51. Residual stress estimation in laminated ZrB2-SiC ultra-high temperature ceramics with strong interfaces using X-ray diffraction and indentation techniques
- Author
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Xinxin Jin, Peng Zhou, Jing Chen, Yinghao Zhou, Huixing Li, Jiapeng Luo, Ming Yan, and Chenglin Chu
- Subjects
010302 applied physics ,Diffraction ,Materials science ,Process Chemistry and Technology ,Surface stress ,02 engineering and technology ,engineering.material ,021001 nanoscience & nanotechnology ,Residual ,01 natural sciences ,Ultra-high-temperature ceramics ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Residual stress ,visual_art ,Phase (matter) ,Indentation ,0103 physical sciences ,Materials Chemistry ,Ceramics and Composites ,visual_art.visual_art_medium ,engineering ,Ceramic ,Composite material ,0210 nano-technology - Abstract
Laminated ZrB2–SiC ultra-high temperature ceramics (UHTCs) with different layer thickness ratios and strong interfaces were fabricated by hot-pressing. Residual stresses developed on the surfaces of laminated ZrB2-SiC ceramics were evaluated by X-ray diffraction (XRD) and indentation techniques. Results showed that the characteristic XRD peaks of the ZrB2 phase on the surface of the laminated ceramics presented a shift due to the residual surface stress existence. Both XRD and indentation tested results suggested that the surface residual stress increases with the increasing layer thickness ratio confirming the theoretical analysis and calculation reported by our previous work. The presence of a compressive residual stress in the external layer of the heterogeneous material is expected to improve the mechanical properties of laminated ZrB2-SiC ceramics.
- Published
- 2017