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201. Challenge in Cu-rich CuInSe2 thin film solar cells: Defect caused by etching

202. Rear surface passivation of ultra-thin CIGS solar cells using atomic layer deposited HfOx

203. Muzzling the Press:When Does the Law Justify Reporting Restrictions? Contempt Cases Against Journalists at the ICTY and Beyond

204. Rear surface passivation of ultra-thin CIGS solar cells using atomic layer deposited HfOx

205. Muzzling the Press:When Does the Law Justify Reporting Restrictions? Contempt Cases Against Journalists at the ICTY and Beyond

209. The outcome of replacing Sn completely by Ge in Kesterite Cu2ZnSnSe4 solar cells

210. Attacks against Cultural Heritage as a Weapon of War

211. The X-ray response of TlBr

214. Detrimental Impact of Na Upon Rb Postdeposition Treatments of Cu(In,Ga)Se2 Absorber Layers.

215. Intermediate scale bandgap fluctuations in ultrathin Cu(In,Ga)Se2 absorber layers

216. Alkali treatment for single-stage co-evaporated thin CuIn0.7Ga0.3Se2 solar cells

217. Crystallization properties of Cu2ZnGeSe4

218. Crystallization properties of Cu2ZnGeSe4

219. Room temperature photoluminescence analysis of alkali treated single-stage thin Cu(In,Ga)Se2 absorber layers

220. Smart Contracts, Distributed Ledgers, and the Need for an Algorithmic Financial Contract Standard

221. Physical routes for the synthesis of kesterite:Topical Review

222. A Study of the Degradation Mechanisms of Ultra Thin CIGS Solar Cells Submitted to a Damp Heat Environment

224. [The frequency of abnormal ultrasonographic findings in the lungs of 129 calves with bronchopneumonia]

225. Häufigkeit abnormer Ultraschallbefunde an der Lunge von 129 Kälbern mit Bronchopneumonie

226. Wet processing in state-of-the-art Cu(In,Ga)Se2 thin film solar cells

229. 7.6% CZGSe Solar Cells Thanks to Optimized CdS Chemical Bath Deposition

230. Selenium and Sulphur replacement dynamics in CZTSSe and CZGSSe kesterite materials

231. 7.6% CZGSe Solar Cells Thanks to Optimized CdS Chemical Bath Deposition

233. Key Issues for the Development of a Ge CMOS Device in an Advanced IC Circuit

234. Capacitance-Voltage (CV) Characterization of GaAs-Oxide Interfaces

236. (Invited) Exploring the ALD Al2O3/In0.53Ga0.47As and Al2O3/Ge Interface Properties: A Common Gate Stack Approach for Advanced III-V/Ge CMOS

237. High-k Dielectrics and Interface Passivation for Ge and III/V Devices on Silicon for Advanced CMOS

239. ALD on High Mobility Channels: Engineering the Proper Gate Stack Passivation

241. (Invited) Active Trap Determination at the Interface of Ge and In0.53Ga0.47 as Substrates with Dielectric Layers

244. Physical routes for the synthesis of kesterite

249. Beyond SiliconMOS: An Electrical Study on Interface and Gate Dielectrics withacAdmittance Techniques

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