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101. A Lower Bound on Greedy Embedding in Euclidean Plane

102. A New Result on [k,k + 1]-Factors Containing Given Hamiltonian Cycles

103. Reliable Resource Searching in P2P Networks

104. Thermal-magnetic noise measurement of spin-torque effects on ferromagnetic resonance in MgO-based magnetic tunnel junctions

105. On Succinctness of Geometric Greedy Routing in Euclidean Plane

106. Spin-torque driven ferromagnetic resonance in a nonlinear regime

107. Enhanced magnetoresistance in sintered granular manganite/insulator systems

108. A statistical study of magnetic tunnel junctions for high-density spin torque transfer-MRAM (STT-MRAM)

109. Bias and angular dependence of spin-transfer torque in magnetic tunnel junctions

110. Spin Angular Momentum Transfer in Magnetoresistive Nanojunctions

111. Spin-torque driven ferromagnetic resonance of Co/Ni synthetic layers in spin valves

112. Measurement of the Spin-Transfer-Torque Vector in Magnetic Tunnel Junctions

113. Checking Value-Sensitive Data Structures in Sublinear Space

114. Finite size effects on spin-torque driven ferromagnetic resonance in spin-valves with a Co/Ni synthetic free layer

115. Temperature and bias dependence of magnetoresistance in doped manganite thin film trilayer junctions

116. Investigation of granular films composed of interdispersed La1/3Ca2/3MnO3 particles and metallic Au particles

117. Switching speed distribution of spin-torque-induced magnetic reversal

118. Temperature Dependence of Current-Induced Magnetization Switching in Spin Valves with a Ferrimagnetic CoGd Free Layer

119. Thermal stress evaluation of a PCRAM material Ge2Sb2Te5

120. Spin Transfer Switching in sub-100nm Magnetic Tunnel Junctions

121. The rainbow skip graph

122. Spin-transfer in bilayer magnetic nanopillars at high fields as a function of free layer thickness

123. Epitaxial La0.67Sr0.33MnO3 magnetic tunnel junctions

124. Temperature dependent, non-ohmic magnetoresistance in doped perovskite manganate trilayer junctions

125. The Skip Quadtree: A Simple Dynamic Data Structure for Multidimensional Data

126. Bipolar high-field excitations inCo∕Cu∕Conanopillars

127. Ferromagnetic resonance study of polycrystalline Cobalt ultrathin films

128. Observation of large low‐field magnetoresistance in trilayer perpendicular transport devices made using doped manganate perovskites

129. Does magnetization in thin‐film manganates suggest the existence of magnetic clusters?

130. Half-integer flux quantum effect in cuprate superconductors – a probe of pairing symmetry

131. Current-induced effective magnetic fields inCo∕Cu∕Conanopillars

132. Spin angular momentum transfer in a current-perpendicular spin-valve nanomagnet

133. Room-temperature ferromagnetic nanotubes controlled by electron or hole doping

134. Current-driven excitations in magnetic multilayer nanopillars from 4.2 K to 300 K

135. Current-induced excitations in single cobalt ferromagnetic layer nanopillars

136. Efficient Tree-Based Revocation in Groups of Low-State Devices

137. Growth and giant magnetoresistance properties of La‐deficient LaxMnO3−δ (0.67≤x≤1) films

138. Transport and magnetic properties of in situ grown thin‐film La–Y–Ca–Mn–O

139. Colossal magnetoresistance of 1 000 000‐fold magnitude achieved in the antiferromagnetic phase of La1−xCaxMnO3

140. Epitaxial planarization of patterned yttria‐stabilized zirconia substrates for multilayer structures

141. Flux dam, a method to reduce extra low frequency noise when a superconducting magnetometer is exposed to a magnetic field

142. High‐resolution scanning SQUID microscope

143. Current-driven excitations in symmetric magnetic nanopillars

144. Current-Induced Magnetization Reversal in High Magnetic Fields inCo/Cu/CoNanopillars

145. Time-resolved reversal of spin-transfer switching in a nanomagnet

146. Effects of radio frequency radiation on the dc SQUID

147. High‐Tc, multilevel edge junction superconducting quantum interference devices with SrTiO3 barriers operating at 77 K

148. A high-density 6.9 sq. μm embedded SRAM cell in a high-performance 0.25 μm-generation CMOS logic technology

149. 200 mm process integration for a 0.15 μm channel-length CMOS technology using mixed X-ray/optical lithography

150. Improved process for high‐Tcsuperconducting step‐edge junctions

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