51. Accuracy of sample material parameters reconstruction using terahertz pulsed spectroscopy.
- Author
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Zaytsev, Kirill I., Gavdush, Arseniy A., Karasik, Valeriy E., Alekhnovich, Valentin I., Nosov, Pavel A., Lazarev, Vladimir A., Reshetov, Igor V., and Yurchenko, Stanislav O.
- Subjects
BACKWARD wave oscillators ,SPECTRUM analysis ,MICROWAVE oscillators ,RANDOM noise theory ,STOCHASTIC processes - Abstract
New experimental and theoretical results for the material parameter reconstruction using terahertz (THz) pulsed spectroscopy (TPS) are presented. The material parameter reconstruction algorithm was realized and experimentally implemented to study the test sample. In order to both verify the algorithm and to estimate the reconstruction accuracy, test sample material parameters obtained with the TPS were compared with the results of the same sample studying by the use of the backward-wave oscillator (BWO) spectroscopy. Thus, high reconstruction accuracy was demonstrated for the spectral range, corresponding to the BWO sensitivity and located between 0.2 and 1.2 THz. The numerical simulations were applied for determining the material parameter reconstruction stability in the presence of white Gaussian noise in TPS waveforms as well as fluctuations in the femtosecond (FS) optical pulse duration. We report a strong dependence of the inverse problem solution stability on these factors. We found that the instability of the FS optical pulse duration used for THz pulses generation and detection limits the material parameter reconstruction with TPS. [ABSTRACT FROM AUTHOR]
- Published
- 2014
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