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102. Quantitative interpretation of the magnetoresistive response (amplitude and shape) of spin valves with synthetic antiferromagnetic pinned layers

103. Integration of Tb/Co multilayers within optically switchable perpendicular magnetic tunnel junctions

106. Perpendicular shape anisotropy spin transfer torque-MRAM: determination of pillar tilt angle from 3D Stoner–Wohlfarth astroid analysis

113. Focused Kerr measurements on patterned arrays of exchange biased square dots

114. Non-local signal and noise in T-shape lateral spin-valve structures

117. Integration of Tb/Co multilayers within optically switchable perpendicular magnetic tunnel junctions

120. FeMn Exchange biased storage layer for thermally assisted MRAM

122. Direct imaging of thermally-activated grain-boundary diffusion in Cu/Co/IrMn/Pt exchange-bias structures using atom-probe tomography.

123. Perpendicular magnetic anisotropy at Co/AlOx interface

124. Towards high density STT-MRAM at sub-20nm nodes

128. Exchange bias in annealed [Pt/Co]/NiFe systems

136. Thermally assisted switching in exchange-biased storage layer magnetic tunnel junctions

137. Orientational dependence of exchange anisotropy of Mn-Ir/Co-Fe epitaxial bilayers

138. Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography

139. Thermal stability of pinned synthetic ferrimagnets with perpendicular magnetic anisotropy

141. Current driven magnetization dynamics of a self-polarised synthetic ferrimagnet.

142. Exchange-biased spin valves with perpendicular magnetic anisotropy based on (Co/Pt) multilayers

143. Magnetization reversal dynamics in exchange-coupled NiO-Co bilayers

144. Effect of scattering at lateral edges of the current-perpendicular-to plane giant magnetoresistance of submicronic pillars

148. Thermal relaxation of the pinned layer magnetization in NiO spin valves

149. Temperature Variation of Magnetic Anisotropy in Pt / Co / AlO x Trilayers

150. Comparison of computed amplitudes of magnetoresistance in spin-valve structures with wafer probe measurements

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