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Your search keyword '"Abel-Tiberini, L."' showing total 7 results
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7 results on '"Abel-Tiberini, L."'

3. Optical Characterisation of an unknown single layer: Institut Fresnel contribution to OIC 2004 Measurement Problem

Author

Lemarchand, F., Deumie, Carole, Zerrad, Myriam, Abel-Tiberini, L., Bertussi, Bertrand, Georges, Gaelle, Lazaridès, B., Cathelinaud, M., Lequime, M., Amra, Claude, Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), and Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2006

4. Contrôle non destructif de l'interstice d'air résiduel entre deux filtres interférentiels assemblés par adhérence moléculaire

Author

Abel-Tiberini, L., Lemarchand, F., Floriot, J., Lequime, M., Lemarchand, Fabien, SFO, Institut FRESNEL (FRESNEL), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), and Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)

Subjects
[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
Published
2005

6. Dedicated spectrophotometer for localized transmittance and reflectance measurements.

Author

Abel-Tiberini L, Lemarquis F, and Lequime M

Abstract

A dedicated spectrophotometer is built to achieve localized transmittance and reflectance measurements. The spatial resolution can be chosen from 100 microm to 2 mm, the spectral resolution from 0.5 to 5 nm, and the spectral range from 400 to 1700 nm. This apparatus can be used to study the index and thickness uniformity on single layers to determine and optimize the characteristics of the deposition chamber. It can also be used to measure the spatial variations of optical properties of intended nonuniform coatings such as linear variable filters.

Published
2006
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7. Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem.

Author

Lemarchand F, Deumié C, Zerrad M, Abel-Tiberini L, Bertussi B, Georges G, Lazaridès B, Cathelinaud M, Lequime M, and Amra C

Abstract

We present the characterizations performed at the Institut Fresnel for the Measurement Problem of the Optical Interference Coatings 2004 Topical Meeting. A single layer coated on a fused-silica substrate of unknown composition and parameters is analyzed in terms of optogeometrical parameters, uniformity, and scattering. We determine the refractive index and the average thickness of the coating, then provide the localized determination of the thickness with a 2 mm spatial resolution. Topography measurements include atomic force microscopy and angle-resolved scattering measurements. These results are completed thanks to a Taylor Hobson noncontact 3D surface profiler.

Published
2006
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