1. Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy
- Author
-
C. H. Joseph, Francesca Luzi, S. N. Afifa Azman, Pietro Forcellese, Eleonora Pavoni, Gianluca Fabi, Davide Mencarelli, Serena Gentili, Luca Pierantoni, Antonio Morini, Michela Simoncini, Tiziano Bellezze, Valeria Corinaldesi, and Marco Farina
- Subjects
inverted scanning microwave microscopy (iSMM) ,nanoscale electrical properties ,graphene oxide (GO) ,epoxy nanocomposites ,Chemical technology ,TP1-1185 - Abstract
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample’s electrical properties. In particular, the electrical conductivity in the order of ∼10−1 S/m as well as the mapping of the dielectric constant with a value of ∼4.7 ± 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip–sample interaction.
- Published
- 2022
- Full Text
- View/download PDF