1. Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope
- Author
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D. E. Steinhauer, Robert B. Hammond, B. J. Feenstra, Frederick C. Wellstood, S. K. Dutta, Steven M. Anlage, Wensheng Hu, and Ashfaq S. Thanawalla
- Subjects
Microscope ,Materials science ,FOS: Physical sciences ,Near and far field ,02 engineering and technology ,01 natural sciences ,law.invention ,Superconductivity (cond-mat.supr-con) ,Coaxial probe ,Optics ,law ,Electric field ,0103 physical sciences ,Electrical and Electronic Engineering ,010302 applied physics ,Superconductivity ,Range (particle radiation) ,Condensed matter physics ,business.industry ,Condensed Matter - Superconductivity ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,Conductor ,0210 nano-technology ,business ,Microwave - Abstract
We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device., 4 pages, postscript file with 6 figures conference proceeding for the Applied Superconductivity Conference 1998
- Published
- 1999
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