47 results on '"Audoit G"'
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2. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives
3. Formation mechanism and properties of twinned structures in (111) seeded directionally solidified solar grade silicon
4. Improvement of performances HfO2-based RRAM from elementary cell to 16 kb demonstrator by introduction of thin layer of Al2O3
5. Chemical characterization of III–V heterostructures in 3D architecture
6. Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEM
7. 3D analysis of advanced nano-devices using electron and atom probe tomography
8. Comparative experimental study of junctionless and inversion mode nanowire transistors for analog applications
9. Poster: Memristive Systems
10. Comparative experimental study of junctionless and inversion-mode nanowire transistors for analog applications
11. All-Operation-Regime Characterization and Modeling of Drain Current Variability in Junctionless and Inversion-Mode FDSOI Transistors
12. OxRAM for embedded solutions on advanced node: scaling perspectives considering statistical reliability and design constraints
13. Investigation of switching mechanism in HfO2-based oxide resistive memories by in-situ Transmission Electron Microscopy (TEM) and Electron Energy Loss Spectroscopy (EELS)
14. Tunability of Parasitic Channel in Gate-All-Around Stacked Nanosheets
15. Strain, stress, and mechanical relaxation in fin-patterned Si/SiGe multilayers for sub-7 nm nanosheet gate-all-around device technology
16. Investigation of Switching Mechanism in HfO2-Based Oxide Resistive Memories by In-Situ Transmission Electron Microscopy and Electron Energy Loss Spectroscopy
17. OxRAM integration above FDSOI transistor drain: Integration approach and process impact on electrical characteristics
18. Chemical depth profiling and 3D reconstruction of III-V heterostructures selectively grown on non-planar Si substrates by MOCVD
19. Vertically stacked-NanoWires MOSFETs in a replacement metal gate process with inner spacer and SiGe source/drain
20. Improvement of performances HfO 2 -based RRAM from elementary cell to 16 kb demonstrator by introduction of thin layer of Al 2 O 3
21. Plasma-FIB Sample Preparation for X-Ray Tomography of 3D-IC Interconnects
22. 3D correlative morphological and elemental characterization of materials at the deep submicrometre scale
23. Benefit of Al2O3/HfO2 bilayer for BEOL RRAM integration through 16kb memory cut characterization
24. High performance low temperature activated devices and optimization guidelines for 3D VLSI integration of FD, TriGate, FinFET on insulator
25. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques
26. Direct Bonding Mechanism of ALD-Al2O3Thin Films
27. Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera
28. Synchrotron radiation-based characterization of interconnections in microelectronics: recent 3D results
29. SEM-based system for 100nm x-ray tomography for the analysis of porous silicon
30. Reduction of the scanning time by total variation minimization reconstruction for X‐ray tomography in a SEM
31. Fast and easy sample preparation with reduced curtaining artifacts using a P-FIB
32. Optimizing Sampling Schemes for Electron Tomography: Dual- and Multiple-Axis Tomography
33. Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices
34. Specifications for Hard Condensed Matter Specimens for Three-Dimensional High-Resolution Tomographies
35. Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structures
36. Ultra high density three dimensional capacitors based on Si nanowires array grown on a metal layer
37. Four-dimensional spectral low-loss energy-filtered transmission electron tomography of silicon nanowire-based capacitors
38. Direct Bonding Mechanism of ALD-Al2O3 Thin Films.
39. Micro-Raman analysis of quantum confined crystalline germanium nanowire arrays
40. Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structures.
41. SEM-based system for 100nm x-ray tomography for the analysis of porous silicon
42. Synchrotron radiation-based characterization of interconnections in microelectronics: recent 3D results
43. Fabrication of an interposer with FIB-etched nanovias for molecular electronics
44. A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography.
45. Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.
46. Self-adapting denoising, alignment and reconstruction in electron tomography in materials science.
47. The synthesis and characterisation of ferromagnetic CaMn2O4 nanowires.
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