Search

This paper is devoted to the application of the optical Fourier transform (OFT) for the study and evaluation of optical scattering in the latest generation of calomel single crystals ready for application in several possible devices such as IR polarizers and acoustooptic tunable filters (AOTF). There are numerous effects that are responsible for the scattering of optical wave passing through the crystal sample volume and surface layers because they affect the optical crystal quality. The scattering level is a crucial and limiting parameter in many technical applications of the evaluated crystal. The proposed approach is based upon the high dynamic range optical FT configuration, creating the amplitude spectrum in the focal plane and its spatial angular distribution analysis based on the spectrum sectorization. The optical scattering pattern was tested in nine locations within each crystal sample volume and on numerous crystal samples. The experimental results are presented and discussed.

A concept for a highly miniaturized spectrometer featuring a two-component design is presented. The first component is a planar chip that integrates an input slit and aberration-correcting diffraction grating with an image sensor and is fabricated using microelectromechanical systems (MEMS) technologies. Due to the fabrication in a simple MEMS batch process the essential elements of the spectrometer are automatically aligned, and a low fabrication cost per device can be achieved. The second component is a spherical mirror, which is the only external part. The optimized grating structure compensates for aberrations within the spectrometer operating range, resulting in a diffraction-limited performance of the spectrometer optics. The prototype of the device has been fabricated and characterized. It takes a volume of 0.5 cm(3) and provides a FWHM spectral resolution of 0.7 nm over a 350 nm bandwidth from 420 nm to 770 nm combined with an etendue of 7.4x10(-5) mm(2) sr.

An analytical model has been developed and applied to explore the limits in the design of a highly miniaturized planar optical microspectrometer based on an imaging diffraction grating. This design tool has been validated as providing the smallest possible dimensions while maintaining acceptable spectral resolution. The resulting planar spectrometer is composed of two parallel glass plates, which contain all components of the device, including a reflective slit and an imaging diffraction grating. Fabrication is based on microelectromechanical system technology and starts with a single glass wafer; IC-compatible deposition and lithography are applied to realize the parts in aluminum, which makes the microspectrometer highly tolerant for component mismatch. The fabricated spectrometer was mounted directly on top of an image sensor and takes up a volume of only 50 mm(3). The measured spectral resolution of 6 nm (FWHM) in the 100 nm operating wavelength range (600-700 nm) is in agreement with a model calculation.

We have investigated the possibility of using transparent stretchable diffraction gratings for spectrometric applications. The gratings were fabricated by replication of a triangular-groove master into a transparent viscoelastic. The sample length, and hence the spatial period, can be reversibly changed by mechanical stretching. When used in a monochromator with two slits, the stretchable grating permits scanning the spectral components over the output slit, converting the monochromator into a scanning spectrometer. The spectral resolution of such a spectrometer was found to be limited mainly by the wave-front aberrations due to the grating deformation. A model relating the deformation-induced aberrations in different diffraction orders is presented. In the experiments, a 12-mm long viscoelastic grating with a spatial frequency of 600 line pairs/mm provided a full-width at half-maximum resolution of up to ~1.2 nm in the 580-680 nm spectral range when slowly stretched by a micrometer screw and ~3 nm when repeatedly stretched by a voice coil at 15 Hz. Comparison of aberrations in transmitted and diffracted beams measured by a Shack- Hartmann wave-front sensor showed that astigmatisms caused by stretch-dependent wedge deformation are the main factors limiting the resolution of the viscoelastic-grating-based spectrometer.

We report on a miniature spectrometer with a volume of 0.135 cm(3) and dimensions of 3x3x11 mm, mounted directly on the surface of a CCD sensor. The spectrometer is formed by two flat diffraction gratings that are designed to perform both the dispersion and imaging functions, eliminating the need for any spherical optics. Two separate parts of the device were fabricated with the single-mask 1 mum lithography on a single glass wafer. The wafer was diced and the device was assembled and directly mounted onto a CCD sensor. The resolution of 3 nm, spectral range of 450 to 750 nm and the optical throughput of ~9% were measured to be in a complete agreement with the model used for the development of the device.