51. Giant plasmon instability in a dual-grating-gate graphene field-effect transistor
- Author
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Akira Satou, Vyacheslav V. Popov, Y. Koseki, Victor Ryzhii, and Taiichi Otsuji
- Subjects
Physics ,Condensed Matter - Mesoscale and Nanoscale Physics ,Condensed matter physics ,business.industry ,Graphene ,FOS: Physical sciences ,Physics::Optics ,02 engineering and technology ,Electron ,021001 nanoscience & nanotechnology ,01 natural sciences ,Boltzmann equation ,Instability ,law.invention ,Semiconductor ,law ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,0103 physical sciences ,010306 general physics ,0210 nano-technology ,business ,Electron scattering ,Plasmon ,Order of magnitude - Abstract
We study instability of plasmons in a dual-grating-gate graphene field-effect transistor induced by dc current injection using self-consistent simulations with the Boltzmann equation. With only the acoustic-phonon-limited electron scattering, it is demonstrated that a total growth rate of the plasmon instability, with the terahertz/mid-infrared range of the frequency, can exceed $4\times10^{12}$ s$^{-1}$ at room temperature, which is an order of magnitude larger than in two-dimensional electron gases based on usual semiconductors. By Comparing the simulation results with existing theory, it is revealed that the giant total growth rate originates from simulataneous occurence of the so-called Dyakonov-Shur and Ryzhii-Satou-Shur instabilities., 5 pages, 5 figures
- Published
- 2016