101. Leaf Area Meter Development using Photovoltaic Panel and Testing
- Author
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Lester O Pordesimo, Alvin R. Womac, C. Igathinathane, B. Chennakesavulu, and K. Manohar
- Subjects
Scanner ,food.ingredient ,food ,Planimeter ,Photovoltaic system ,Flashlight ,Projected area ,Electronic engineering ,Environmental science ,Custard-apple ,Multimeter ,Remote sensing ,Voltage - Abstract
A simple and practical leaf area meter based on a photovoltaic (PV) panel was developed, and tested. Components of the developed PV leaf area meter are PV panel as sensor, wooden cabinet as enclosure, flashlight as light source, and commercial digital multimeter for voltage measurement. Variation in the voltage generated from the PV panel due to obstruction of incident radiation by sample is the principle of the projected area measurement. Voltage generation from the PV panel varies inversely with the extent of obstruction. Conversely, voltage generated varies directly with sample area when corresponding panel surface is exposed to incident radiation. Variations due to reduction in light source intensity were accounted by non-dimensionalizing the voltage readings based on the beginning and the end of experiments. The PV leaf area meter performance was evaluated using cardboard cutouts of various geometrical shapes of known areas and the voltage generated had good correlation (r = 0.9911) with actual sample areas. Linear fits adequately modeled (R2 > 0.98) the areas from non-dimensional voltages. Measurements with leaf samples from mango, sapodilla, guava, custard apple, and cotton were compared among the existing graphical (considered as reference), scanner based electronic leaf area meter, and digital planimeter methods. Digital planimeter produced better performance (R2 = 0.9996) than scanner based electronic leaf area meter (R2 = 0.9979). Linear regression calibration equation based on direct leaf samples on the PV panel (R2 = 0.9953) gave slightly better performance than leaf samples with glass cover (R2 = 0.9834); however, the latter gave better predictions than the former in testing with additional leaf samples. As leaves were flattened by the glass cover, projected area reduction effect of leaf surface curvature was minimized and the true leaf area was measured. Hence, the measurement procedure with glass cover on samples was recommended. PV leaf area meter costs only 3.8% of the scanner- based electronic leaf area meter and 14.3% of the digital planimeter prices (2001 price information). The developed PV leaf area meter had a mode of operation similar to a commercial electronic leaf area meter, yielded quick and reliable results, and was highly cost effective.
- Published
- 2006