Search

A fast and robust, yet simple, method has been developed for the immediate characterization of x-ray pulse durations via IR/THz streaking that uses the center of energy (COE) of the photoelectron spectrum for the evaluation. The manuscript presents theory and numerical models demonstrating that the maximum COEs shift as a function of the pulse duration and compares them to existing data for validation. It further establishes that the maximum COE can be derived from two COE measurements set at a phase of π/2 apart. The theory, model, and data agree with each other very well, and they present a way to measure pulse durations ranging from sub-fs to tens of fs on-the-fly with a fairly simple experimental setup.

The transmission of the optical components of the Bernina branch of the Aramis beamline at SwissFEL has been measured with an X-ray gas monitor from DESY and compared with a PSI gas detector upstream of the optical components. The transmission efficiencies of the Mo, Si and SiC mirror coatings of the Aramis beamline and the various other in-beam components were evaluated and compared with theoretical calculations, showing an agreement of 6% or better in all cases. The experiment has also shown the efficacy of the high-harmonic rejection mirrors at the Bernina branch of the Aramis beamline at SwissFEL, and characterized the transmission efficiency of the on-line spectrometer in the Aramis beamline. The theoretical transmission of the mirror coatings match the experimental data to within 7%. The accuracy of these measurements was checked against a radiative bolometer from a Japanese collaboration and found to agree to a level of 4% or better. Further comparisons with a diamond detector from a US-based inter-institute collaboration demonstrated a good agreement for the attenuator settings of the beamline., (open access.)

Rationale: Species with ionization energies beyond what is accessible using state-of-the-art lab sources are affected by poor detection limits in ordinary mass spectrometry setups, whose throughput is also often limited. Extreme ultraviolet (XUV) photoionization mass spectrometry, in combination with linear time-of-flight (TOF), is necessary for the sensitive detection of high ionization energy compounds at trace level. XUV photoionization is available at beamlines, although with limited access. A tabletop setup may fill such a gap., Methods: A self-developed tabletop system, based on a plasma discharge with extreme ultraviolet emission (λ = 5-50 nm) coupled to a TOF mass spectrometer, was used in this study. Simultaneous validation measurements with a reference electron ionization quadrupole mass filter were carried out. An in-house developed hollow toroidal coil (HTC) induction detector was used for concomitant photoelectron detection., Results: Straightforward XUV mass spectra without fragmentation, thanks to the single-photon ionization, were acquired. The measurements with the reference quadrupole were in agreement with the spectra acquired by XUV-TOF. The resolution obtained for N 2 was at least factor of 2 higher than that measured with the reference quadrupole. Initial energy distributions of photoelectrons were retrieved by cross-correlation that gave access to the photoionization distribution., Conclusions: The system allows XUV single-photon ionization of elements and molecules with IE >10 eV that are of fundamental interest e.g. for water splitting and catalysis research. The demonstrated performance is now suitable for a prototype platform., (© 2019 John Wiley & Sons, Ltd.)

Nanoscale depth profiling analysis of a CoNCN-coated electrode for water oxidation catalysis was carried out using table-top extreme ultraviolet (XUV) laser ablation time-of-flight mass spectrometry. The self-developed laser operates at λ = 46.9 nm and represents factor of 4 reduction in wavelength with respect to the 193 nm excimer laser. The reduction of the wavelength is an alternative approach to the reduction of the pulse duration, to enhance the ablation characteristics and obtain smaller quasi-nondestructive ablation pits. Such a XUV-laser ablation method allowed distinguishing different composite components of the catalyst-Nafion blend, used to modify a screen-printed carbon electrode surface. Chemical information was extracted by fragment assignment and relative amplitude analysis of the mass spectrometry peaks. Pure Nafion and the exposed carbon substrate were compared as references. Material specific fragments were clearly identified by the detected nonoverlapping mass-to-charge peaks of Nafion and CoNCN. Three dimensional mapping of relevant mass peak amplitudes was used to determine the lateral distribution and to generate depth profiles from consecutive laser pulses. Evaluating the profiles of pristine electrodes gave insight into fragmentation behavior of the catalyst in a functional ionomer matrix and comparison of post-catalytic electrodes revealed spots of thin localized Co residues.

Ultrafast photoelectron and photoion spectroscopy (as well as their combination known as "coincidence spectroscopy") utilizes detectors based on different electron multipliers such as microchannel plates or single-channel electron multipliers. These detectors have a few important limitations such as fast-signal distortion (low pass operation), mutually exclusive positive or negative mode, dead time, and requirement of trigger. A high-pass induction detector, based on a hollow-cored toroidal coil, was developed that overcomes the above-mentioned limitations. The frequency-dispersive response and linearity of different configurations were analyzed. It is shown that the response is enhanced for ultrafast electron signals, dependent on construction parameters, thus offering response flexibility by design. Kinetic energy distributions of pseudospark-induced electron pulses are characterized in order to validate the capabilities in real applications.

A Y/Mo multilayer coating, optimized for top reflectivity at λ=12  nm, has been nano-inspected after long-term operation at the in-house soft x-ray laser. The surface and optical inspections were complemented by electron microscopy on cross sections, prepared with focused ion beam technology. A factor of 2.5 loss of reflectivity in the exposed area (ca. 30% relative loss every 100 shots), with concomitant nanoscale photodamage and particle fallout, was found. The x-ray-laser-induced damage extended as deep as 250 nm beneath the surface and as wide as the millimeter spot size.

A procedure to optimize the geometrical model of an n-type detector is described. Sixteen lines from seven point sources ((241)Am, (133)Ba, (22)Na, (60)Co, (57)Co, (137)Cs and (152)Eu) placed at three different source-to-detector distances (10, 20 and 30 cm) were used to calibrate a low-background gamma spectrometer between 26 and 1408 keV. Direct Monte Carlo techniques using the MCNPX 2.6 and GEANT 4 9.2 codes, and a semi-empirical procedure were performed to obtain theoretical efficiency curves. Since discrepancies were found between experimental and calculated data using the manufacturer parameters of the detector, a detail study of the crystal dimensions and the geometrical configuration is carried out. The relative deviation with experimental data decreases from a mean value of 18-4%, after the parameters were optimized., (Copyright © 2010 Elsevier Ltd. All rights reserved.)