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6 results on '"0000-0003-2023-8158"'

2. Annealing properties of vacancy-type defects in ion implanted GaN during ultra-high-pressure annealing studied by using a monoenergetic positron beam

Author

Akira Uedono, Hideki Sakurai, 0000-0003-2023-8158, Jun Uzuhashi, Tetsuo Narita, Kacper Sierakowski, Shoji Ishibashi, Shigefusa F. Chichibu, Michal Bockowski, Jun Suda, Tadakatsu Ohokubo, Nobuyuki Ikarashi, 0000-0001-7367-0193, Kazuhiro Hono, Tetsu Kachi, Akira Uedono, Hideki Sakurai, 0000-0003-2023-8158, Jun Uzuhashi, Tetsuo Narita, Kacper Sierakowski, Shoji Ishibashi, Shigefusa F. Chichibu, Michal Bockowski, Jun Suda, Tadakatsu Ohokubo, Nobuyuki Ikarashi, 0000-0001-7367-0193, Kazuhiro Hono, and Tetsu Kachi

Published
2023

3. Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation

Author

Emi Kano, Keita Kataoka, 0000-0003-2023-8158, Jun Uzuhashi, Kenta Chokawa, Hideki Sakurai, Akira Uedono, Tetsuo Narita, Kacper Sierakowski, Michal Bockowski, Ritsuo Otsuki, Koki Kobayashi, Yuta Itoh, Masahiro Nagao, 0000-0003-3548-1951, Tadakatsu Ohkubo, 0000-0001-7367-0193, Kazuhiro Hono, Jun Suda, Tetsu Kachi, Nobuyuki Ikarashi, Emi Kano, Keita Kataoka, 0000-0003-2023-8158, Jun Uzuhashi, Kenta Chokawa, Hideki Sakurai, Akira Uedono, Tetsuo Narita, Kacper Sierakowski, Michal Bockowski, Ritsuo Otsuki, Koki Kobayashi, Yuta Itoh, Masahiro Nagao, 0000-0003-3548-1951, Tadakatsu Ohkubo, 0000-0001-7367-0193, Kazuhiro Hono, Jun Suda, Tetsu Kachi, and Nobuyuki Ikarashi

Published
2022

4. Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells

Author

Yudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, 0000-0003-2023-8158, Jun Uzuhashi, 0000-0003-3548-1951, Tadakatsu Ohkubo, 0000-0001-7367-0193, Kazuhiro Hono, Shigetaka Tomiya, Yudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, 0000-0003-2023-8158, Jun Uzuhashi, 0000-0003-3548-1951, Tadakatsu Ohkubo, 0000-0001-7367-0193, Kazuhiro Hono, and Shigetaka Tomiya

Published
2022

5. Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing

Author

0000-0003-2023-8158, Jun Uzuhashi, 0000-0003-4272-2653, Jun Chen, 0000-0002-8085-1598, Ashutosh Kumar, 0000-0001-5040-8416, Wei Yi, 0000-0003-3548-1951, Tadakatsu Ohkubo, Ryo Tanaka, Shinya Takashima, Masaharu Edo, Kacper Sierakowski, Michal Bockowski, Hideki Sakurai, Tetsu Kachi, 0000-0002-7365-9979, Takashi Sekiguchi, 0000-0001-7367-0193, Kazuhiro Hono, 0000-0003-2023-8158, Jun Uzuhashi, 0000-0003-4272-2653, Jun Chen, 0000-0002-8085-1598, Ashutosh Kumar, 0000-0001-5040-8416, Wei Yi, 0000-0003-3548-1951, Tadakatsu Ohkubo, Ryo Tanaka, Shinya Takashima, Masaharu Edo, Kacper Sierakowski, Michal Bockowski, Hideki Sakurai, Tetsu Kachi, 0000-0002-7365-9979, Takashi Sekiguchi, 0000-0001-7367-0193, and Kazuhiro Hono

Published
2022

6. An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy.

Author

Uzuhashi J, Ohkubo T, and Hono K

Abstract

The automation of the atom probe tomography (APT) tip preparation using a focused ion beam (FIB) with a scanning electron microscopy (SEM) dual-beam system will certainly contribute to systematic APT research with higher throughput and reliability. While our previous work established a method to prepare tips with a specified tip curvature and taper angle automatically, by using script-controlled FIB/SEM, the technique has been expanded to automated "site-specific" tip preparation in the current work. The improved procedure can automatically detect not only the tip shape but also the interface position in the tip; thus, the new function allows for control of the tip apex position. In other words, automated "site-specific" tip preparations are possible. The details of the automation procedure and some experimental demonstrations, that is, a Pt cap on Si, InGaN-based MQWs, and a p-n junction of GaAs, are presented., Competing Interests: Conflict of Interest The authors declare that they have no competing interest., (© The Author(s) 2024. Published by Oxford University Press on behalf of the Microscopy Society of America. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.)

Published
2024
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