851. Atomic-scale diffractive imaging of sub-cycle electron dynamics in condensed matter
- Author
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Mark I. Stockman, Peter Baum, Ferenc Krausz, and Vladislav S. Yakovlev
- Subjects
Diffraction ,Multidisciplinary ,Condensed matter physics ,Computer science ,Graphene ,Physics::Optics ,02 engineering and technology ,Electron ,Electron dynamics ,021001 nanoscience & nanotechnology ,01 natural sciences ,Atomic units ,Article ,law.invention ,law ,0103 physical sciences ,Physics::Atomic and Molecular Clusters ,ddc:530 ,Electric current ,010306 general physics ,0210 nano-technology ,Ultrashort pulse - Abstract
For interaction of light with condensed-matter systems, we show with simulations that ultrafast electron and X-ray diffraction can provide a time-dependent record of charge-density maps with sub-cycle and atomic-scale resolutions. Using graphene as an example material, we predict that diffraction can reveal localised atomic-scale origins of optical and electronic phenomena. In particular, we point out nontrivial relations between microscopic electric current and density in undoped graphene.