101. Interfacial reaction during MOCVD growth revealed by in situ ARXPS
- Author
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Rémi Chassagnon, Luc Imhoff, A. Brevet, M.C. Marco de Lucas, Bruno Domenichini, Sylvie Bourgeois, Laboratoire de Recherche sur la Réactivité des Solides ( LRRS ), Université de Bourgogne ( UB ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Interdisciplinaire Carnot de Bourgogne ( LICB ), Laboratoire Interdisciplinaire Carnot de Bourgogne (LICB), Université de Bourgogne (UB)-Centre National de la Recherche Scientifique (CNRS), and Laboratoire de Recherche sur la Réactivité des Solides (LRRS)
- Subjects
Materials science ,Silicon ,thickness measurement ,thin film ,Analytical chemistry ,chemistry.chemical_element ,ARXPS ,02 engineering and technology ,Chemical vapor deposition ,01 natural sciences ,X-ray photoelectron spectroscopy ,0103 physical sciences ,Materials Chemistry ,TiO2 ,Thin film ,Silicon oxide ,High-resolution transmission electron microscopy ,010302 applied physics ,Bilayer ,[CHIM.MATE]Chemical Sciences/Material chemistry ,Surfaces and Interfaces ,General Chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Surfaces, Coatings and Films ,chemistry ,[ CHIM.MATE ] Chemical Sciences/Material chemistry ,MOCVD ,interface ,Wetting ,0210 nano-technology - Abstract
International audience; Angle-resolved X-ray photoelectron spectroscopy (ARXPS) experiments were performed to study in situ the reaction at the film–substrate interface during metal organic chemical vapor deposition (MOCVD) growth of TiO2 thin films deposited on the silicon substrate. The in-depth distribution of chemical species was determined using several ARXPS thickness calculation models considering either single or bilayer systems. By the comparison of two single-layermodels, the presence of a second layer composed of silicon oxidewas evidenced. High-resolution transmission electron microscopy (HRTEM) observations confirmed the stratification of the film in two layers, as well as the perfect wetting of the surface by TiO2, irrespective of the model used. The contribution of the ARXPS bilayer model was demonstrated by the agreement of the values of film thickness obtained by both techniques. Nevertheless, the correlation between each layer's thickness was only possible by taking into account chemical species mixing. Indeed, the presence of oxidised silicon in the upper TiO2 layer, in addition to that of the SiOx interlayer, has to be considered to interpret ARXPS results in a correct way.
- Published
- 2006