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696 results on '"Falcony, C."'

201. Silicon excess and thermal annealing effects on the photoluminescence of SiO2 and silicon rich oxide super enriched with siliscon implantation

Author

Berman, D., primary, Aceves, M., additional, Gallegos, A., additional, Morales, A., additional, Berriel, L. R., additional, Carrillo, J., additional, Flores, F., additional, Falcony, C., additional, Domínguez, C., additional, Llobera, A., additional, Riera, M., additional, and Pedraza, J., additional

Published
2004
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207. Remote plasma chemical vapor deposition silicon oxynitride thin films: Dielectric properties

Author

Hernández-Vélez, M., Sánchez, Olga, Fernández-Gutiérrez, F., Falcony, C., Martínez Duart, J. M., Hernández-Vélez, M., Sánchez, Olga, Fernández-Gutiérrez, F., Falcony, C., and Martínez Duart, J. M.

Abstract

Silicon oxynitride thin films have been deposited using remote plasma chemical vapor deposition from SiCl4 + NH3 + O2 gas mixtures. The stoichiometry of the deposited films varies from that corresponding to the silicon oxide to a stoichiometry very close to silicon nitride when the NH3/O2 gas ratio is changed in the plasma. The approximate compositions of the films were determined by Rutherford backscattering spectroscopy and nuclear reaction analysis, and the local bonding arrangements were determined by infrared spectroscopy. Analysis of metal–insulator–semiconductor devices under the effect of and external sinusoidal electric field (dielectric spectrometry) indicates the presence of traps centers in the Si–SiO2 interface. Correlations between the local bonded structures in the oxynitride and the conduction and polarization processes detected in the films are also discussed.

Published
1998

223. BLUE PHOTOLUMINESCENCE IN GaAs(N) NANOWHISKERS

Author

POZOS, S. ADRIAN CANALES, primary, JARA, DAVID RIOS, additional, ALVAREZ-FREGOSO, OCTAVIO, additional, ALVAREZ-PEREZ, M. A., additional, GARCIA, MANUEL, additional, SANCHEZ, ENRIQUE MARTINEZ, additional, JUAREZ-ISLAS, JULIO A., additional, ZELAYA - ANGEL, ORLANDO, additional, MENDOZA-ALVAREZ, JULIO G., additional, and FALCONY, C., additional

Published
2001
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234. Composition and emission characterization and computational simulation of silicon rich oxide films obtained by LPCVD.

Author

Aceves‐Mijares, M., Espinosa‐Torres, N. D., Flores‐Gracia, F., González‐Fernández, A. A., López‐Estopier, R., Román‐López, S., Pedraza, G., Domínguez, C., Morales, A., and Falcony, C.

Subjects
SILICON oxide films, COMPUTER simulation, CHEMICAL vapor deposition, X-ray photoelectron spectroscopy, MOLECULES
Abstract

Silicon rich oxide (SRO) is a silicon compatible material that could solve the light emission limitation inherent to bulk silicon. However, not many applications are yet reported, since still much research has to be done. In this paper, SRO superficial films were obtained by low pressure chemical vapor deposition. Structural and optical characterization was done by X-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy (FTIR) corroborating that after annealing, the SiO and the Si2O phase clearly increases. Emission of SRO in the range between ultra violet and near-infrared is determined by photo, electro and cathode luminescence. Assuming that emission is due to agglomerates of Si-O compounds, computational simulations of cyclic chains of SiO were done to calculate the FTIR spectra, emission and HOMO-LUMO densities. It was found that emission of molecules with less than 10 silicon atoms is not likely to be present in the annealed films. However, for molecules with more than 13 silicon atoms, the emission extends to the visible and near infrared region. The calculated FTIR agrees with the experimental results. Copyright © 2013 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

Published
2014
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237. Tl-based films grown on silver tape substrates

Author

Falcony, C., primary, Jergel, M., additional, Morales, A., additional, Garcia, M., additional, Hernandez, R.T., additional, De Ita, A., additional, Cabanas-Moreno, J.G., additional, Palacios G., J., additional, and Martinez, R., additional

Published
1999
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