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We have employed VEPP-4 synchrotron radiation to measure CCD detector absolute responsivity in vacuum ultraviolet (115-310 nm) spectral range. The detector is designed in the form of a stainless steel enclosure containing a backside-illuminated CCD to protect the CCD from contamination. The entrance window of the enclosure is a round MgF2 spectral filter transparent for ultraviolet radiation with wavelengths longer than 112 nm. The measurements were carried out at Kosmos Metrological Station at the operating temperature of -100°C on the sensitive surface of the CCD. We utilized SPD calibrated silicon photodiode with 1 cm2 sensitive area and a known spectral sensitivity profile as a reference detector. The resultant measurements show a clear CCD responsivity dip near 280 nm, and a great potential to improve the CCD responsivity values using specially designed anti-reflection coatings.