1. An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline.
- Author
-
Hafner, Aljoša, Costa, Luca, Kourousias, George, Bonanni, Valentina, žiηić, Milan, Stolfa, Andrea, Bazi, Benjamin, Vincze, Laszlo, and Gianoncelli, Alessandra
- Subjects
SOFT X rays ,ATOMIC force microscopy ,X-ray microscopy ,X-ray fluorescence ,SPECTRAL imaging ,SYNCHROTRONS - Abstract
Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM–XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF–STXM–AFM combination. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF