51. Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
- Author
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Ruslan Temirov, Michael Rohlfing, Christian Wagner, Matthew Green, Peter Krüger, Philipp Leinen, Thorsten Deilmann, and F. Stefan Tautz
- Subjects
Chemistry ,business.industry ,General Engineering ,Scanning confocal electron microscopy ,General Physics and Astronomy ,Scanning gate microscopy ,02 engineering and technology ,Scanning capacitance microscopy ,021001 nanoscience & nanotechnology ,01 natural sciences ,Scanning probe microscopy ,Optics ,Scanning voltage microscopy ,0103 physical sciences ,Scanning ion-conductance microscopy ,Optoelectronics ,010306 general physics ,0210 nano-technology ,business ,Non-contact atomic force microscopy ,Photoconductive atomic force microscopy - Abstract
In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.
- Published
- 2016
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