Search

We report on the structural and magnetic properties of thin Fe films grown on the Cu(1 1 0) surface. In-plane grazing-incidence X-ray diffraction has been used to measure the lateral lattice spacing of the Fe films. Complementary information about the structure of the topmost layers has been obtained by means of Auger and photoelectron diffraction. The Fe film grows pseudomorphic with the substrate up to a thickness of about 0.8 nm. The diffraction feature of a new phase is observed at 1.6 nm, with a corresponding interplanar distance close to the bulk body centered cubic (bcc) Fe one, which is eventually recovered at higher thickness (6.4 nm). From comparison between X-ray diffraction and photoelectron diffraction, it is suggested that the bcc-like Fe grows on the (1 0 0) surface with its [1 1 0] axis oriented along the [0 0 1] substrate direction. The photoelectron diffraction data also indicate a strong faceting in the [1 10] substrate direction. This morphology is believed to contribute to the in-plane uniaxial magnetic anisotropy observed by Kerr effect and Brillouin light scattering from spin waves.