983 results on '"Cheng-Wen Wu"'
Search Results
102. An Enhanced SRAM BISR Design with Reduced Timing Penalty.
103. A Built-In Self-Repair Scheme for NOR-Type Flash Memory.
104. A network security processor design based on an integrated SOC design and test platform.
105. An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement.
106. A systematic approach to reducing semiconductor memory test time in mass production.
107. Design and test of a scalable security processor.
108. A configurable AES processor for enhanced security.
109. Flash Memory Die Sort by a Sample Classification Method.
110. Flash Memory Built-In Self-Diagnosis with Test Mode Control.
111. A BIST Scheme for FPGA Interconnect Delay Faults.
112. MRAM Defect Analysis and Fault Modeli.
113. Failure Factor Based Yield Enhancement for SRAM Designs.
114. An Application-Independent Delay Testing Methodology for Island-Style FPGA.
115. A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
116. SRAM delay fault modeling and test algorithm development.
117. On Test and Diagnostics of Flash Memories.
118. Fail Pattern Identification for Memory Built-In Self-Repair.
119. A Signa-Delta Modulation Based Analog BIST System with a Wide Bandwidth Fifth-Order Analog Response Extractor for Diagnosis Purpose.
120. A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy.
121. Fault Pattern Oriented Defect Diagnosis for Memories.
122. FAME: A Fault-Pattern Based Memory Failure Analysis Framework.
123. Combinational circuit fault diagnosis using logic emulation.
124. Design of a scalable RSA and ECC crypto-processor.
125. Defect Oriented Fault Analysis for SRAM.
126. A Processor-Based Built-In Self-Repair Design for Embedded Memories.
127. Test and Diagnosis of Word-Oriented Multiport Memories.
128. Diagonal Test and Diagnostic Schemes for Flash Memorie.
129. Flash Memory Built-In Self-Test Using March-Like Algorithm.
130. A Hierarchical Test Scheme for System-On-Chip Designs.
131. RAMSES-FT: A Fault Simulator for Flash Memory Testing and Diagnostics.
132. Testing and Diagnosing Embedded Content Addressable Memories.
133. Can IOT make semiconductor great again?
134. A Profit Evaluation System (PES) for logic cores at early design stage.
135. March-based RAM diagnosis algorithms for stuck-at and coupling faults.
136. RSA cryptosystem design based on the Chinese remainder theorem.
137. Processor-programmable memory BIST for bus-connected embedded memories.
138. Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip.
139. Memory fault diagnosis by syndrome compression.
140. Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories.
141. Simulation-Based Test Algorithm Generation and Port Scheduling for Multi-Port Memories.
142. Is 3D integration an opportunity or just a hype?
143. Use of Palliative Chemo- and Radiotherapy at the End of Life in Patients With Cancer: A Retrospective Cohort Study
144. Error Catch and Analysis for Semiconductor Memories Using March Tests.
145. Built-in self-test and fault diagnosis for lookup table FPGAs.
146. Radix-4 modular multiplication and exponentiation algorithms for the RSA public-key cryptosystem.
147. An FPGA-based re-configurable functional tester for memory chips.
148. A built-in self-test and self-diagnosis scheme for embedded SRAM.
149. A waveform simulator based on Boolean process.
150. Cost and Benefit Models for Logic and Memory BIST.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.