1. Correlation between bulk material defects and spectroscopic response in cadmium zinc telluride detectors
- Author
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Scott Barthelmy, Carl Michael Stahle, B. F. Munoz, Steve Snodgrass, Jack Tueller, Bradford H. Parker, J. T. VanSant, A. M. Parsons, and R. E. Mullinix
- Subjects
Yield (engineering) ,Materials science ,Physics::Instrumentation and Detectors ,business.industry ,Infrared ,Detector ,chemistry.chemical_element ,Zinc ,Cadmium zinc telluride ,chemistry.chemical_compound ,Planar ,chemistry ,Optoelectronics ,Wafer ,business ,Spectroscopy - Abstract
One of the critical challenges for large area cadmium zinc telluride (CdZnTe) detector arrays is obtaining material capable of uniform imaging and spectroscopic response. Two complementary nondestructive techniques for characterizing bulk CdZnTe have been developed to identify material with a uniform response. The first technique, infrared transmission imaging, allows for rapid visualization of bulk defects. The second technique, x-ray spectral mapping, provides a map of the material spectroscopic response when it is configured as a planar detector. The two techniques have been used to develop a correlation between bulk defect type and detector performance. The correlation allows for the use of infrared imaging to rapidly develop wafer mining maps. The mining of material free of detrimental defects has the potential to dramatically increase the yield and quality of large area CdZnTe detector arrays.
- Published
- 1999