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55 results on '"Philippe Voarino"'

51. Overcoated microspheres for specific optical powders

Author

Philippe Voarino, Claude Amra, Carole Deumie, Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), and Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Materials Science (miscellaneous), Nanotechnology, 02 engineering and technology, 01 natural sciences, Industrial and Manufacturing Engineering, 3. Good health, Amorphous solid, Characterization (materials science), 010309 optics, 020210 optoelectronics & photonics, Attenuation coefficient, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Deposition (phase transition), Business and International Management, Thin film, Visible spectrum, Photonic crystal
Abstract

We produce overcoated microspheres and try to obtain artificial optical powders with specific spectral properties. Electron-beam deposition is used with a particular vibration system. Calibration and characterization results are presented that validate the techniques and procedures for single-layers and quarter-wave mirrors.

Published
2002

52. Overcoated microspheres and the spectral control of diffuse light

Author

Claude Amra, Carole Deumie, Michel Lequime, Michel Cathelinaud, Philippe Voarino, Institut FRESNEL (FRESNEL), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), Gallais, Laurent, and Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)

Subjects
[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Optical coating, Optics, business.industry, Optoelectronics, Diffuse reflection, Thin film, business, Microsphere
Abstract

Thin film multilayers are usually deposited on plane substrates. We propose a new range of applications connected with the overcoated ofmicrospheres.

Published
2001

53. High-accuracy measurements of the normal specular reflectance

Author

Jean Remy Filtz, Jimmy Dubard, Philippe Voarino, Jacques Hameury, Hervé Piombini, Daniel Marteau, Frédéric Sabary, CEA Le Ripault (CEA Le Ripault), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), and Laboratoire National de Métrologie et d'Essais [Trappes] (LNE )

Subjects
Materials science, Materials Science (miscellaneous), 02 engineering and technology, engineering.material, 01 natural sciences, Industrial and Manufacturing Engineering, law.invention, 010309 optics, Optics, Coating, law, 0103 physical sciences, Specular reflection, Business and International Management, ComputingMilieux_MISCELLANEOUS, business.industry, Repeatability, 021001 nanoscience & nanotechnology, Laser, Metrology, Surface coating, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Reflection (physics), engineering, Optoelectronics, 0210 nano-technology, business, Laser Mégajoule
Abstract

The French Laser Megajoule (LMJ) is designed and constructed by the French Commissariat à l'Energie Atomique (CEA). Its amplifying section needs highly reflective multilayer mirrors for the flash lamps. To monitor and improve the coating process, the reflectors have to be characterized to high accuracy. The described spectrophotometer is designed to measure normal specular reflectance with high repeatability by using a small spot size of 100 mum. Results are compared with ellipsometric measurements. The instrument can also perform spatial characterization to detect coating nonuniformity.

Published
2008
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54. Multidielectric quarter-wave coatings on microspheres: a study in colorimetric space

Author

Claude Amra, Myriam Zerrad, Carole Deumie, Philippe Voarino, CEA Le Ripault (CEA Le Ripault), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), and Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, 010504 meteorology & atmospheric sciences, Materials Science (miscellaneous), Mie scattering, Space (mathematics), 01 natural sciences, Industrial and Manufacturing Engineering, Light scattering, 010309 optics, [SPI]Engineering Sciences [physics], Condensed Matter::Materials Science, symbols.namesake, Optics, Sputtering, 0103 physical sciences, Business and International Management, Rayleigh scattering, Thin film, ComputingMilieux_MISCELLANEOUS, 0105 earth and related environmental sciences, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Scattering, business.industry, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, symbols, SPHERES, business
Abstract

Spectral properties of quarter-wave stacks deposited on microspheres are investigated with Mie theory. These properties are converted into colorimetric spaces to deal with visual applications. An ion-beam-sputtering process is then implemented to produce elementary stacks on the spheres, and the resulting powders are characterized.

Published
2006
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55. Evaluation of enhanced mirror for LMJ reflectors industrial production

Author

Nathalie Valette, Hélène Krol, Grégory Chauveau, Frédéric Sabary, Philippe Voarino, Catherine Grèzes-Besset, Hervé Piombini, and Daniel Marteau

Subjects
Optics, Materials science, business.industry, Industrial production, Laser amplifiers, Laser pumping, Sputter deposition, business, Reflectivity, Laser Mégajoule, Metrology
Abstract

Possibility of enhanced mirrors for Laser MegaJoule reflectors has been studied and preliminary samples have been realized with Magnetron Sputtering technology. Spectral measurements of improved reflectivity and cosmetics analysis are presented.

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