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266 results on '"Arjmand, Reza"'

36. The Worldwide Prevalence of Herpes Simplex Virus Encephalitis and Meningitis: A Systematic Review and Meta-Analysis.

Author

Rohani, Hoorieh, Arjmand, Reza, Mozhgani, Sayed-Hamidreza, Shafiee, Arman, Amini, Mohammad Javad, and Forghani-Ramandi, Mohammad-Moien

Subjects
*ONLINE information services, *VIRAL meningitis, *META-analysis, *CONFIDENCE intervals, *VIRAL encephalitis, *SYSTEMATIC reviews, *HERPES simplex, *HEALTH outcome assessment, *DISEASE prevalence, *MEDLINE
Abstract

Given the relatively high frequency of central nervous system infections and considerable mortality and morbidity reported to be caused by herpes simplex viruses among the other viral agents, having a clear knowledge about their epidemiological profile seems necessary. This systematic review and meta-analysis aimed to determine the relative frequency and prevalence of herpes simplex encephalitis and meningitis in patients tested for viral etiologies. A comprehensive systematic review was performed in PubMed, Scopus, and Web of Science databases, searching for studies on the prevalence and relative frequency of herpes simplex virus 1 and herpes simplex virus 2 encephalitis and meningitis. Seventy-one studies were included. Overall, the prevalence of herpes simplex virus encephalitis among patients tested was 8% (95% confidence interval, 6%-11%; I2 = 98%) and the prevalence of herpes simplex virus meningitis among aseptic patients tested was 4% (95% confidence interval, 3%-7%; I2 = 95%), and a significant difference was observed by region. The results of our subgroup analysis for herpes simplex virus encephalitis revealed a prevalence of 8% for pediatric patients and adolescents and 12% for adults. The results for herpes simplex virus meningitis showed a prevalence of 4% for pediatric patients and adolescents and 9% for adults. We observed significant differences in the frequency of herpes simplex virus 1 and herpes simplex virus 2 detection rates by region. Having high rates of missed cases due to inadequate, highly sensitive paraclinical tests performed on patients with suspected viral central nervous system infection is one of the possible factors. More studies are needed to detect the possible flaws in the process of diagnosis in different regions. [ABSTRACT FROM AUTHOR]

Published
2023
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46. Effect of Substrate-induced Strains on Ferroelectric and Dielectric Properties of Lead Zirconate Titanate Films Prepared by the Sol-gel Technique

Author

A. Mahmoud Amira, Arjmand Reza, Barros Câmara Alice, Izadi Alireza, Fayed Notila, Augusto Brandão Igor, Wadaa-Allah Ahmed, D'Angelo Stefania, Alkanj Souad, A. Fikry Abeer, Shiri Malekabad Ebadollah, Khatami Mehrdad, Li Li, Mahmoudi Shahram, A. Gatea Hamed, Fu Feiran, Sachan Neetu, Mishra Isha, Kumar Nitin, A.M. Nsrallah Ayman, Ahmed Ebada Mahmoud, Fallahizadeh Somayeh, Dadashi Alireza, H. Abdel-Fatah Azza, Zhang Fengrong, Xu Honghua, Mishra Raghav, Kazemi Forough, Vahidi Mahmoud, Tavalla Mehdi, and S. Ahmed Hanan

Subjects
chemistry.chemical_compound, Materials science, Chemical engineering, chemistry, General Engineering, Substrate (chemistry), General Materials Science, Dielectric, Lead zirconate titanate, Ferroelectricity, Sol-gel
Abstract

Background: Lead Zirconate Titanate (PZT) films were synthesized by sol gel technique. The growth of films on ITO, Si\SiO2\Ti\Au, Si\Au and Si\SiO2\Ti\Al substrates discussed. In this study, Zirconium nitrate, lead acetate, and Ti (IV) isoproxide used as raw materials. Besides, acetic acid used as a solvent and 2-methoxy ethanol used as a stabilizer for Ti structure. Along with this, PZT films have perovskite structure, thin-film perovskite structure with high dielectric properties and hysteresis loop have been investigated. Methods: The effects of the type’s substrate on dielectric properties the ferroelectric properties were investigated and compared PZT film which deposited in different substrates. The films annealed at 600°C to complete crystalline films. XRD shows tetragonal PZT films have a strong perovskite structure with [100] prefer plane orientation. SEM and cross-section technique used to study for PZT surface films. Results: The dielectric constant at room temperature was different values depending on the types of substrate. The dielectric properties of the PZT films measured at 1 kHz were 120-400 dielectric constant and dielectric loss 0.02-0.08 at room temperature and 1 kHz. Conclusion: The largest remnant polarization (Pr) and coercive field (Ec) are obtained for PZT film deposited on Si\SiO2\Ti\Au substrate, equal to 26.6 mC/cm2 and 38.3 kV/cm, as compared to 16.3 mC/cm2 and 32.2 kV/cm2 for PZT film deposited on ITO substrate.

Published
2021

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