11 results on '"Agopian, P.G.D."'
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2. Gate dielectric material influence on DC behavior of MO(I)SHEMT devices operating up to 150 °C
3. Experimental analysis and improvement of the DC method for self-heating estimation
4. Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs
5. The Smaller the Noisier? Low Frequency Noise Diagnostics of Advanced Semiconductor Devices
6. The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices
7. The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices.
8. DIBL performance of 60 MeV proton-irradiated SOI MuGFETs.
9. Uniaxial stress efficiency for different fin dimensions of triple-gate SOI nMOSFETs.
10. Fin shape influence on the analog performance of standard and strained MuGFETs.
11. Transconductance ramp effect in high-k triple gate sSOI nFinFETs.
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