51. Direct Probing of Polarization Charge at Nanoscale Level
- Author
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Kwon, Owoong, Seol, Daehee, Lee, Dongkyu, Han, Hee, Lindfors-Vrejoiu, Ionela, Lee, Woo, Jesse, Stephen, Lee, Ho Nyung, Kalinin, Sergei V., Alexe, Marin, Kim, Yunseok, Kwon, Owoong, Seol, Daehee, Lee, Dongkyu, Han, Hee, Lindfors-Vrejoiu, Ionela, Lee, Woo, Jesse, Stephen, Lee, Ho Nyung, Kalinin, Sergei V., Alexe, Marin, and Kim, Yunseok
- Abstract
Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long-term development of reducing the sizes of devices, the preparation of ferroelectric materials and devices is entering the nanometer-scale regime. Accordingly, to evaluate the ferroelectricity, there is a need to investigate the polarization charge at the nanoscale. Nonetheless, it is generally accepted that the detection of polarization charges using a conventional conductive atomic force microscopy (CAFM) without a top electrode is not feasible because the nanometer-scale radius of an atomic force microscopy (AFM) tip yields a very low signal-to-noise ratio. However, the detection is unrelated to the radius of an AFM tip and, in fact, a matter of the switched area. In this work, the direct probing of the polarization charge at the nanoscale is demonstrated using the positive-up-negative-down method based on the conventional CAFM approach without additional corrections or circuits to reduce the parasitic capacitance. The polarization charge densities of 73.7 and 119.0 mu C cm(-2) are successfully probed in ferroelectric nanocapacitors and thin films, respectively. The obtained results show the feasibility of the evaluation of polarization charge at the nanoscale and provide a new guideline for evaluating the ferroelectricity at the nanoscale.
- Published
- 2018