201. Probing the Utmost Distance of Polymer Dynamics Suppression by a Substrate by Investigating the Diffusion of Fluorinated Tracer-Labeled Polymer Chains
- Author
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Hao Zhou, Xinping Wang, Biao Zuo, Yongming Hong, Yizhi Zhang, Li Zhang, and Jianquan Xu
- Subjects
chemistry.chemical_classification ,Materials science ,Polymers and Plastics ,Bilayer ,Diffusion ,Organic Chemistry ,Dynamics (mechanics) ,02 engineering and technology ,Polymer ,Substrate (electronics) ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,Inorganic Chemistry ,Solid substrate ,chemistry ,Chemical engineering ,TRACER ,Materials Chemistry ,Organic chemistry ,0210 nano-technology ,Layer (electronics) - Abstract
A facile method was developed to measure the utmost distance of polymer dynamics suppressed by a solid substrate by investigating the diffusion of a fluorinated tracer-labeled polymer in the bottom layer of bilayer samples. Here, a labeled layer of fluorinated tracer-labeled at the polymer chain end of variable thickness was supported on a substrate, and the corresponding homopolymer layer of fixed thickness was deposited on top of the bottom layer. From the critical time (t*) required for the fluorinated component to diffuse from the bottom layer to the bilayer film surface as a function of the thickness of the bottom layer, a critical thickness of the bottom layer (hc*), corresponding to the thickness at which t* started to increase, was obtained. This thickness was related to the distance over which polymer dynamics were altered by the substrate. The results showed that hc* was very sensitive to the surface chemistry of the substrate and exhibited both molecular weight and temperature dependencies.
- Published
- 2017