Search

Your search keyword '"J. W. Morris"' showing total 416 results

Search Constraints

Start Over You searched for: Author "J. W. Morris" Remove constraint Author: "J. W. Morris"
416 results on '"J. W. Morris"'

Search Results

101. Observations of microstructural coarsening in micro flip-chip solder joints

102. The ideal strength of tungsten

103. Au−Ni−Sn intermetallic phase relationships in eutectic Pb−Sn solder formed on Ni/Au metallization

104. Detection of plastic deformation gradients in steel using scanning SQUID microscopy

105. Precipitation and hardening in Al–Si–Ge

106. Observation of magnetic gradients in stainless steel with a high-Tc superconducting quantum interference device microscope

107. Formation of residual stresses owing to tension levelling of cold rolled strip

108. Advances in Physical Metallurgy and Processing of Steels. The Limits of Strength and Toughness in Steel

109. The internal stability of an elastic solid

110. Catalyzed precipitation in Al-Cu-Si

111. Inhibiting growth of the Au0.5Ni0.5Sn4 intermetallic layer in Pb-Sn solder joints reflowed on Au/Ni metallization

112. The microstructure of ultrafine eutectic Au-Sn solder joints on Cu

113. Scanning SQUID microscope differentiation of ferromagnetic steel phases

114. Cyclic behaviour concerning the response of material subjected to tension levelling

115. The compatibility of crack closure and Kmax dependent models of fatigue crack growth

116. High-T/sub c/ SQUID microscope study of the effects of microstructure and deformation on the remanent magnetization of steel

117. Ideal Shear Strengths of fcc Aluminum and Copper

118. The creep behavior of In-Ag eutectic solder joints

119. Fabrication of Magnetically Graded Material by Rolling Deformation of Wedge-shaped 304 Stainless Steel

120. Thermal Mechanisms of Grain and Packet Refinement in a Lath Martensitic Steel

122. Dislocation core radii near elastic stability limits

123. M2C precipitates in isothermal tempering of high Co-Ni secondary hardening steel

124. Effect of post‐pattern annealing on the grain structure and reliability of Al‐based interconnects

125. Computer simulation of reversible martensitic transformations

126. The metallurgical control of electromigration failure in narrow conducting lines

127. Effect of current reversal on the failure mechanism of Al-Cu-Si narrow interconnects

128. Microstructure and cleavage in lath martensitic steels

129. The role of Cu-Sn intermetallics in wettability degradation

130. Initiation and growth of small fatigue cracks in a Ni-base superalloy

132. Phonons and phase stability in Ti-V approximants to gum metal

133. Substructure formation during plastic deformation

134. The effect of substrate on the microstructure and creep of eutectic In-Sn

135. Intermetallic phase formation in thin solid-liquid diffusion couples

136. The effect of gold-nickel metallization microstructure on fluxless soldering

137. The effect of low gold concentrations on the creep of eutectic tin-lead joints

138. Microstructural development of eutectic Bi-Sn and eutectic In-Sn during high temperature deformation

139. Influence of microstructure on the resistivity of Al‐Cu‐Si thin‐film interconnects

140. The creep properties of lead-free solder joints

141. Stress concentration due to a hemispherical surface inclusion

142. Computer simulation of martensitic transformations in constrained, two-dimensional crystals under external stress

143. The mechanism of electromigration failure of narrow Al‐2Cu‐1Si thin‐film interconnects

144. The growth of small fatigue cracks in A286 steel

145. Quantitativein situnanoindentation in an electron microscope

146. Precipitation and aging in Al-Si-Ge-Cu

147. Spreading of dislocation cores in elastically anisotropic body-centered-cubic materials: The case of gum metal

148. Computer simulation of microstructure Development during a Martensitic Transformation

149. Strain-induced shape changes of cubic precipitates in a cubic matrix with positive anisotropy

150. The influence of Cu precipitation on electromigration failure in Al‐Cu‐Si

Catalog

Books, media, physical & digital resources