funds through FCT-Fundação para a Ciência e a Tecnologia, under the projects PTDC/CTM-NAN/112574/2009 and PEst-C-FIS/UI607/2011-2012. One of us (J. Borges) is also indebted to FCT for financial support under PhD grant Nº SFRH/BD/47118/2008 (financiada por POPH - QREN - Tipologia 4.1 - Formação Avançada, comparticipado pelo Fundo Social Europeu e por fundos nacionais do MCTES).
- Published
- 2012
42. Surface plasmon resonance effect on the optical properties of TiO2 doped by noble metals nanoparticles
- Author
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Torrell, M., Adochite, R. C., Cunha, L., Barradas, N. P., Alves, E., Beaufort, M. F., Rivière, J. P., Cavaleiro, A., Dosta, S., Vaz, F., and Universidade do Minho
- Subjects
Physical vapour deposition ,Science & Technology ,Ciências Naturais::Ciências Físicas ,Surface Plasmon Resonance ,Magnetron sputtering ,Nanocomposites - Abstract
Nanocomposite thin films composed of a TiO2 matrix doped with noble metals nanoparticles (MNPS), Au and Ag, were deposited on Si (100) and glass substrates by dc magnetron sputtering. The samples were annealed in a protective atmosphere at temperatures ranging from 200 to 700 ºC. The main goal of this work is to characterize and compare the Surface Plasmon Resonance (SPR) behaviour in both systems. The studies have been focused on the growth of the nanoclusters and on their role on the optical properties of the films. Size, shape and distribution of the nanoclusters embedded on the titanium oxide dielectric matrix are reported as key factors on the SPR behaviour in both systems (Au:TiO2 and Ag:TiO2). The MNPs grew due to diffusion mechanisms, which were led by the annealing treatments, even at the highest annealing temperatures. Evidences of the correlation between the nanocomposite film structural changes and the evolution of the optical properties due to the SPR activity are reported. The SPR phenomenon manifests itself as a wide band on the visible range on the absorption spectra, and it is confirmed by an important change on the surface colour tones of the samples., This research is sponsored by FEDER funds through the program COMPETE - Programa Operacional Factores de Competitividade and by national funds through FCT - Fundação para a Ciência e a Tecnologia, under the project PTDC/CTM/ 70037/2006 70037/20B and also UB-SCT (Barcelona) for the TEM characterization.
- Published
- 2012
43. Controlling the properties of layered self-organized Ge clusters in silica matrix
- Author
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Pinto, S. R. C., Roldan, M. A., Buljan, Maja, Bernstorff, S., Chahboun, A., Barradas, N. P., Alves, E., Molina, S. I., Ramos, Marta M. D., Gomes, M. J. M., Varela, M., Pennycook, S. J., and Universidade do Minho
- Subjects
ComputingMilieux_GENERAL ,Hardware_INTEGRATEDCIRCUITS ,Hardware_PERFORMANCEANDRELIABILITY ,Hardware_REGISTER-TRANSFER-LEVELIMPLEMENTATION - Abstract
Comunicação em poster no simposio M - More than Moore: Novel materials approaches for functionalized Silicon based Microelectronics, Si and Ge nanocrystals (NCs) embedded in a dielectric matrix, such as SiO2, have attracted great interest for many relevant technological applications. There are many studies about Ge NCs embedded in single layer of SiO2 [1]. However, there are only a few published results about Ge NCs embedded in SiO2 multilayer [2]. Using a multilayered superlattice approach one can achieve a higher density and more uniform size and spatial distributions of NCs, which is very important for the collective behavior effects. In this work we investigate the structural properties of Ge quantum dot (QD) lattices formed in amorphous silica matrix by magnetron sputtering deposition of (Ge+SiO2)/SiO2 multilayer. We demonstrate the dependencies of QD shape, size, separation and spatial arrangement type on Ge-rich (Ge+SiO2) layer thickness. We show that the formed QDs are elongated in direction perpendicular to the multilayer surface (vertical direction). The vertical size of the QDs and their separation in the vertical direction can be tuned by changing the Ge-rich layer thickness. The mean values of the QDs lateral size of their lateral separation are not affected by the thickness of the Ge-rich layer. However, the thickness of Ge-rich layer significantly affects the regularity in QD ordering. In addition, we investigate the dependence of the multilayer atomic composition and QD inner crystalline structure on the deposition parameters, which are important for future device applications. [1] S. Takeoka, K. Toshikio, M. Fujii, S. Hayashi, and K. Yamamoto, Phys. Rev. B 61, 15988 (2000) [2] F. Gao, M. A. Green, G. Conibeer, E. C. Cho, Y. D. Yang, I. Pere-Wurfl, and C. Flynn, Nanotechnology 19, 455611 (2008)
- Published
- 2012
44. Incorporation of N in TiO2 films grown by DC-reactive magnetron sputtering
- Author
-
Sério, S., Melo Jorge, M. E., Nunes, Y., Barradas, N. P., Alves, E., and Munnik, F.
- Subjects
Ion beam analysis ,Sputtering ,N-doping TiO2 ,Band gap tuning - Abstract
Photocatalytic properties of TiO2 are expected to play an important role on emerging technologies based on OH radicals to destroy harmful nonbiodegradable organic and inorganic contaminants in water. The drawback is the wide band gap of TiO2 (3.2 eV) limiting its use to the UV part of electromagnetic spectrum under sunlight. Therefore, modifications of TiO2 are needed to tune the gap in order to allow an efficient use of the entire solar spectrum. One possibility is N-doping of TiO2 to make the photocatalytic activity possible under visible light and more suitable for water treatment. In our study nitrogen-doped TiO2 (TiO2-xNx) films were deposited by DC-reactive magnetron sputtering using a dual-magnetron co-deposition apparatus on unheated glass and silicon substrates using a pure titanium target. The depth profile of nitrogen was measured with heavy ion elastic recoil detection analysis combined with Rutherford backscattering spectrometry (RBS) and correlated with the optical and structural properties obtained by UV–VIS spectroscopy and X-ray diffraction (XRD).
- Published
- 2012
45. Structural and optical properties of Ag: TiO2 nanocomposite films prepared by magnetron sputtering
- Author
-
Adochite, R., Torrell, M., Cunha, L., Alves, E., Barradas, N. P., Cavaleiro, A., Rivière, J. P., Eyidi, D., Vaz, F., and Universidade do Minho
- Subjects
Silver ,Science & Technology ,Optical properties ,Decorative thin films ,Surface plasmon resonance ,TiO2 ,Magnetron sputtering - Abstract
Three sets of nanocomposite films consisting of different atomic concentrations of Ag dispersed in a TiO2 dielectric matrix were deposited by DC reactive magnetron sputtering, and subjected to several thermal annealing experiments in vacuum, for temperatures ranging from 200 to 600 ºC. The main goal of the present study is to analyse the optical properties of the as-deposited and annealed films in order to clarify the role of Ag inclusions in the TiO2 dielectric matrix. The influence of the thermal annealing in the structural and morphological evolution was then correlated with the changes in the optical behavior of the samples. Significant structural and morphological changes were observed, consisting on the crystallization of Ag and their clustering. Clusters growth as a function of temperature was also observed by the evolution of the diffractograms with the temperature increase. The present study allowed to conclude that at certain concentrations (close to 10 at. %), the films revealed some important changes on the optical properties, commonly known as Surface Plasmon Resonance, SPR. This change in the optical behavior of the films was found to be in accordance with the clusters growth as concluded from the evolution of the diffraction patterns. The optical changes, and the correspondent Surface Plasmon Resonance effect were confirmed by reflectivity and CIELab colour measurements. The samples with lower Ag content (11 at. % and 7 at. %) show typical interferometric behavior on the reflectivity curves, similar to those of “pure” TiO2 samples. After a minimum of reflectance at 300 nm, there was an increase of the reflectivity at higher wavelengths. For the samples annealed between 400 and 600 °C, a red-shift centered at around 500-550 nm is visible in the absorbance spectrum., Fundação para a Ciência e a Tecnologia (FCT) - PTDC/CTM/ 70037/2006.
- Published
- 2011
46. The effect of metal-rich growth conditions on the microstructure of Sc x Ga1−x N films grown using molecular beam epitaxy
- Author
-
Tsui, H. C. L., primary, Goff, L. E., additional, Barradas, N. P., additional, Alves, E., additional, Pereira, S., additional, Beere, H. E., additional, Farrer, I., additional, Nicoll, C. A., additional, Ritchie, D. A., additional, and Moram, M. A., additional
- Published
- 2015
- Full Text
- View/download PDF
47. Al1-xInxN/GaN bilayers: structure, morphology and optical properties
- Author
-
Lorenz, K., Magalhães, S., Franco, N., Darakchieva, V., Barradas, N. P., Alves, E., Pereira, S., Correia, M. R., Munnik, F., Martin, R. W., ODonnell, K. P., and Watson, I. M.
- Abstract
High quality Al1-xInxN/GaN bilayers, grown by Metal Organic Chemical Vapour Deposition (MOCVD), were characterized using structural and optical techniques. Compositional analysis was performed using Rutherford Backscattering Spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA). The InN molar fraction x decreased approximately linearly with increasing growth temperature and ranged from x=0.13 to 0.24. Up to x=0.20 the layers grow pseudomorphically to GaN with good crystalline quality. These layers show a smooth surface with V-shaped pits. Two layers with InN contents around 24% showed partial strain relaxation. However, the mechanisms leading to relaxation of compressive strain are very different in the two samples grown both at low temperature but with different growth rate. One sample shows a decreased c/a ratio, as expected for relaxation of the compressive strain, while In was shown to be homogeneously distributed with depth. Another sample started to grow with x=0.24 but relaxed mainly by reduction of the incorporated InN content towards the lattice-match composition of x~0.17. Both samples have an increased surface roughness. All samples show strong Al1-xInxN band edge luminescence with large bowing parameter and Stokes shifts.
- Published
- 2010
48. Surface analysis of tiles and samples exposed to the first JET campaigns with the ITER-like wall
- Author
-
Coad, J. P., Alves, E., Barradas, N. P., Baron-Wiechec, A., Catarino, N., Heinola, K., Likonen, J., Mayer, M., Matthews, G. F., Petersson, Per, Widdowson, A., Coad, J. P., Alves, E., Barradas, N. P., Baron-Wiechec, A., Catarino, N., Heinola, K., Likonen, J., Mayer, M., Matthews, G. F., Petersson, Per, and Widdowson, A.
- Abstract
This paper reports on the first post-mortem analyses of tiles removed from JET after the first campaigns with the ITER-like wall (ILW) during 2011-12 [1]. Tiles from the divertor have been analysed by ion beam analysis techniques and by secondary ion mass spectrometry to determine the amount of beryllium deposition and deuterium retention in the tiles exposed to the scrape-off layer. Films 10-20 mu m thick were present at the top of tile 1, but only very thin films (<1 mu m) were found in the shadowed areas and on other divertor tiles. The total amount of Be found in the divertor following the ILW campaign was a factor of similar to 9 less than the material deposited in the 2007-09 carbon campaign, after allowing for the longer operations in 2007-09., QC 20140602
- Published
- 2014
- Full Text
- View/download PDF
49. IBA study of SiGe/SiO2 nanostructured multilayers
- Author
-
Barradas, N. P., Alves, E., Vieira, E. M. F., Parisini, A., Conde, O., Martín-Sánchez, Javier, Rolo, A. G., Chahboun, A., Gomes, M. J. M., Barradas, N. P., Alves, E., Vieira, E. M. F., Parisini, A., Conde, O., Martín-Sánchez, Javier, Rolo, A. G., Chahboun, A., and Gomes, M. J. M.
- Abstract
SiGe/SiO2 multilayers with layer thickness of 5 nm were deposited with RF magnetron sputtering. The as deposited samples had well defined SiGe amorphous layers. Different annealing treatments were made to promote the formation of SiGe nanocrystals. We report an ion beam analysis study with the Rutherford backscattering and elastic recoil analysis detection techniques, in order to determine the thickness and composition of the nanolayers, and gain insight into the evolution of the roughness of the layers. The results are correlated with other structural properties of the samples, as measured with complementary techniques such as grazing incidence X-ray diffraction annular dark field scanning transmission electron microscopy and high resolution transmission electron microscopy. © 2014 Elsevier B.V. All rights reserved.
- Published
- 2014
50. Optical performance of thin films produced by the pulsed laser deposition of SiAlON and Er targets
- Author
-
Ministerio de Economía y Competitividad (España), Consejo Superior de Investigaciones Científicas (España), Generalitat de Catalunya, Camps, I., Ramírez, J. M., Mariscal, A., Serna, Rosalía, Garrido, B., Peralvarez, M., Carreras, J., Barradas, N. P., Alves, L. C., Alves, E., Ministerio de Economía y Competitividad (España), Consejo Superior de Investigaciones Científicas (España), Generalitat de Catalunya, Camps, I., Ramírez, J. M., Mariscal, A., Serna, Rosalía, Garrido, B., Peralvarez, M., Carreras, J., Barradas, N. P., Alves, L. C., and Alves, E.
- Abstract
We report the preparation and optical performance of thin films produced by pulsed laser deposition in vacuum at room temperature, by focusing an ArF excimer laser onto two separate targets: a commercial ceramic SiAlON and a metallic Er target. As a result of the alternate deposition Er:SiAlON films were formed. The as grown films exhibited an Er-related emission peaking at 1532 nm. The role of the PLD energy density during deposition on the final matrix film was investigated, in order to achieve an optimized matrix composition with enhanced optical properties, and its effect on the light emission performance. © 2014 Elsevier B.V. All rights reserved.
- Published
- 2014
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