251. Atom probe tomography of swift ion irradiated multilayers
- Author
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Juraszek, J., Grenier, A., Teillet, J., Cadel, E., Tiercelin, N., Monnet, I., and Toulemonde, M.
- Subjects
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TOMOGRAPHY , *IRRADIATION , *MULTILAYERED thin films , *NANOELECTROMECHANICAL systems , *TRANSPORT theory , *ELECTRONIC excitation , *INTERFACES (Physical sciences) , *STOPPING power (Nuclear physics) - Abstract
Abstract: Nanometer scale layered systems are well suited to investigate atomic transport processes induced by high-energy electronic excitations in materials, through the characterization of the interface transformation. In this study, we used the atom probe technique to determine the distribution of the different elements in a (amorphous- multilayer before and after irradiation with Pb ions in the electronic stopping power regime. Atom probe tomography is based on reconstruction of a small volume of a sharp tip evaporated by field effect. It has unique capabilities to characterize internal interfaces and layer chemistry with sub-nanometer scale resolution in three dimensions. Depth composition profiles and 3D element mapping have been determined, evidencing for asymmetric interfaces in the as-deposited sample, and very efficient Fe–Co intermixing after irradiation at the fluence ion . Estimation of effective atomic diffusion coefficients after irradiation suggests that mixing results from interdiffusion in a molten track across the interface in agreement with the thermal spike model. [Copyright &y& Elsevier]
- Published
- 2009
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