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263 results on '"BAO Yi-wang"'

112. Helium-Related Defect Evolution in Titanium Films by Slow Positron Beam Analysis

Author

Bing Zhou, Ai-Hong Deng, Bao-Yi Wang, Qing Hou, Kang Wang, Yulu Zhou, Yue Li, Li-Qun Shi, and Xiu-Bo Qin

Subjects
Diffraction, Materials science, Argon, Positron beam, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Sputter deposition, law.invention, Elastic recoil detection, Condensed Matter::Materials Science, chemistry, law, Physics::Atomic and Molecular Clusters, Crystallization, Helium, Titanium
Abstract

Various helium-containing titanium films were deposited on Si substrates by magnetron sputtering under different helium/argon (He/Ar) ambiances. Helium concentrations and corresponding depth profiles in the Ti films are obtained by elastic recoil detection analysis (ERDA). X-ray diffraction (XRD) measurements are carried out to evaluate the crystallization of the titanium films. Vacancy-type defects and their depth profiles were revealed by slow positron beam analysis (SPBA). It is found that the defect-characteristic parameter S rises with the increment of the He/Ar flow ratios. The variation of.. indicates the formation and evolution of various He-related defects, with uniform distribution into the depth around 400 nm.

Published
2012
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129. Bias Effects on the Growth of Helium-Containing Titanium Films

Author

Yu-Rong Zhong, Li-Qun Shi, Li-Ran Zhang, Yulu Zhou, Qing Hou, Bao-Yi Wang, Dong-Xu Yang, and Ai-Hong Deng

Subjects
Diffraction, Materials science, General Physics and Astronomy, chemistry.chemical_element, Substrate (electronics), Sputter deposition, Microstructure, Positron annihilation spectroscopy, Elastic recoil detection, Condensed Matter::Materials Science, chemistry, Physics::Atomic and Molecular Clusters, Composite material, Helium, Titanium
Abstract

Helium-containing titanium films were prepared on Si substrates with various biases applied by magnetron sputtering under stable He/Ar ambiance. Rutherford backscattering and elastic recoil detection analyses are used to measure the thickness of the He-Ti films and the helium depth profile, respectively. Experiments of x-ray diffraction and variable energy positron annihilation spectroscopy are carried out to investigate the microstructures of titanium films and the corresponding helium-related defects developed. The behavior of the implanted He, the microstructure of the He-Ti film and the formation of He-related defects all are affected by the substrate biases applied.

Published
2011
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145. In situ x-ray diffraction study of the size dependent thermal expansion of silver nanowires

Author

Bao Yi Wang, Dan Ni Wang, Xiao Peng Hao, Xijin Xu, Guang Tao Fei, Wen Hui Yu, Li De Zhang, and Xin Ju

Subjects
Diffraction, Materials science, Physics and Astronomy (miscellaneous), Nanowire, Physics::Optics, Atmospheric temperature range, Thermal expansion, Surface tension, Condensed Matter::Materials Science, Crystallography, Membrane, Nanocrystal, X-ray crystallography, Composite material
Abstract

The thermal expansion of as-prepared and annealed silver nanowires embedded in anodic alumina membranes with different diameters was studied by in situ x-ray diffraction in the temperature range from 25to800°C. For both the as-prepared and annealed samples, the coefficients of thermal expansion have “V” shape change as the diameters increase; and the minimum values of the coefficients of thermal expansion do not correspond to the same diameters of nanowires. The collective effects of the surface tension, the limit effects of anodic alumina membrane, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion.

Published
2006
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146. In situ x-ray diffraction study of the thermal expansion of the ordered arrays of silver nanowires embedded in anodic alumina membranes

Author

Bao Yi Wang, Li De Zhang, Xiao Peng Hao, Xijin Xu, Wen Hui Yu, Xin Ju, Guang Tao Fei, and Li Chen

Subjects
Diffraction, Crystallography, Membrane, Materials science, Physics and Astronomy (miscellaneous), Annealing (metallurgy), X-ray crystallography, Nanowire, Composite material, Atmospheric temperature range, Thermal expansion, Anode
Abstract

Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25to800°C. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35×10−9∕°C and 6.02×10−6∕°C below and above 650°C, respectively. However, the TEC of the annealed sample turns from 2.32×10−6∕°Cto12.06×10−6∕°C when the temperature is above 350°C. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion.

Published
2006
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