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This study evaluated ultrasonic pulse-echo angulation as a nondestructive technique for measuring thin case depths (less than 2 mm) in hardened steel. In concept, this method has been used to measure case depths greater than 2 mm and has also been suggested as a technique for determining nominal grain size. It has not been applied to case depths less than 2 mm because impediments, such as the obscuring effect of the front interface echo, the extremely low signal-to-noise ratio of grain backscatter, and the small area localization usually required by industrial inspection procedures prevent accurate measurement.

Mapvision is a photogrammetric machine vision system developed by the Technical Research Centre of Finland primarily for industrial inspection and assembly control applications. The system consists of four simultaneously operating solid state cameras and an especially programmed photogrammetric microprocessor. The three-dimensional measuring accuracy is better than 1:5,000. The Mapvision is an automated system enabling for example the dimensional feed-back and interaction between computer aided design and manufacturing phases.

The design of a special purpose configuration recognition system is described brieflyfrom problem statement through specification. The system inspects assemblies for correctpart placement and part type. A variety of uses for such an on -line inspection device aredescribed based on its particular three dimensional measurement capabilities.IntroductionFor the wide variety of industrial inspection needs there is an even wider variety ofcandidate techniques. Very complicated problems may require highly specialized methods.We report here a complex industrial inspection problem and the indicated solution. Followingthat, we seek to describe the general characteristics a problem must have to justify theparticular solution.Some Peculiarities of the Cummins Inspection ProblemThe Cummins Engine Company produces diesel engines. As Figures la,b,c and d canonly begin to show, these engines may differ substantially from one to another. For variousmarket reasons it is not desirable to cut down on the variety of engine options.FIGURE

The needs for on-line and unsupervised industrial inspection for quality control and process monitoring are rapidly increasing with the accelerated trend toward factory automation. Optical techniques are particularly well suited for industrial inspection needs because of their noncontact nature and imaging capabilities.

This paper reviews some of the activity in the UK directed towards realisation and exploitation of practical shop-floor automatic inspection systems. There are still considerable barriers to widespread applications because of the generally specialised nature of each situation, and the complexity and cost associated with achieving satisfactory solutions to image analysis problems. However, rugged solid-state imagers and microprocessor-based signal processing systems are beginning to advance the state-of-the-art to the point at which autonomous and robust equipment of moderate sophistication can be built at reasonable cost. The impact of microelectronics on performance and cost of equipment for inspection applications, and the problems of justifying and maintaining this equipment, are examined. Projects in which Sira Institute has been involved are referred to briefly to illustrate some of the points made.© (1979) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

This paper reviews the techniques available for detection and recognition training, and their application to industrial inspection. Systematic procedures are described for using these techniques as part of an integrated training scheme. Approaches to task analysis for inspector training are also discussed.

SUMMARY: A colony illuminator is described which incorporates side illumination by means of a small ring fluorescent tube. Inspection of the Petri dish is facilitated by the use of a detachable 5 in. diameter plastic industrial inspection lens.

The influence of the internal gettering process on the large-scale defects in Czochralski-grown boron-doped single-crystal silicon is investigated by low-angle mid-infrared light scattering. The large-scale defects in the as-grown material and crystals subjected to the internal gettering procedure are classified. The applicability of low-angle light scattering in laboratory investigations and in the industrial inspection of the operations in an internal gettering production cycle is demonstrated.

We address the problem of intelligent sensing in this work. In particular, we use discrete event dynamic systems (DEDS) to guide the sensing of mechanical parts for industrial inspection and reverse engineering. >

The Smart Machine Vision Sensor (SMVS) is a self-contained low-cost machine vision system that combines an image sensor, a processing unit and communication interfaces in a single unit. This paper describes the design of the SMVS, the concept of the operating system and the application software. The main characteristics of the SMVS are (1) the absence of an analog video signal and (2) the modular design concept. The signal processing is performed with the processing unit and the output consists either of image analysis results or a compressed digital image data stream. The modular design allows for easy customization for applications that require different sensor technologies, resolutions and spectral sensitivities. The modular design is made possible by the development of a generic sensor-CPU interface. This interface can be used with either CCD or CMOS sensors with a resolution of 512512 pixels. It eliminates the need to redesign the processor board with changing sensor requirements. The SMVS is smaller and cheaper than traditional image processing systems based on desktop personal computers. It uses full-frame, non-interlaced sensors with square pixels to provide an optimal image quality, avoiding the drawbacks of an analog, interlaced video signal with ^Lxed frame rate.

We develop a modified four-frame phase shift algorithm that incorporates a smoothness constraint. This is applied to a high-precision full-profile reconstruction and measurement for integrated circuit packages.

The application of an interactive image-analysis system (Susie) is demonstrated on a variety of tasks in automatic visual inspection, including: (a) the existential inspection and pitch measurement of female screw threads; (b) checking, the legibility of printing on tablets; (c) the enhancement of visibility of industrial radiographs; (d) detecting defects on polished metal surfaces(hydraulics cylinder bores and bright, extruded copper bars); (e) analysing the texture of machined metal surfaces; (f) locating the ends of fibrelike objects (asbestos) viewed under a microscope, as a prelude to counting them or measuring their lengths; and (g) counting, sorting and recognising defects in pressed artefacts, strewn haphazardly onto a table. Susie is ideally suited for evaluating such problems and for prototyping special-purpose visual-inspection systems. It is easy to learn to use Susie and, given suitable optics, an experienced image analyst can very quickly understand the nature of the pictures he is given and develop a suitable strategy for processing them.

This research is a contribution to the epidemiological and profilatic study of animals cysticercosis, studying the resistence of C. cellulosae in fresh meat processed according to industrial standard and in contaminated pork meat, as a tentative of identification of this fresh meat as a disseminator of human teniasis and consequently human teniasis and cysticercosis. It was intended too, to study the possibility of treatment of contaminated pork meat with C. cellulosae as well as offer an gid to the improvement and bring up to date the hygicnic sanitary standards of the Regulamentation of Sanitary and Industrial Inspection of Animal Origin Products.

New and recently published data, comprising a total of approximately 30 000 judgments (ratio and paired comparisons) made by several observers on 176 pairs of colors, are used to check the 1964 CIE color-difference formula. The results indicate that the formula predicts observed color difference, ranging from about 4 to about 60 CIE units, with reasonable accuracy. Approximately 90% of the observed differences are predicted correctly to within ±25%. The precision of the observed differences is estimated to be also about ±25%. It has been noticed that several pairs (about 20 out of 100) have predicted color differences deviating significantly from the observed differences. Observations are affected by the luminous reflectance of the achromatic surround, but the deviations between color differences observed with a white surround and color differences observed with a black surround are masked somewhat by the limited precision of the observations, and thus, in the average, the CIE formula predicts both cases equally well.