151. Sub-monolayer percolation of pentacene on rough parylene-C dielectrics.
- Author
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Werkmeister, Franz X., Noever, Simon J., and Nickel, Bert A.
- Subjects
- *
MONOMOLECULAR films , *PERCOLATION , *PENTACENE , *PARYLENE , *DIELECTRICS , *SURFACE roughness - Abstract
We determine the evolution of electrical characteristics of pentacene transistors on rough parylene-C substrates during the physical vapor deposition of pentacene. Here, the changing field effect transistor characteristics are recorded in real time. The root mean square (rms) roughness of the parylene-C dielectric is 7 nm, which is much larger than the size of the pentacene molecule (1.5 nm). In spite of this huge roughness, we observe a source-drain current before nominal film thickness of a monolayer equivalent, i.e. pentacene is able to percolate for sub-monolayers, as in the case for very smooth substrates. This suggests that the pentacene film is able to conformally cover the rough substrate. [ABSTRACT FROM AUTHOR]
- Published
- 2015
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