51. Orientation precision of TEM-based orientation mapping techniques
- Author
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Henryk Paul, Jean-Jacques Fundenberger, Adam Morawiec, Emmanuel Bouzy, Institute of Metallurgy and Materials Science, Polska Akademia Nauk = Polish Academy of Sciences (PAN), Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Arts et Métiers Sciences et Technologies, and HESAM Université (HESAM)-HESAM Université (HESAM)
- Subjects
Diffraction ,Misorientation ,Computer science ,02 engineering and technology ,01 natural sciences ,[SPI]Engineering Sciences [physics] ,Electron diffraction ,Optics ,0103 physical sciences ,Microscopy ,Orientation mapping ,Sensitivity (control systems) ,Instrumentation ,010302 applied physics ,business.industry ,Orientation (computer vision) ,Template matching ,Resolution (electron density) ,Pattern recognition ,[CHIM.MATE]Chemical Sciences/Material chemistry ,021001 nanoscience & nanotechnology ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Indexing ,Artificial intelligence ,0210 nano-technology ,business ,Transmission electron microscopy ,Aluminum - Abstract
International audience; Automatic orientation mapping is an important: addition to standard capabilities of conventional transmission electron microscopy (TEM) as it facilitates investigation of crystalline materials. A number of different such mapping systems have been implemented. One of their crucial characteristics is the orientation resolution. The precision in determination of orientations and misorientations reached in practice by TEM-based automatic mapping systems is the main subject of the paper. The analysis is Focused on two methods: first, using spot diffraction patterns and `template matching', and second, using Kikuchi patterns and detection of reflections. In simple terms, for typical mapping conditions, their precisions in orientation determination with the confidence of 95% are, respectively, 1.1 degrees and 0.3 degrees. The results are illustrated by example maps of cellular structure in deformed Al, the case for which high orientation sensitivity matters. For more direct comparison, a novel approach to mapping is used: the same patterns are solved by each of the two methods. Proceeding from a classification of the mapping systems, the obtained results may serve as indicators of precisions of other TEM-based orientation mapping methods. The findings are of significance for selection of methods adequate to investigated materials.
- Published
- 2014
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