51. Interface Engineering for Controlling Device Properties of Organic Antiambipolar Transistors
- Author
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Ryoma Hayakawa, Kazuyoshi Kobashi, Yutaka Wakayama, and Toyohiro Chikyow
- Subjects
010302 applied physics ,Materials science ,Organic field-effect transistor ,business.industry ,Transistor ,Insulator (electricity) ,02 engineering and technology ,Dielectric ,021001 nanoscience & nanotechnology ,01 natural sciences ,law.invention ,law ,Logic gate ,0103 physical sciences ,Electrode ,Optoelectronics ,General Materials Science ,0210 nano-technology ,business ,Voltage ,High-κ dielectric - Abstract
The main purpose of this study is to establish a guideline for controlling the device properties of organic antiambipolar transistors. Our key strategy is to use interface engineering to promote carrier injection at channel/electrode interfaces and carrier accumulation at a channel/dielectric interface. The effective use of carrier injection interlayers and an insulator layer with a high dielectric constant (high-k) enabled the fine tuning of device parameters and, in particular, the onset (Von) and offset (Voff) voltages. A well-matched combination of the interlayers and a high-k dielectric layer achieved a low peak voltage (0.25 V) and a narrow on-state bias range (2.2 V), indicating that organic antiambipolar transistors have high potential as negative differential resistance devices for multivalued logic circuits.
- Published
- 2018
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