51. In situ calibration of microchannel-plate-based x-ray pinhole camera for observation of magnetically trapped plasma
- Author
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Naohiro Yamaguchi, Teruo Tamano, Y. Tatematsu, T. Saito, K. Kajiwara, Yasuhito Kiwamoto, Y. Kikuchi, T. Takahashi, and H. Abe
- Subjects
Physics ,business.industry ,Astrophysics::High Energy Astrophysical Phenomena ,Detector ,Plasma ,law.invention ,Optics ,law ,Pinhole camera ,Emissivity ,Calibration ,Empirical formula ,Microchannel plate detector ,Plasma diagnostics ,business ,Instrumentation - Abstract
The electronic amplification gain of a microchannel plate (MCP), as employed for detector and image amplifier of an x-ray pinhole camera, tends to decrease as the output current increases, posing problems both in quantitative analyses and in construction of a three-dimensional emissivity distribution. We report that the output-current dependent MCP gain is described in a simple empirical formula that is determined by an in situ calibration experiment using a steady-state low-temperature discharge plasma. We examine the validity of the formula affirmatively in correcting raw data of x-ray images of magnetically trapped hot plasma. It is also demonstrated that the correction leads to a three-dimensional distribution of soft x-ray emissivity in a quadrupole-mirror-trapped hot plasma that is consistent with other indirect measurements.
- Published
- 1997
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