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3 results on '"Assembly monolayer process"'

1. Development of an in-fiber nanocavity towards detection of volatile organic gases

Author

Ignacio R. Matias, Candido Bariain, Cesar Elosua, Francisco J. Arregui, Universidad Pública de Navarra. Departamento de Ingeniería Eléctrica y Electrónica, and Nafarroako Unibertsitate Publikoa. Ingeniaritza Elektriko eta Elektronikoa Saila more...

Subjects
Identification, Optical fiber, Materials science, Assembly monolayer process, Vapochromic complex, Dioxide, Nanotechnology, lcsh:Chemical technology, Biochemistry, Signal, Full Research Paper, Electronic nose, Analytical Chemistry, law.invention, Electrostatic Self Assembly method, Complexes, law, Volatile Organic Compound, Fiber optic sensors, Nano, nanocavity, Volatile organic compound, lcsh:TP1-1185, Fiber, Electrical and Electronic Engineering, Instrumentation, chemistry.chemical_classification, Array, Humidity sensor, Fiber optic sensor, Atomic and Molecular Physics, and Optics, Nanocavity, chemistry, Fabry Perot interferometer, Electrostatic self assembly method, Fabry–Pérot interferometer
Abstract

A fiber optic sensor for Volatile Organic Compounds (VOCs) detection has been developed and characterized for some organic gasses. The sensor is based on a novel vapochromic material, which is able to change its optical properties in presence of organic vapors in a reversely way. A nano Fabry Perot is constructed onto a cleaved ended optical fiber pigtail by Electrostatic Self Assembly method (ESA), doping this structure with the vapochromic material. Employing a reflection scheme, a change in the intensity modulated reflected signal at 850 nm have been registered. The response of the sensor has been evaluated for five different VOCs, and a deeper study has been made for vapors of three different alcohols. This work was supported by Spanish Ministerio de Ciencia y Tecnología and FEDER Research Grants CICYT-TIC 2003-000909 and CICYT-TEC 2004-05936-C02-01/MIC. more...

Published
2006

2. Analysis of one-dimensional photonic band gap structures with a liquid crystal defect towards development of fiber-optic tunable wavelength filters

Author

Del Villar, I., Matias, I. R., Arregui, F. J., Claus, Richard O., Electrical and Computer Engineering, and Virginia Tech

Subjects
Assembly monolayer process, Physics::Optics
Abstract

A theoretical analysis of a fiber optical photonic band gap based tunable wavelength filter is presented. The design presented here is based on the quarter wave reflector with a liquid crystal defect layer in the middle of the structure. The filter generated by the structure is shifted in wavelength as the voltage applied to the structure is modified. Some critical parameters are analyzed: the effect of the consideration of fiber as the first layer and not the input medium in the shape of the filter, the number of layers of the structure, and the thickness of the defect layer. This last parameter determines the width of the wavelength sweep of the filter, but is limited by the creation of more defects. Some rules of practical implementation of this device are also given. (C) 2003 Optical Society of America more...

Published
2003

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3. Analysis of one-dimensional photonic band gap structures with a liquid crystal defect towards development of fiber-optic tunable wavelength filters

Author

Electrical and Computer Engineering, Del Villar, I., Matias, I. R., Arregui, F. J., Claus, Richard O., Electrical and Computer Engineering, Del Villar, I., Matias, I. R., Arregui, F. J., and Claus, Richard O. more...

Abstract

A theoretical analysis of a fiber optical photonic band gap based tunable wavelength filter is presented. The design presented here is based on the quarter wave reflector with a liquid crystal defect layer in the middle of the structure. The filter generated by the structure is shifted in wavelength as the voltage applied to the structure is modified. Some critical parameters are analyzed: the effect of the consideration of fiber as the first layer and not the input medium in the shape of the filter, the number of layers of the structure, and the thickness of the defect layer. This last parameter determines the width of the wavelength sweep of the filter, but is limited by the creation of more defects. Some rules of practical implementation of this device are also given. (C) 2003 Optical Society of America more...

Published
2003