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In this paper, a testing technique based on supply current verifying is presented, for fault detection of analog circuits containing CMOS operational amplifiers. This testing technique is employed and developed to maximize the fault coverage of the circuit under test (CUT) using transient and frequency responses of the supply current. This testing method is based on the over-sighting of the quiescent supply current (Iddq) of the CMOS operational amplifier operating in its quiescent mode and the supply current of the CMOS operational amplifier used as a Sallen-Key band pass filter in the AC and transient operating domains. The faults investigated in our study are of bridging and open circuit types that occur at the CMOS transistor level. The Pspice software was used for the CUT simulation by applying Monte-Carlo analysis in faulty and fault free conditions. Test parameters are extracted and selected to be used as input features of our classifier. [ABSTRACT FROM AUTHOR]

The development in industrial systems leads to the augmentation in the consumption of the power. Therefore, this development makes use of multiphase machines. The use of multiphase machines caused several problems and defects. Electrical energy is mainly distributed in a three-phase system to provide the electrical power necessary for the electrical engineering equipment and materials. The sinusoidal aspect of the required original voltage primarily preserves its essential qualities for transmitting useful power to terminal equipment. When the voltage waveform is no longer sinusoidal, perturbations are encountered, which generate malfunctions and overheating of the receivers and the equipment connected to the same electrical supply network. The main disturbing phenomena are harmonics, voltage fluctuations, voltage unbalances, electromagnetic fields, and electrostatic discharges. This present work aims to study the effects of harmonic pollution and voltage unbalance on the five-phase permanent magnet synchronous machine using spectrum current analysis and wavelet transform. [ABSTRACT FROM AUTHOR]