Search

Your search keyword '"Lee, B.H."' showing total 947 results
Start Over Author "Lee, B.H."
947 results on '"Lee, B.H."'

213. Device and reliability improvement of HfSiON+LaOx/metal gate stacks for 22nm node application

Author

Huang, J., primary, Kirsch, P. D., additional, Heh, D., additional, Kang, C. Y., additional, Bersuker, G., additional, Hussain, M., additional, Majhi, P., additional, Sivasubramani, P., additional, Gilmer, D. C., additional, Goel, N., additional, Quevedo-Lopez, M.A., additional, Young, C., additional, Park, C.S., additional, Park, C., additional, Hung, P. Y., additional, Price, J., additional, Harris, H.R., additional, Lee, B.H., additional, Tseng, H.-H., additional, and Jammy, R., additional

Published
2008
Full Text
View/download PDF

217. Gate First Band Edge High-k/Metal Stacks with EOT=0.74nm for 22nm Node nFETs

Author

Huang, J., primary, Kirsch, P. D., additional, Hussain, M., additional, Heh, D., additional, Sivasubramani, P., additional, Young, C., additional, Gilmer, D. C., additional, Park, C.S., additional, Tan, Y. N., additional, Park, C., additional, Harris, H.R., additional, Majhi, P., additional, Bersuker, G., additional, Lee, B.H., additional, Tseng, H.-H., additional, and Jammy, R., additional

Published
2008
Full Text
View/download PDF

219. Aggressively Scaled High-k Gate Dielectric with Excellent Performance and High Temperature Stability for 32nm and Beyond

Author

Sivasubramani, P., primary, Harris, R., additional, Song, S.C., additional, Heh, D., additional, Choi, R., additional, Majhi, P., additional, Bersuker, G., additional, Lysaght, P., additional, Lee, B.H., additional, Tseng, H.-H., additional, Jur, J. S., additional, Kirsch, P.D., additional, Lichtenwalner, D. J., additional, Kingon, A. I., additional, Jammy, R., additional, Huang, J., additional, Park, C., additional, Tan, Y.N., additional, Gilmer, D.C., additional, Young, C., additional, Freeman, K., additional, and Hussain, M.M., additional

Published
2007
Full Text
View/download PDF

230. Setleis syndrome: clinical, molecular and structural studies of the first TWIST2 missense mutation.

Author

Rosti, R.O., Uyguner, Z.O., Nazarenko, I., Bekerecioglu, M., Cadilla, C.L., Ozgur, H., Lee, B.H., Aggarwal, A.K., Pehlivan, S., and Desnick, R.J.

Subjects
MISSENSE mutation, HELIX-loop-helix motifs, INBORN errors of metabolism, MICROPHTHALMIA-associated transcription factor, MUTANT proteins, HOMOZYGOSITY
Abstract

Setleis syndrome is characterized by bitemporal scar-like lesions and other characteristic facial features. It results from recessive mutations that truncate critical functional domains in the basic helix-loop-helix ( bHLH) transcription factor, TWIST2, which regulates expression of genes for facial development. To date, only four nonsense or small deletion mutations have been reported. In the current report, the clinical findings in a consanguineous Turkish family were characterized. Three affected siblings had the characteristic features of Setleis syndrome. Homozygosity for the first TWIST2 missense mutation, c. 326T>C (p. Leu109Pro), was identified in the patients. In silico analyses predicted that the secondary structure of the mutant protein was sustained, but the empirical force field energy increased to an unfavorable level with the proline substitution (p. Leu109Pro). On a crystallographically generated dimer, p.Leu109 lies near the dimer interface, and the proline substitution is predicted to hinder dimer formation. Therefore, p. Leu109Pro-TWIST2 alters the three dimensional structure and is unable to dimerize, thereby hindering the binding of TWIST2 to its target genes involved in facial development. [ABSTRACT FROM AUTHOR]

Published
2015
Full Text
View/download PDF

231. A cross-sectional multicenter study of osteogenesis imperfecta in North America - results from the linked clinical research centers.

Author

Patel, R.M., Nagamani, S.C.S., Cuthbertson, D., Campeau, P.M., Krischer, J.P., Shapiro, J.R., Steiner, R.D., Smith, P.A., Bober, M.B., Byers, P.H., Pepin, M., Durigova, M., Glorieux, F.H., Rauch, F., Lee, B.H., Hart, T., and Sutton, V.R.

Subjects
OSTEOGENESIS imperfecta, BONE growth, ETIOLOGY of diseases, CLINICAL medicine, GENETICS, DISEASE risk factors
Abstract

Osteogenesis imperfecta ( OI) is the most common skeletal dysplasia that predisposes to recurrent fractures and bone deformities. In spite of significant advances in understanding the genetic basis of OI, there have been no large-scale natural history studies. To better understand the natural history and improve the care of patients, a network of Linked Clinical Research Centers ( LCRC) was established. Subjects with OI were enrolled in a longitudinal study, and in this report, we present cross-sectional data on the largest cohort of OI subjects ( n = 544). OI type III subjects had higher prevalence of dentinogenesis imperfecta, severe scoliosis, and long bone deformities as compared to those with OI types I and IV. Whereas the mean lumbar spine area bone mineral density ( LS aBMD) was low across all OI subtypes, those with more severe forms had lower bone mass. Molecular testing may help predict the subtype in type I collagen-related OI. Analysis of such well-collected and unbiased data in OI can not only help answering questions that are relevant to patient care but also foster hypothesis-driven research, especially in the context of 'phenotypic expansion' driven by next-generation sequencing. [ABSTRACT FROM AUTHOR]

Published
2015
Full Text
View/download PDF

245. Simplified manufacturable band edge metal gate solution for NMOS without a capping layer

Author

Harris, H. R., primary, Alshareef, H., additional, Wen, H. C., additional, Krishnan, S., additional, Choi, K., additional, Luan, H., additional, Heh, D., additional, Park, C.S., additional, Park, H.B., additional, Hussain, M., additional, Ju, B.S., additional, Kirsch, P.D., additional, Song, S.C., additional, Majhi, P., additional, Lee, B.H., additional, and Jammy, R., additional

Published
2006
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results