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479 results on '"Tono, K."'

151. Charge Migration and Molecular Dissociation Following Multiphoton Multiple Ionization of Iodine-Substitute Molecules by X-Ray Free-Electron Laser Pulses from SACLA

Author

Motomura, K., primary, Kukk, E., additional, Nagaya, K., additional, Ohmura, S., additional, Fukuzawa, H., additional, Wada, S., additional, Mondal, S., additional, Tachibana, T., additional, Ito, Y., additional, Koga, R., additional, Sakai, T., additional, Matsunami, K., additional, Rudenko, A., additional, Nicolas, C., additional, Liu, X.-J., additional, Miron, C., additional, Zhang, Y., additional, Jiang, Y. H., additional, Chen, J., additional, Mailam, A., additional, Kim, D., additional, Tono, K., additional, Inubushi, Y., additional, Hatsui, T., additional, Yabashi, M., additional, Kono, H., additional, Yao, M., additional, and Ueda, K., additional

Published
2014
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152. Sequential multiphoton multiple ionization of atomic argon and xenon irradiated by X-ray free-electron laser pulses from SACLA

Author

Motomura, K., Fukuzawa, H., Son, S-K, Mondal, S., Tachibana, T., Ito, Y., Kimura, M., Nagaya, K., Sakai, T., Matsunami, K., Wada, S., Hayashita, H., Kajikawa, J., Liu, X-J, Feifel, Raimund, Johnsson, P., Siano, M., Kukk, E., Rudek, B., Erk, B., Foucar, L., Robert, E., Miron, C., Tono, K., Inubushi, Y., Hatsui, T., Yabashi, M., Yao, M., Santra, R., Ueda, K., Motomura, K., Fukuzawa, H., Son, S-K, Mondal, S., Tachibana, T., Ito, Y., Kimura, M., Nagaya, K., Sakai, T., Matsunami, K., Wada, S., Hayashita, H., Kajikawa, J., Liu, X-J, Feifel, Raimund, Johnsson, P., Siano, M., Kukk, E., Rudek, B., Erk, B., Foucar, L., Robert, E., Miron, C., Tono, K., Inubushi, Y., Hatsui, T., Yabashi, M., Yao, M., Santra, R., and Ueda, K.

Abstract

We have investigated multiphoton multiple ionization of argon and xenon atoms at 5 keV using a new x-ray free electron laser (XFEL) facility, the SPring-8 Angstrom Compact free electron LAser (SACLA) in Japan. The experimental results are compared with the new theoretical results presented here. The absolute fluence of the XFEL pulse has been determined with the help of the calculations utilizing two-photon processes in the argon atom. The high charge states up to +22 observed for Xe in comparison with the calculations point to the occurrence of sequential L-shell multiphoton absorption and of resonance-enabled x-ray multiple ionization.

Published
2013
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153. Deep Inner-Shell Multiphoton Ionization by Intense X-Ray Free-Electron Laser Pulses

Author

Fukuzawa, H., Son, S. -K, Motomura, K., Mondal, S., Nagaya, K., Wada, S., Liu, X. -J, Feifel, Raimund, Tachibana, T., Ito, Y., Kimura, M., Sakai, T., Matsunami, K., Hayashita, H., Kajikawa, J., Johnsson, P., Siano, M., Kukk, E., Rudek, B., Erk, B., Foucar, L., Robert, E., Miron, C., Tono, K., Inubushi, Y., Hatsui, T., Yabashi, M., Yao, M., Santra, R., Ueda, K., Fukuzawa, H., Son, S. -K, Motomura, K., Mondal, S., Nagaya, K., Wada, S., Liu, X. -J, Feifel, Raimund, Tachibana, T., Ito, Y., Kimura, M., Sakai, T., Matsunami, K., Hayashita, H., Kajikawa, J., Johnsson, P., Siano, M., Kukk, E., Rudek, B., Erk, B., Foucar, L., Robert, E., Miron, C., Tono, K., Inubushi, Y., Hatsui, T., Yabashi, M., Yao, M., Santra, R., and Ueda, K.

Abstract

We have investigated multiphoton multiple ionization dynamics of xenon atoms using a new x-ray free-electron laser facility, SPring-8 Angstrom Compact free electron LAser (SACLA) in Japan, and identified that Xen+ with n up to 26 is produced at a photon energy of 5.5 keV. The observed high charge states (n >= 24) are produced via five-photon absorption, evidencing the occurrence of multiphoton absorption involving deep inner shells. A newly developed theoretical model, which shows good agreement with the experiment, elucidates the complex pathways of sequential electronic decay cascades accessible in heavy atoms. The present study of heavy-atom ionization dynamics in high-intensity hard-x-ray pulses makes a step forward towards molecular structure determination with x-ray free-electron lasers.

Published
2013
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154. Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Author

1000020468276, Koyama, T., 1000020423197, Yumoto, H., 1000000353508, Tono, K., Sato, T., 1000060415239, Togashi, T., 1000040506250, Inubushi, Y., 1000090648073, Katayama, T., Kim, J., 1000010423196, Matsuyama, S., 1000030362651, Mimura, H., 1000000372144, Yabashi, M., 1000010174575, Yamauchi, K., 1000030443550, Ohashi, H., 1000020468276, Koyama, T., 1000020423197, Yumoto, H., 1000000353508, Tono, K., Sato, T., 1000060415239, Togashi, T., 1000040506250, Inubushi, Y., 1000090648073, Katayama, T., Kim, J., 1000010423196, Matsuyama, S., 1000030362651, Mimura, H., 1000000372144, Yabashi, M., 1000010174575, Yamauchi, K., 1000030443550, and Ohashi, H.

Abstract

T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377.

Published
2013

155. Multiple photoionization of rare-gas clusters by EUV-FEL at Spring-8

Author

Nagaya, K., Iwayama, H., Yase, S., Sugishima, A., Mizoguchi, Y., Yao, M., Fukuzawa, H., Motomura, K., Yamada, A., Wang, C., Liu, X. -J, Ueda, K., Saito, N., Rudenko, A., Faucer, L., Kurka, M., Kuhnel, K. -U, Ullrich, J., Czasch, A., Dorner, R., Feilfel, Raimund, Piseri, P., Mazza, T., Devetta, M., Coreno, M., Belkacem, A., Nagasono, M., Higashiya, A., Tono, K., Yabashi, M., Ishikawa, T., Ohashi, H., Kimura, H., Togashi, T., Senba, Y., Nagaya, K., Iwayama, H., Yase, S., Sugishima, A., Mizoguchi, Y., Yao, M., Fukuzawa, H., Motomura, K., Yamada, A., Wang, C., Liu, X. -J, Ueda, K., Saito, N., Rudenko, A., Faucer, L., Kurka, M., Kuhnel, K. -U, Ullrich, J., Czasch, A., Dorner, R., Feilfel, Raimund, Piseri, P., Mazza, T., Devetta, M., Coreno, M., Belkacem, A., Nagasono, M., Higashiya, A., Tono, K., Yabashi, M., Ishikawa, T., Ohashi, H., Kimura, H., Togashi, T., and Senba, Y.

Abstract

Multiple photoionization processes of giant rare-gas clusters are investigated in the wavelength region of 51 to 61nm at Spring8. We report here some latest results of our investigation; the frustration of photoionization for giant xenon clusters and the charge transfer in Ar-core Ne-shell clusters.

Published
2012
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156. Doubly resonant three-photon double ionization of Ar atoms induced by an EUV free-electron laser

Author

Gryzlova, E. V., Ma, Ri, Fukuzawa, H., Motomura, K., Yamada, A., Ueda, K., Grum-Grzhimailo, A. N., Kabachnik, N. M., Strakhova, S. I., Rouzee, A., Hundermark, A., Vrakking, M. J. J., Johnsson, Per, Nagaya, K., Yase, S., Mizoguchi, Y., Yao, M., Nagasono, M., Tono, K., Togashi, T., Senba, Y., Ohashi, H., Yabashi, M., Ishikawa, T., Gryzlova, E. V., Ma, Ri, Fukuzawa, H., Motomura, K., Yamada, A., Ueda, K., Grum-Grzhimailo, A. N., Kabachnik, N. M., Strakhova, S. I., Rouzee, A., Hundermark, A., Vrakking, M. J. J., Johnsson, Per, Nagaya, K., Yase, S., Mizoguchi, Y., Yao, M., Nagasono, M., Tono, K., Togashi, T., Senba, Y., Ohashi, H., Yabashi, M., and Ishikawa, T.

Abstract

A mechanism for three-photon double ionization of atoms by extreme-ultraviolet free-electron laser pulses is revealed, where in a sequential process the second ionization step, proceeding via resonant two-photon ionization of ions, is strongly enhanced by the excitation of ionic autoionizing states. In contrast to the conventional model, the mechanism explains the observed relative intensities of photoelectron peaks and their angular dependence in three-photon double ionization of argon.

Published
2011

157. Crossover in the photoionization processes of neon clusters with increasing EUV free-electron-laser intensity

Author

Yase, S., primary, Nagaya, K., additional, Mizoguchi, Y., additional, Yao, M., additional, Fukuzawa, H., additional, Motomura, K., additional, Yamada, A., additional, Ma, Ri, additional, Ueda, K., additional, Saito, N., additional, Nagasono, M., additional, Togashi, T., additional, Tono, K., additional, Yabashi, M., additional, Ishikawa, T., additional, Ohashi, H., additional, and Senba, Y., additional

Published
2013
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160. Resonances in three-photon double ionization of Ar in intense extreme-ultraviolet free-electron laser fields studied by shot-by-shot photoelectron spectroscopy

Author

Hikosaka, Y., primary, Fushitani, M., additional, Matsuda, A., additional, Endo, T., additional, Toida, Y., additional, Shigemasa, E., additional, Nagasono, M., additional, Tono, K., additional, Togashi, T., additional, Yabashi, M., additional, Ishikawa, T., additional, and Hishikawa, A., additional

Published
2013
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162. Photoelectron angular distributions for the two-photon sequential double ionization of xenon by ultrashort extreme ultraviolet free electron laser pulses

Author

Mondal, S, primary, Ma, R, additional, Motomura, K, additional, Fukuzawa, H, additional, Yamada, A, additional, Nagaya, K, additional, Yase, S, additional, Mizoguchi, Y, additional, Yao, M, additional, Rouzée, A, additional, Hundertmark, A, additional, Vrakking, M J J, additional, Johnsson, P, additional, Nagasono, M, additional, Tono, K, additional, Togashi, T, additional, Senba, Y, additional, Ohashi, H, additional, Yabashi, M, additional, Ishikawa, T, additional, Sazhina, I P, additional, Fritzsche, S, additional, Kabachnik, N M, additional, and Ueda, K, additional

Published
2013
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163. Sequential multiphoton multiple ionization of atomic argon and xenon irradiated by x-ray free-electron laser pulses from SACLA

Author

Motomura, K, primary, Fukuzawa, H, additional, Son, S-K, additional, Mondal, S, additional, Tachibana, T, additional, Ito, Y, additional, Kimura, M, additional, Nagaya, K, additional, Sakai, T, additional, Matsunami, K, additional, Wada, S, additional, Hayashita, H, additional, Kajikawa, J, additional, Liu, X-J, additional, Feifel, R, additional, Johnsson, P, additional, Siano, M, additional, Kukk, E, additional, Rudek, B, additional, Erk, B, additional, Foucar, L, additional, Robert, E, additional, Miron, C, additional, Tono, K, additional, Inubushi, Y, additional, Hatsui, T, additional, Yabashi, M, additional, Yao, M, additional, Santra, R, additional, and Ueda, K, additional

Published
2013
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164. Photoelectron angular distributions for the two-photon ionization of helium by ultrashort extreme ultraviolet free-electron laser pulses

Author

Ma, R, primary, Motomura, K, additional, Ishikawa, K L, additional, Mondal, S, additional, Fukuzawa, H, additional, Yamada, A, additional, Ueda, K, additional, Nagaya, K, additional, Yase, S, additional, Mizoguchi, Y, additional, Yao, M, additional, Rouze, A, additional, Hundermark, A, additional, Vrakking, M J J, additional, Johnsson, P, additional, Nagasono, M, additional, Tono, K, additional, Togashi, T, additional, Senba, Y, additional, Ohashi, H, additional, Yabashi, M, additional, and Ishikawa, T, additional

Published
2013
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165. Deep Inner-Shell Multiphoton Ionization by Intense X-Ray Free-Electron Laser Pulses

Author

Fukuzawa, H., primary, Son, S.-K., additional, Motomura, K., additional, Mondal, S., additional, Nagaya, K., additional, Wada, S., additional, Liu, X.-J., additional, Feifel, R., additional, Tachibana, T., additional, Ito, Y., additional, Kimura, M., additional, Sakai, T., additional, Matsunami, K., additional, Hayashita, H., additional, Kajikawa, J., additional, Johnsson, P., additional, Siano, M., additional, Kukk, E., additional, Rudek, B., additional, Erk, B., additional, Foucar, L., additional, Robert, E., additional, Miron, C., additional, Tono, K., additional, Inubushi, Y., additional, Hatsui, T., additional, Yabashi, M., additional, Yao, M., additional, Santra, R., additional, and Ueda, K., additional

Published
2013
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167. Beamline for X-ray Free Electron Laser of SACLA

Author

Tono, K, primary, Inubushi, Y, additional, Sato, T, additional, Togashi, T, additional, Ohashi, H, additional, Kimura, H, additional, Takahashi, S, additional, Takeshita, K, additional, Tomizawa, H, additional, Goto, S, additional, and Yabashi, M, additional

Published
2013
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169. Micro-focusing of hard x-ray free electron laser radiation using Kirkpatrick-Baez mirror system

Author

Yumoto, H, primary, Mimura, H, additional, Matsuyama, S, additional, Koyama, T, additional, Hachisu, Y, additional, Kimura, T, additional, Yokoyama, H, additional, Kim, J, additional, Sano, Y, additional, Tono, K, additional, Togashi, T, additional, Inubushi, Y, additional, Sato, T, additional, Tanaka, T, additional, Yabashi, M, additional, Ohashi, H, additional, Ohmori, H, additional, Ishikawa, T, additional, and Yamauchi, K, additional

Published
2013
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171. Second Harmonic Generation at X-Ray Wavelengths

Author

Shwartz, S., primary, Fuch, M., additional, Hastings, J. B., additional, Inubushi, Yuichi, additional, Ishikawa, T., additional, Katayama, T., additional, Reis, D. A., additional, Sato, T., additional, Tono, K., additional, Yabashi, M., additional, and Harris, S. E., additional

Published
2013
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172. Multiple photoionization of rare-gas clusters by EUV-FEL at Spring-8

Author

Nagaya, K, primary, Iwayama, H, additional, Yase, S, additional, Sugishima, A, additional, Mizoguchi, Y, additional, Yao, M, additional, Fukuzawa, H, additional, Motomura, K, additional, Yamada, A, additional, Wang, C, additional, Liu, X-J, additional, Ueda, K, additional, Saito, N, additional, Rudenko, A, additional, Faucer, L, additional, Kurka, M, additional, Kuhnel, K-U, additional, Ullrich, J, additional, Czasch, A, additional, Dorner, R, additional, Feilfel, R, additional, Piseri, P, additional, Mazza, T, additional, Devetta, M, additional, Coreno, M, additional, Belkacem, A, additional, Nagasono, M, additional, Higashiya, A, additional, Tono, K, additional, Yabashi, M, additional, Ishikawa, T, additional, Ohashi, H, additional, Kimura, H, additional, Togashi, T, additional, and Senba, Y, additional

Published
2012
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173. Competition of sequential and direct paths in two-photon ionization of He

Author

Ishikawa, Kenichi L, primary, Ma, Ri, additional, Fukuzawa, H, additional, Motomura, K, additional, Yamada, A, additional, Ueda, K, additional, Nagaya, K, additional, Yase, S, additional, Mizoguchi, Y, additional, Yao, M, additional, Rouzee, A, additional, Hundermark, A, additional, Vrakking, M, additional, Johnsson, P, additional, Nagasono, M, additional, Togashi, T, additional, Tono, K, additional, Senba, Y, additional, Ohashi, H, additional, Yabashi, M, additional, and Ishikawa, T, additional

Published
2012
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174. Pulse energy measurement at the hard x-ray laser in Japan

Author

Kato, M., primary, Tanaka, T., additional, Kurosawa, T., additional, Saito, N., additional, Richter, M., additional, Sorokin, A. A., additional, Tiedtke, K., additional, Kudo, T., additional, Tono, K., additional, Yabashi, M., additional, and Ishikawa, T., additional

Published
2012
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175. Enhanced Nonlinear Double Excitation of He in Intense Extreme Ultraviolet Laser Fields

Author

Hishikawa, A., primary, Fushitani, M., additional, Hikosaka, Y., additional, Matsuda, A., additional, Liu, C.-N., additional, Morishita, T., additional, Shigemasa, E., additional, Nagasono, M., additional, Tono, K., additional, Togashi, T., additional, Ohashi, H., additional, Kimura, H., additional, Senba, Y., additional, Yabashi, M., additional, and Ishikawa, T., additional

Published
2011
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176. Doubly resonant three-photon double ionization of Ar atoms induced by an EUV free-electron laser

Author

Gryzlova, E. V., primary, Ma, Ri, additional, Fukuzawa, H., additional, Motomura, K., additional, Yamada, A., additional, Ueda, K., additional, Grum-Grzhimailo, A. N., additional, Kabachnik, N. M., additional, Strakhova, S. I., additional, Rouzée, A., additional, Hundermark, A., additional, Vrakking, M. J. J., additional, Johnsson, P., additional, Nagaya, K., additional, Yase, S., additional, Mizoguchi, Y., additional, Yao, M., additional, Nagasono, M., additional, Tono, K., additional, Togashi, T., additional, Senba, Y., additional, Ohashi, H., additional, Yabashi, M., additional, and Ishikawa, T., additional

Published
2011
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178. Ablation of insulators under the action of short pulses of X-ray plasma lasers and free-electron lasers

Author

Inogamov, N. A., primary, Zhakhovsky, V. V., additional, Faenov, A. Ya., additional, Fortov, V. E., additional, Kato, Y., additional, Shepelev, V. V., additional, Fukuda, Y., additional, Kishimoto, M., additional, Nagasono, M., additional, Ohashi, H., additional, Senda, Y., additional, Yabashi, M., additional, Tono, K., additional, Tanaka, M., additional, Skobelev, I. Yu., additional, Pikuz, T. A., additional, Anisimov, S. I., additional, Petrov, Yu. V., additional, Ishino, M., additional, Ishikawa, T., additional, Togashi, T., additional, Nishikino, M., additional, Khokhlov, V. A., additional, Kando, M., additional, and Kawachi, T., additional

Published
2011
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179. Two-Temperature Warm Dense Matter Produced by Ultrashort Extreme Vacuum Ultraviolet-Free Electron Laser (EUV-FEL) Pulse

Author

Inogamov, N. A., primary, Faenov, A. Ya., additional, Zhakhovsky, V. V., additional, Pikuz, T. A., additional, Skobelev, I. Yu., additional, Petrov, Yu. V., additional, Khokhlov, V. A., additional, Shepelev, V. V., additional, Anisimov, S. I., additional, Fortov, V. E., additional, Fukuda, Y., additional, Kando, M., additional, Kawachi, T., additional, Nagasono, M., additional, Ohashi, H., additional, Yabashi, M., additional, Tono, K., additional, Senda, Y., additional, Togashi, T., additional, and Ishikawa, T., additional

Published
2011
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180. Three-photon double ionization of Ar studied by photoelectron spectroscopy using an extreme ultraviolet free-electron laser: manifestation of resonance states of an intermediate Ar+ion

Author

Miyauchi, N, primary, Adachi, J, additional, Yagishita, A, additional, Sako, T, additional, Koike, F, additional, Sato, T, additional, Iwasaki, A, additional, Okino, T, additional, Yamanouchi, K, additional, Midorikawa, K, additional, Yamakawa, K, additional, Kannari, F, additional, Nakano, H, additional, Nagasono, M, additional, Tono, K, additional, Yabashi, M, additional, Ishikawa, T, additional, Togashi, T, additional, Ohashi, H, additional, Kimura, H, additional, and Senba, Y, additional

Published
2011
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181. Multiphoton Double Ionization of Ar in Intense Extreme Ultraviolet Laser Fields Studied by Shot-by-Shot Photoelectron Spectroscopy

Author

Hikosaka, Y., primary, Fushitani, M., additional, Matsuda, A., additional, Tseng, C.-M., additional, Hishikawa, A., additional, Shigemasa, E., additional, Nagasono, M., additional, Tono, K., additional, Togashi, T., additional, Ohashi, H., additional, Kimura, H., additional, Senba, Y., additional, Yabashi, M., additional, and Ishikawa, T., additional

Published
2010
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182. Inhomogeneous charge redistribution in Xe clusters exposed to an intense extreme ultraviolet free electron laser

Author

Iwayama, H, primary, Sugishima, A, additional, Nagaya, K, additional, Yao, M, additional, Fukuzawa, H, additional, Motomura, K, additional, Liu, X-J, additional, Yamada, A, additional, Wang, C, additional, Ueda, K, additional, Saito, N, additional, Nagasono, M, additional, Tono, K, additional, Yabashi, M, additional, Ishikawa, T, additional, Ohashi, H, additional, Kimura, H, additional, and Togashi, T, additional

Published
2010
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183. Ablation by short optical and x-ray laser pulses

Author

Inogamov, N. A., primary, Anisimov, S. I., additional, Zhakhovsky, V. V., additional, Faenov, A. Ya., additional, Petrov, Yu. V., additional, Khokhlov, V. A., additional, Fortov, V. E., additional, Agranat, M. B., additional, Ashitkov, S. I., additional, Komarov, P. S., additional, Skobelev, I. Yu., additional, Kato, Y., additional, Pikuz, T. A., additional, Shepelev, V. V., additional, Fukuda, Y., additional, Tanaka, M., additional, Kishimoto, M., additional, Ishino, M., additional, Nishikino, M., additional, Kando, M., additional, Kawachi, T., additional, Nagasono, M., additional, Ohashi, H., additional, Yabashi, M., additional, Tono, K., additional, Senba, Y., additional, Togashi, T., additional, and Ishikawa, T., additional

Published
2010
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184. Photoelectron spectroscopy of sequential three-photon double ionization of Ar irradiated by EUV free-electron laser pulses

Author

Fukuzawa, H, primary, Gryzlova, E V, additional, Motomura, K, additional, Yamada, A, additional, Ueda, K, additional, Grum-Grzhimailo, A N, additional, Strakhova, S I, additional, Nagaya, K, additional, Sugishima, A, additional, Mizoguchi, Y, additional, Iwayama, H, additional, Yao, M, additional, Saito, N, additional, Piseri, P, additional, Mazza, T, additional, Devetta, M, additional, Coreno, M, additional, Nagasono, M, additional, Tono, K, additional, Yabashi, M, additional, Ishikawa, T, additional, Ohashi, H, additional, Kimura, H, additional, Togashi, T, additional, and Senba, Y, additional

Published
2010
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185. Time-resolved photoelectron imaging using a femtosecond UV laser and a VUV free-electron laser

Author

Liu, S. Y., primary, Ogi, Y., additional, Fuji, T., additional, Nishizawa, K., additional, Horio, T., additional, Mizuno, T., additional, Kohguchi, H., additional, Nagasono, M., additional, Togashi, T., additional, Tono, K., additional, Yabashi, M., additional, Senba, Y., additional, Ohashi, H., additional, Kimura, H., additional, Ishikawa, T., additional, and Suzuki, T., additional

Published
2010
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186. Note: Measurement of saturable absorption by intense vacuum ultraviolet free electron laser using fluorescent material

Author

Inubushi, Y., primary, Yoneda, H., additional, Higashiya, A., additional, Ishikawa, T., additional, Kimura, H., additional, Kumagai, T., additional, Morimoto, S., additional, Nagasono, M., additional, Ohashi, H., additional, Sato, F., additional, Tanaka, T., additional, Togashi, T., additional, Tono, K., additional, Yabashi, M., additional, Yamaguchi, Y., additional, and Kodama, R., additional

Published
2010
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187. Calibration of a Gas Monitor Detector using a Cryogenic Radiometer for Measuring the Radiant Power of Extreme Ultraviolet Free Electron Laser at SPring-8

Author

Kato, M., primary, Nagasono, M., additional, Saito, N., additional, Tanaka, T., additional, Morishita, Y., additional, Kimura, H., additional, Ohashi, H., additional, Yabashi, M., additional, Tono, K., additional, Togashi, T., additional, Higashiya, A., additional, Ishikawa, T., additional, Garrett, R., additional, Gentle, I., additional, Nugent, K., additional, and Wilkins, S., additional

Published
2010
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188. Calibration of a Gas Monitor Detector using a Cryogenic Radiometer for Measuring the Radiant Power of Extreme Ultraviolet Free Electron Laser at SPring-8.

Author

Kato, M., Nagasono, M., Saito, N., Tanaka, T., Morishita, Y., Kimura, H., Ohashi, H., Yabashi, M., Tono, K., Togashi, T., Higashiya, A., and Ishikawa, T.

Subjects
RADIOMETERS, PARTICLES (Nuclear physics), DETECTORS, FREE electron lasers, ENGINEERING instruments
Abstract

A gas monitor detector was calibrated to a cryogenic radiometer for measuring the radiant power of EUV-FEL (extreme ultraviolet free electron laser) at the wavelengths of 51 nm and 61 nm. The output signals of the gas monitor detector showed good linearity against the radiant power measured by the radiometer in the range from 6 μW to 160 μW. The calibration coefficients of the gas monitor detector are determined with the relative standard uncertainty of around 5 %. [ABSTRACT FROM AUTHOR]

Published
2010
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193. Photoelectron diffraction study of the Si(001)c(4×4)–C surface

Author

Kosugi, R., primary, Abukawa, T., additional, Shimomura, M., additional, Sumitani, S., additional, Yeom, H.-W., additional, Hanano, T., additional, Tono, K., additional, Suzuki, S., additional, Sato, S., additional, Ohta, T., additional, Kono, S., additional, and Takakuwa, Y., additional

Published
1999
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198. Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Author

Niozu, A., Kumagai, Y., Nishiyama, T., Fukuzawa, H., Motomura, K., Bucher, M., Ito, Y., Takanashi, T., Asa, K., Sato, Y., You, D., Li, Y., Ono, T., Kukk, E., Miron, C., Neagu, L., Callegari, C., Di Fraia, M., Rossi, G., Galli, D. E., Pincelli, T., Colombo, A., Kameshima, T., Joti, Y., Hatsui, T., Owada, S., Katayama, T., Togashi, T., Tono, K., Yabashi, M., Matsuda, K., Bostedt, C., Nagaya, K., and Ueda, K.

Subjects
Physics::Optics
Abstract

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

199. Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Author

Koyama, T., Yumoto, H., Tono, K., Sato, T., Togashi, T., Inubushi, Y., Katayama, T., Kim, J., Matsuyama, S., Mimura, H., Yabashi, M., Yamauchi, K., Ohashi, H., Koyama, T., Yumoto, H., Tono, K., Sato, T., Togashi, T., Inubushi, Y., Katayama, T., Kim, J., Matsuyama, S., Mimura, H., Yabashi, M., Yamauchi, K., and Ohashi, H.

Abstract

T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377.

200. Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Author

Koyama, T., Yumoto, H., Tono, K., Sato, T., Togashi, T., Inubushi, Y., Katayama, T., Kim, J., Matsuyama, S., Mimura, H., Yabashi, M., Yamauchi, K., Ohashi, H., Koyama, T., Yumoto, H., Tono, K., Sato, T., Togashi, T., Inubushi, Y., Katayama, T., Kim, J., Matsuyama, S., Mimura, H., Yabashi, M., Yamauchi, K., and Ohashi, H.

Abstract

T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377.

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