49 results on '"Anbinderis, T"'
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2. Recent progress in CERN RD39: radiation hard cryogenic silicon detectors for applications in LHC experiments and their future upgrades
3. Cryogenic Si detectors for ultra radiation hardness in SLHC environment
4. Development of cryogenic Si detectors by CERN RD39 Collaboration for ultra radiation hardness in SLHC environment
5. Recent developments of CERN RD39 cryogenic tracking detectors collaboration: CERN RD39 Collaboration
6. Sensitivity of Homogeneity Mapping of Semiconducting Wafer Using Millimeter Waves
7. Sensitivity of Homogeneity Mapping of Dielectric Wafer Using Millimeter Waves
8. Nondestructive Material Homogeneity Characterization by Millimeter Waves
9. Low-temperature tracking detectors
10. Recent results from the CERN RD39 Collaboration on super-radiation hard cryogenic silicon detectors for LHC and LHC upgrade
11. The effect of charge collection recovery in silicon p–n junction detectors irradiated by different particles
12. Investigation of microwave properties of planar heterojunction diodes in Ka frequency range using probe station
13. UWB ISAR imaging in 109–172 GHz frequency band
14. RD39 Status Report 2009
15. RD39 Status Report 2008
16. RD39 Status Report 2007
17. Non-destructive material homogeneity evaluation using scanning near field millimeter wave microscopy
18. RD39 Status Report 2004
19. RD39 Status Report 2003
20. Influence of Magnetic Field on Detection Properties of Planar Microwave Diodes
21. Magnetic field influence on detection properties of planar microwave diodes on the base of modulation doped semiconductor structures
22. Temperature dependence of the detected voltage of planar microwave diode that operation is based on carrier heating phenomena in strong electric field
23. Millimeter wave technique for non-destructive Si wafer homogeneity characterization
24. Near-field microscopy at millimeter waves
25. Recent progress in CERN RD39: radiation hard cryogenic silicon detectors for applications in LHC experiments and their future upgrades
26. Non-Destructive Material Homogeneity Evaluation Using Scanning Millimeter Wave Microscopy
27. Mesoscopic Structures for Microwave-THz Detection
28. Non-destructive material homogeneity evaluation using scanning millimeter wave beam
29. Millimeter wave detection on gated selectivelly doped semiconductor structure
30. Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range
31. Waveguide-based calorimeter for terahertz frequency range
32. Broad Band THz Sensing by 2DEG Bow-Tie-Type Diodes
33. Millimeter wave technique for non-destructive Si wafer homogeneity characterization.
34. Millimeter wave application for non-destrucive homogenety characterization of semiconductor and dielectric wafers.
35. Material homogeneity mapping using millimetre waves
36. NON-DESTRUCTIVE MATERIAL HOMOGENEITY EVALUATION USING SCANNING MILLIMETER WAVE BEAM.
37. Microwave Diode on the Base of Symmetrically and Asymmetrically Doped Semiconductor Heterojunction.
38. Temperature dependence of the detected voltage of planar microwave diode that operation is based on carrier heating phenomena in strong electric field.
39. Scanners for near-field microwave microscopy
40. Planar heterojunction diode for millimeter waves detection
41. RD39 status report
42. Microwave diode on the base of symmetrically and asymmetrically doped semiconductor heterojunction
43. RD39 status report 2007
44. RD39 status report 2006
45. RD39 status report 2005
46. Magnetic field influence on detection properties of planar microwave diodes on the base of modulation doped semiconductor structures.
47. Scanners for near-field microwave microscopy.
48. Millimeter wave material homogeneity mapping technique.
49. MM-wave radio measurement instruments. New generation.
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