Search

Your search keyword '"Vasyl Sidey"' showing total 52 results
Start Over Author "Vasyl Sidey"
52 results on '"Vasyl Sidey"'

51. A simplified correction function for the effect of surface roughness in X-ray powder diffraction

Author

Vasyl Sidey

Subjects
Crystallography, Chemistry, Rietveld refinement, X-ray, Analytical chemistry, Surface roughness, Function (mathematics), Surface finish, General Biochemistry, Genetics and Molecular Biology, Powder diffraction
Abstract

The empirical monoparametric functionSR= (θ/90)(S/θ)(whereSis the refinable parameter and the angle θ is given in degrees) has been suggested for Rietveld analysis as a practical replacement for the commonly used surface roughness correction functions.

Published
2004
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results